References
- N. Arora and C. Huang, 'Modeling the polysilicon depletion effect and its impact on submicrometer CMOS circuit performance,' IEEE Transactions on Electron Devices, Vol. 42, No. 5, May (1995)
- R. Rios, N. D. Arora and C. L. Huang, 'An Analytic polysilicon depletion effect model for MOSFET's, ' IEEE Electron Device Letters, Vol. 15, No. 4, April (1994)
- G. Gildenblat, T. L. Chen and P. Bendix, 'Analytical application for perturbation of MOSFET sufrace potential by polysilicon depletion layer,' IEE Electronic Letters, Vol.. 35, No. 22, 28th October (1999)
- C.-H, Choi et al.., 'Gate length dependent polysilicon depletion effects,' IEEE Electron Device Letters, Vol. 23, No. 4, April (2002)
- S. Lo, D. Buchanan, and Y. Taur, 'Modeling and characterization of quantization, polysilicon depletion, and direct tunneling effects in MOSFETs with ultrathin oxides.' IBM J. Res. Develop. Vol. 43, No. 3, May (1999)
- A. Gupta et al., 'Accurate determination of ultrathin gate oxide thickness and effective polysilicon doping of CMOS devices,' IEEE Electron Device Letters, Vol. 18, No. 12, December (1997)
- F. Gamiz et al., 'Effect of polysilicon depletion charge on electron mobility in ultrathin oxide MOSFETs,' Semiconductor Science and Technology, Vol. 18, No. 11, November (2003)
- R. F. Pierret, Field Effect Devices, Addison-Wesley, second edition, Vol. IV, (1990)
- T. L. Chen and G. Gildenblat, 'Analytical approximation for the MOSFET surface potential,' Solid State Electronics, 45, pp.335-339, (2001) https://doi.org/10.1016/S0038-1101(00)00283-5
- A. Ortiz-Conde, F. J. Garcia Sanchez, M.Guzman, 'Exact Analytical Solution of Channel Surface Potential as an Explicit Function of Gate Voltage in Undoped-body MOSFETs Using the Lambert W function and a Threshold Voltage Definition,' Solid-State Electronics 47 pp. 2067-2074 (2003) https://doi.org/10.1016/S0038-1101(03)00242-9
- H. Abebe, E. Cumberbatch, H. Morris and V. Tyree, 'Numerical and analytical results of the polysilicon gate depletion effect on MOS gate capacitance,' IEEE UGIM Proceedings, pp. 111-115, June 25-28, (2006), San Jose, CA