• 제목/요약/키워드: thin film diode

검색결과 268건 처리시간 0.024초

Development of IGZO TFTs and Their Applications to Next-Generation Flat-Panel Displays

  • Hsieh, Hsing-Hung;Lu, Hsiung-Hsing;Ting, Hung-Che;Chuang, Ching-Sang;Chen, Chia-Yu;Lin, Yusin
    • Journal of Information Display
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    • 제11권4호
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    • pp.160-164
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    • 2010
  • Organic light-emitting devices (OLEDs) have shown superior characteristics and are expected to dominate the nextgeneration flat-panel displays. Active-matrix organic light-emitting diode (AMOLED) displays, however, have stringent demands on the performance of the backplane. In this paper, the development of thin-film transistors (TFTs) based on indium gallium zinc oxide (IGZO) on both Gen 1 and 6 glasses, and their decent characteristics, which meet the AMOLED requirements, are shown. Further, several display prototypes (e.g., 2.4" AMOLED, 2.4" transparent AMOLED, and 32" AMLCD) using IGZO TFTs are demonstrated to confirm that they can indeed be strong candidates for the next-generation TFT technology not only of AMOLED but also of AMLCD (active-matrix liquid crystal display).

Electrical Analysis of Bottom Gate TFT with Novel Process Architecture

  • Pak, Sang-Hoon;Jeong, Tae-Hoon;Kim, Si-Joon;Kim, Kyung-Ho;Kim, Hyun-Jae
    • Journal of Information Display
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    • 제9권2호
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    • pp.5-8
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    • 2008
  • Bottom gate thin film transistors (TFTs) with microcrystalline and amorphous Si (a-Si) double active layers (DAL) were fabricated. Since the process of DAL TFTs can use that of conventional a-Si TFTs, these DAL TFT process has advantages, such as low cost, large substrate, and mass production capacity. In order to analyze the degradation characteristics in saturation region for driving TFTs of active matrix organic light emitting diode, three different dynamic stresses were applied to DAL TFTs and a-Si TFTs. The threshold voltage shift of DAL TFTs and a-Si TFTs during 10,000 second stress is 0.3V and 2V, respectively. DAL TFTs were more reliable than a-Si TFTs.

A New AMOLED Pixel Circuit Employing a-Si:H TFTs for High Aperture Ratio

  • Shin, Hee-Sun;Lee, Jae-Hoon;Jung, Sang-Hoon;Kim, Chang-Yeon;Han, Min-Koo
    • 한국정보디스플레이학회:학술대회논문집
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    • 한국정보디스플레이학회 2005년도 International Meeting on Information Displayvol.II
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    • pp.1297-1300
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    • 2005
  • We propose a new pixel design for active matrix organic light emitting diode (AM-OLED) displays using hydrogenated amorphous silicon thin-film transistors (a-Si:H TFTs). The pixel circuit is composed of five TFTs and one capacitor, and employs only one additional control signal line. It is verified by SPICE simulation results that the proposed pixel compensates the threshold voltage shift of the a-Si:H TFTs and OLED.

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Dynamic Pixel Models for a-Si TFT-LCD and Their Implementation in SPICE

  • Wang, In-Soo;Lee, Gi-Chang;Kim, Tae-Hyun;Lee, Won-Jun;Shin, Jang-Kyoo
    • ETRI Journal
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    • 제34권4호
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    • pp.633-636
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    • 2012
  • A dynamic analysis of an amorphous silicon (a-Si) thin film transistor liquid crystal display (TFT-LCD) pixel is presented using new a-Si TFT and liquid crystal (LC) capacitance models for a Simulation Program with Integrated Circuit Emphasis (SPICE) simulator. This dynamic analysis will be useful when predicting the performance of LCDs. The a-Si TFT model is developed to accurately estimate a-Si TFT characteristics of a bias-dependent gate to source and gate to drain capacitance. Moreover, the LC capacitance model is developed using a simplified diode circuit model. It is possible to accurately predict TFT-LCD characteristics such as flicker phenomena when implementing the proposed simulation model.

THIN-FILM-COATED DETECTORS FOR NEUTRON DETECTION

  • McGregor Douglas S.;Gersch Holly K.;Sanders Jeffrey D.;Klann Raymond T.;Lindsay John T.
    • Journal of Radiation Protection and Research
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    • 제26권3호
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    • pp.167-175
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    • 2001
  • Semiconductor diode detectors coated with neutron reactive material are presently under investigation for various uses, such as remote sensing of thermal neutrons, fast neutron counting, and thermal neutron radiography. Theory indicates that single-coated devices can yield thermal neutron efficiencies from 4% to 11 %, which is supported by experimental evidence. Radiation endurance measurements indicate that the devices function well up to a limiting thermal neutron fluence of $10^{13}/cm^2$, beyond which noticeable degradation occurs. Thermal neutron contrast images of step wedges and simple phantoms, taken with dual in-line pixel devices, show promise for thermal neutron imaging detectors.

