DOI QR코드

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PIN 다이오드 - PNP 트랜지스터 결합모델에 의한 1,700 V급 NPT 트랜치 IGBT의 해석에 관한 연구

A Study on the 1,700 V Rated NPT Trench IGBT Analysis by PIN Diode - PNP Transistor Model

  • 발행 : 2008.10.01

초록

This paper presents a comprehensive mathematical analysis and simulation of trench IGBT with the help of PIN-PNP combinational model. Since trench IGBT is characteristically influenced by PIN diode, it may be almost impossible to analyze the trench IGBT using PNP-MOS modeling methods, even PIN-MOS techniques which neglect the hole current components coming into p-base region. A new PIN-PNP complementary cooperational model is developed in order to make up the drawbacks of existing models. It would allow us to make qualitative analysis as well as simulation about switching and on-state characteristics of 1,700 V trench IGBT. Moreover, if we improve the PIN diode effects through the optimization of trench structure, trench IGBT is expected to be one of the most promising devices in the not only high-voltage but also high speed switching device field.

키워드

참고문헌

  1. Ueda, D., et al., "New injection suppression structure for conductivity modulated power MOSFETs", Proc. 18th Int. Conf. Solid State Device and Materials, p. 97, 1986
  2. Chang, H.-R. and Baliga, B. J., "500-V n- channel insulated-gate bipolar transistor with a trench gate structure", IEEE Trans. Electron Device, ED-36, p. 1824, 1989
  3. J. S. Lee, E. G. Kang, and M. Y. Sung, "Improvement of electrical characteristics of vertical NPT trench gate IGBT using trench emitter electrode", J. KIEEME(in Korean), Vol. 19, No. 10, p. 912, 2006 https://doi.org/10.4313/JKEM.2006.19.10.912
  4. Udrea, F. and Amaratunga, G. A. J., "Unified analytical model for the carrier dynamics in trench insulated gate bipolar transistors (TIGBT)", Proc. 7th Int. Symp. Power Semiconductor Devices and ICs, p. 190, 1995
  5. Kitagawa, M., Omura, I., Hasegawa, S., Inoue, T., and Nakagawa, A., "4500 V Injection enhanced insulated gate bipolar transistor (IEGT) operating in a mode similar to a thyristor", IEDM Tech. Dig., p. 679, 1993
  6. E. G. Kang and M. Y. Sung, "Study on new LIGBT with multi gate for high speed and improving latch up effect", J. KIEEME(in Korean), Vol. 13, No. 5, p. 371, 2000
  7. E. G. Kang and M. Y. Sung, "A novel trench electrode BRT with the intrinsic region for superior electrical characteristics", J. KIEEME (in Korean), Vol. 15, No. 3, p. 201, 2002
  8. E. G. Kang, D. S. Oh, D. W. Kim, D. J. Kim, and M. Y. Sung, "A novel lateral trench electrode IGBT for superior electical characteristics", J. KIEEME(in Korean), Vol. 15, No. 9, p. 758, 2002
  9. E. G. Kang, S. H. Moon, and M. Y. Sung, "A new trench electrode IGBT having superior electrical characteristics for power IC systems", Microelectronics J., Vol. 32, p. 641, 2001 https://doi.org/10.1016/S0026-2692(01)00045-3
  10. E. G. Kang and M. Y. Sung, "A small sized lateral trench electrode IGBT for improving latch-up and breakdown characteristics", Solid State Electronics, Vol. 46, p. 295, 2002 https://doi.org/10.1016/S0038-1101(01)00291-X
  11. J. S. Lee, E. G. Kang, and M. Y. Sung, "Shielding region effects on a trench gate IGBT", Microelectronics Journal, Vol. 39, p. 57, 2008 https://doi.org/10.1016/j.mejo.2007.10.023
  12. Herlet, A., "The forward characteristic of silicon power rectifiers at high current densities", Solid St. Electronics, Vol. 11, p. 717, 1968 https://doi.org/10.1016/0038-1101(68)90053-1
  13. Berz, F., "A simplified theory of the p-i-n diode", Solid St. Electronics, Vol. 20, p. 709, 1977 https://doi.org/10.1016/0038-1101(77)90048-X