• Journal of the Korea Society for Simulation
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• v.14 no.1
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• pp.1-8
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• 2005

In the semiconductor manufacturing, yield enhancement is an urgent issue. It is ideal to prevent all the failures. However, when a failure occurs, it is important to quickly specify the cause stage and take countermeasure. Reviewing wafer level and composite lot level yield patterns has always been an effective way of identifying yield inhibitors and driving process improvement. This process is very time consuming and as such generally occurs only when the overall yield of a device has dropped significantly enough to warrant investigation. The automatic method of failure pattern extraction from fail bit map provides reduced time to analysis and facilitates yield enhancement. The automatic method of failure pattern extraction from fail bit map provides reduced time to analysis and facilitates yield enhancement. This paper describes the techniques to automatically classifies a failure pattern using a fail bit map.

• Journal of the Korean Society of Propulsion Engineers
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• v.16 no.5
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• pp.67-73
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• 2012

Failure mechanisms for a solid propellant were discussed, and the stip-yield and the inherent flaw models were applied to them. Then, failure assessment diagram methods were investigated by means of modified two models. Fracture toughness tests using CCT(center-cracked tension) specimens made of a solid propellant were conducted to generate the failure assessment diagrams. The failure assessment diagram of the inherent flaw model was normalized in order to compare with that of the modified strip-yield model. From the comparison of two failure assessment diagrams, it was found that the failure assessment diagram of the modified inherent flaw model more conservatively assesses the failure than that of the modified strip-yield model.

• Proceedings of the Korean Society of Propulsion Engineers Conference
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• 2012.05a
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• pp.532-538
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• 2012

Failure mechanisms for a highly filled elastomer were discussed, and the stip-yield and the inherent flaw models were applied to them. Then, failure assessment diagram methods were investigated by means of modified two models. Fracture toughness tests using CCT(center-cracked tension) specimens made of a highly filled elastomer were conducted to generate the failure assessment diagrams. The failure assessment diagram of the inherent flaw model was normalized in order to compare with that of the modified strip-yield model. From the comparison of two failure assessment diagrams, it was found that the failure assessment diagram of the modified inherent flaw model more conservatively assesses the failure than that of the modified strip-yield model.

• Proceedings of the IEEK Conference
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• 2003.07b
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• pp.703-706
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• 2003

Yield enhancement in semiconductor fabrication is important. It is ideal to prevent all the failures. However, when a failure occurs, it is important to quickly specify the cause stage and take countermeasure. The automatic method of failure pattern extraction from fail bit map provides reduced time to analysis and facilitates yield enhancement. This paper describes the techniques to automatically classifies a failure pattern using a fail bit map, a new simple schema which facilitates the failure analysis.

• International journal of steel structures
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• v.18 no.4
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• pp.1384-1396
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• 2018

One of the failure modes observed in steel yield energy dissipating devices (SYEDs) excited by a strong earthquake would be the low-cycle fatigue failure. Fatigue cracks of a SYED are prone to initiate at the notch areas where stress concentration is usually occurred, which is demonstrated by the cyclic tests and analyses carried out for this study. Since the fatigue failure of SYEDs dramatically deteriorates their structural capacities, the thorough investigation on their fatigue life is usually required. To do this, sophisticated modeling with considering a time-consuming and complicate fracture mechanism is generally needed. This study makes an effort to investigate the low-cycle fatigue life of SYEDs predicted by a simplified method utilizing damage indices and fatigue prediction equations that are based on the plastic strain amplitudes obtained from typical finite element analyses. This study shows that the low-cycle fatigue failure of SYEDs predicted by the simplified method can be conservatively in good agreement with the test results of SYED specimens prepared for experimental validation.