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Data Supply Voltage Reduction Scheme for Low-Power AMOLED Displays

  • Nam, Hyoungsik;Jeong, Hoon
    • ETRI Journal
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    • 제34권5호
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    • pp.727-733
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    • 2012
  • This paper demonstrates a new driving scheme that allows reducing the supply voltage of data drivers for low-power active matrix organic light-emitting diode (AMOLED) displays. The proposed technique drives down the data voltage range by 50%, which subsequently diminishes in the peak power consumption of data drivers at the full white pattern by 75%. Because the gate voltage of a driving thin film transistor covers the same range as a conventional driving scheme by means of a level-shifting scheme, the low-data supply scheme achieves the equivalent dynamic range of OLED currents. The average power consumption of data drivers is reduced by 60% over 24 test images, and power consumption is kept below 25%.

Passive Transient Voltage Suppression Devices for 42-Volt Automotive Electrical Systems

  • Shen, Z.John
    • Journal of Power Electronics
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    • 제2권3호
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    • pp.171-180
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    • 2002
  • New 42-volt automotive electrical systems can provide significant improvements in vehicle performance and fuel economy. It is crucial to provide protection against load dump and other overvoltage transients in 42-volt systems. While advanced active control techniques are generally considered capable of providing such protection, the use of passive transient voltage suppression (TVS) devices as a secondary or supplementary protection means can significantly improve design flexibility and reduce system costs. This paper examines the needs and options for passive TVS devices for 42-volt applications. The limitations of the commonly available automotive TVS devices, such as Zener diodes and metal oxide varistors (MOV), are analyzed and reviewed. A new TVS device concept, based on power MOSFET and thin-film polycrystalline silicon back-to-back diode technology, is proposed to provide a better control on the clamp voltage and meet the new 42-volt specification. Both experimental and modeling results are presented. Issues related to the temperature dependence and energy absorbing capability of the new TVS device are discussed in detail. It is concluded that the proposed TVS device provides a cost-effective solution for load dump protection in 42-volt systems.

플렉시블 디스플레이

  • 장진
    • 인포메이션 디스플레이
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    • 제7권3호
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    • pp.4-17
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    • 2006
  • 차세대 디스플레이로서, 특히 휴대기기를 위한 플레깃블 디스플레이에 대한 관심이 증가되고 있다. 지난 몇 년간 계속적으로 연구가 이루어져 왔음에도 불구하고, 플렉시블 디스플레이는 아직 하나의 '제품'으로서 시장에 진입하지 못하고 있다. 플렉시블 디스플레이는 플라스틱이나 메탈 호일, 플렉시블 유리와 같은 플렉시블 기판이 쓰이는데, 이것은 가벼우면서 얇고 강하며 제조 측면에서 높은 생산성을 가질뿐만 아니라 착용이 가능할 정도의 자유로운 디자인이 가능하다는 장점을 가지고 있다. 이러한 많은 장점으로 인해 플렉시블 디스플레이의 연구와 개발이 빠르게 진행되고 있다. 지난 몇 년 동안 개발된 전기영동(electrophoretic), 유기전계발광(OLED, organic light-emitting diode), 액정(liquid-crystal)과 관련된 플렉시블 디스플레이에 대해 성능 등을 알아보고, 플렉시블 디스플레이용으로 개발된 플라스틱 기판과 그 위에 형성된 유기박막트랜지스터(OTFTs, organic thin film transistors)의 특성을 분석한다. 그리고 oTFTs의 성능과 제작공정의 이해를 위해 self organized process에 대해 설명하고 마지막으로 중요 연구 과제를 제시한다.

Positive bias stress하에서의 electric field가 a-IGZO TFT의 비대칭 열화에 미치는 영향 분석 (Effect of electric field on asymmetric degradation in a-IGZO TFTs under positive bias stress)

  • 이다은;정찬용;;권혁인
    • 한국표면공학회:학술대회논문집
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    • 한국표면공학회 2014년도 추계학술대회 논문집
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    • pp.108-109
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    • 2014
  • 본 논문에서는 gate와 drain bias stress하에서의 a-IGZO thin-film transistors (TFTs)의 비대칭 열화 메커니즘 분석을 진행하였다. Gate와 drain bias stress하에서의 a-IGZO TFT의 열화 현상은 conduction band edge 근처에 존재하는 oxygen vacancy-related donor-like trap의 발생으로 예상되며, TFT의 channel layer 내에서의 비대칭 열화현상은 source의 metal과 a-IGZO layer간의 contact에 전압이 인가되었을 경우, reverse-biased Schottky diode에 의한 source 쪽에서의 높은 electric field가 trap generation을 가속화시킴으로써 일어나는 것임을 확인할 수 있었다.

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TFD Device with Symmetrical Structure of Flexible Electrode Subject to Flexible Substrate

  • Lee, Chan-Jae;Hong, Sung-Jei;Kim, Won-Keun;Han, Jeong-In
    • Transactions on Electrical and Electronic Materials
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    • 제3권4호
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    • pp.32-35
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    • 2002
  • In this work, we test electrode material of TFD (Thin Film Diode) device subject to flexible substrate. Al, that is ductile metal, was proper for flexible electrode to fabricate flexible display. The fabricated devices had symmetric electrode structure on both sides of insulation layer. The electrode was made of ductile Al so as to reduce the mismatch of properties between the electrode and substrate. The TFD device was successfully fabricated applying our own etch-free process. Electrical properties were improved by post-annealing.