• Journal of Korea Technical Association of The Pulp and Paper Industry
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• v.31 no.5
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• pp.73-85
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• 1999

Yield and fracture are separated in the tensile failure of paper. Failure in the machine direction of photocopy paper is contrasted with failure in the cross-machine direction . The ratios of distortion (shape change) to dilatation (volume change) for individual elements at yield and fracture are described. The ratios of distortion to dilatation are measured and compared to predicted values of the strain energy density theory. To evaluate the effect of the angle from the principal material direction on the strain energy density theory. To evaluate the effect of the angle from the principal material direction on the strain energy density factor, samples are prepared from machine direction to cross-machine direction in 15 degree intervals. the strain energy density of individual elements are obtained by the integration of stress from finite element analysis with elastic plus plastic strain energy density theory. Poison's ratio and the angle from the principal material direction have a great effect ion the ratio fo distortion to dilatation in paper. During the yield condition, distortion prevails over dilatation . At fracture, dilatation is at a maximum.

• International Journal of Concrete Structures and Materials
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• v.2 no.1
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• pp.57-62
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• 2008

When the yield line theory is used to estimate the ultimate strength of a concrete barrier, it is of primary importance that the correct assumption is made for the failure mode of the barrier. In this study, a static test was performed on two full-scale concrete barrier specimens of Korean standard shape that simulate the actual behavior of a longitudinally continuous barrier. This was conducted in order to verify the failure mode presented in the AASHTO LRFD specification. The resulting shape of the yield lines differed from that presented in AASHTO when subjected to an equivalent crash load. Furthermore, the ultimate strengths of the specimens were lower than the theoretical prediction. The main causes of these differences can be attributed to the characteristics of the barrier shape and to a number of limitations associated with the classical yield line theory. Therefore, a revised failure mode with corresponding prediction equations of the strength were proposed based on the yield lines observed in the test. As a result, a strength that was more comparable to that of the test could be obtained. The proposed procedure can be used to establish more realistic test levels for barriers that have a similar shape.

• Proceedings of the Korea Society for Simulation Conference
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• 2003.11a
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• pp.147-151
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• 2003

Yield enhancement in semiconductor fabrication is important. Even though DRAM yield loss may be attributed to many problems, the existence of defects on the wafer is one of the main causes. When the defects on the wafer form patterns, it is usually an indication for the identification of equipment problems or process variations. In this paper describes the techniques to automatically classify a failure pattern using a fail bit map.

• Journal of the Korean Society for Advanced Composite Structures
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• v.5 no.4
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• pp.1-10
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• 2014

A progressive failure analysis procedure for composite laminates is developed in here and in the companion paper. An anisotropic plastic constitutive model for fiber-reinforced composite material, is developed, which is simple and efficient to be implemented into computer program for a predictive analysis procedure of composites. In current development of the constitutive model, an incremental elastic-plastic constitutive model is adopted to represent progressively the nonlinear material behavior of composite materials until a material failure is predicted. An anisotropic initial yield criterion is established that includes the effects of different yield strengths in each material direction, and between tension and compression. Anisotropic work-hardening model and subsequent yield surface are developed to describe material behavior beyond the initial yield under the general loading condition. The current model is implemented into a computer code, which is Predictive Analysis for Composite Structures (PACS), and is presented in the companion paper. The accuracy and efficiency of the anisotropic plastic constitutive model are verified by solving a number of various fiber-reinforced composite laminates with and without geometric discontinuity. The comparisons of the numerical results to the experimental and other numerical results available in the literature indicate the validity and efficiency of the developed model.

• Computers and Concrete
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• v.12 no.6
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• pp.819-829
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• 2013

The objective of this study is to determine whether or not the yield line theory, an effective method widely used for slabs made of ordinary concrete, can be used also for the reinforced concrete slabs made of high-strength concrete. Flexural behavior of simply supported slabs in three different sizes were investigated under concentrated load at mid-span. Additionally, behavior of high strength reinforced concrete slabs with 50 mm and 150 mm reinforcement spacings also studied. Failure loads, deflections, experimental and theoretical failure mechanisms were evaluated. The difference between the moments based on yield line theory and experimental moments varied between 1% to 3%. Experimental and analysis results revealed that yield line analysis could conveniently be employed in the analysis of high strength reinforced concrete slabs.