• 제목/요약/키워드: test circuit

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순서회로의 Built-In Pseudoexhaustive Test을 위한 테스트 패턴 생성기 및 응답 분석기의 설계 (Design of Test Pattern Generator and Signature Analyzer for Built-In Pseudoexhaustive Test of Sequential Circuits)

  • 김연숙
    • 한국정보처리학회논문지
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    • 제1권2호
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    • pp.272-278
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    • 1994
  • 본 논문에서는 BIST(Built-In Self Test)시 순서회로내의 조합회로를 pseudoexhaustive 시험하는데 필요한 테스트 패턴 생성기와 응답 분석기를 제안한다. 제안하는 테스트 패턴 생성기는 테스트 패턴의 초기값을 스캔 인 할 수 있고, exhaustive test pattern 을 생성할 수 있다. 또한, 응답 분석기는 회로의 응답을 분 석할 수 있을 뿐만 아니라 응답 결과를 스캔 아웃할 수 있다. 이러한 테스트 패턴 생 성기와 응답분석기는 SRL과 LFSR을 결합하여 설계하였다.

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경년열화에 따른 배선용 차단기류의 고장점 분석 연구 (A Study on Failure Analysis of Low Voltage Breakers with Aging)

  • 조한구;이운용;이유정;이해기;강성화
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2006년도 하계학술대회 논문집 Vol.7
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    • pp.501-502
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    • 2006
  • In this paper, new and aging sample of MCCB and ELCB are investigated the main performance test such as short circuit test, mechanical and electrical endurance test, dielectric test and surge current test. The surface conditions of new and aging sample are analyzed by SEM, TGA and DSC. The ELCB occurred badness mainly in short circuit test and surge current test. The badness cause of short circuit test was confirmed due to imperfect contact of contact part.

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Quad-functional Built-in Test Circuit for DRAM-frame-memory Embedded SOG-LCD

  • Takatori, Kenichi;Haga, Hiroshi;Nonaka, Yoshihiro;Asada, Hideki
    • 한국정보디스플레이학회:학술대회논문집
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    • 한국정보디스플레이학회 2008년도 International Meeting on Information Display
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    • pp.914-917
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    • 2008
  • A quad-functional built-in test circuit has been developed for DRAM-frame-memory embedded SOG-LCDs. The quad function consists of memory test, display test, serial transfer test, and parallel transfer test which is the normal operation mode for our SOG-LCD. Results of memory and display tests are shown.

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800kV, 50kA 차단기의 전절연 검증을 위한 시험방법 검토 (Review about test method for the full-insulation verification of circuit breaker rated on 800kV, 50kA)

  • 박승재;서윤택;윤학동;김용식;김맹현;고희석
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 2005년도 제36회 하계학술대회 논문집 A
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    • pp.569-571
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    • 2005
  • In case of dead-tank circuit breaker with the earthed enclosure, the dielectric performance for phase to ground should be verified under the hot-gas condition produced by the current interruption. This test condition is required in breaking test duties with the rated short-circuit current and rated voltage. And, KERI has completed the reinforcement of the synthetic testing facilities and these facilities have the testing capacity which enables the full-pole testing for 800kV circuit breaker by adopting the series voltage injection method. So, this paper introduced the test circuit and procedures about the full-pole and the multi-part testing method which was devised to estimate the full -insulation of phase-to-ground for the multi-pole and dead-tank circuit breaker.

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직류전원을 이용한 배전급 차단기의 등가 3상 합성투입시험법 (Equivalent three-phase synthetic making test for medium voltage circuit breaker of distribution system using DC power)

  • 박병락;조만영;김진석;신희상;김재철
    • 조명전기설비학회논문지
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    • 제25권7호
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    • pp.105-113
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    • 2011
  • The study about three-phase synthetic making test using DC power has been performed in order to increase the making test capacity on Vacuum Circuit Breaker. And, it made possible to solve the limitations that short-circuit testing facilities can not fulfill the testing requirements of VCB exceeding three-phase 36[kV] 31.5[kA]. By using DC power and high speed spark-gap switch, this method made the equivalence with the pre-arc that occurred during the making process under the fault condition of power system. As results, KERI(Korea Electrotechnology Research Institute) could have capacity to carry out type test for VCB under three-phase 52[kV] 40[kV], which satisfies the IEC Standard.

무절연 가청주파수(AF) 궤도회로 시험기준 고찰 (A review of test norm of Non-insulated AF Track Circuit)

  • 장석각;이창영;권성태
    • 한국철도학회:학술대회논문집
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    • 한국철도학회 2007년도 춘계학술대회 논문집
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    • pp.1701-1706
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    • 2007
  • Jointless AF(Audio Frequency) Track Circuit is more comfortable than exist joint track circuit. This electrical circuit's function is detection train on rail, and transmit information between wayside and vehicle. 'Korea Railroad Corporation' proposed for revision of the Korean railway standards(KRS SG 0038-06 R, 2006.5.16) "Non-insulated AF Track Circuit". This proposal equipment developed to extend use for station of National Railway exist line. According to test standards Korean railway safety law and its ordinances, which were committed to Korea Railroad Research Institute, the professional committee 'Railway facility sector II' have helded on January in 2007. In this investigation, the changed test norm will be review the difference of important function test standards of new version to conform effectivity and safety test procedure according to the KS A 1025.

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A Novel Circuit for Characteristics Measurement of SiC Transistors

  • Cao, Guoen;Kim, Hee-Jun
    • Journal of Electrical Engineering and Technology
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    • 제9권4호
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    • pp.1332-1342
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    • 2014
  • This paper proposes a novel test circuit for SiC transistors. On-state resistance under practical application conditions is an important characteristic for the device reliability and conduction efficiency of SiC transistors. In order to measure the on-state resistance in practical applications, high voltage is needed, and high current is also necessary to ignite performance for the devices. A soft-switching circuit based on synchronous buck topology is developed in this paper. To provide high-voltage and high-current stresses for the devices without additional spikes and oscillations, a resonant circuit has been introduced. Using the novel circuit technology, soft-switching can be successfully realized for all the switches. Furthermore, in order to achieve accurate measurement of on-state resistance under switching operations, an active clamp circuit is employed. Operation principle and design analysis of the circuit are discussed. The dynamic measurement method is illustrated in detail. Simulation and experiments were carried out to verify the feasibility of the circuit. A special test circuit has been developed and built. Experimental results confirm that the proposed circuit gives a good insight of the devices performance in real applications.

단락발전기 파라미터 추정에 대한 고찰 (Study on the parameter estimation of short-circuit generator)

  • 김선호;김선구;노창일;김원만;이동준
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 2008년도 제39회 하계학술대회
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    • pp.866-867
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    • 2008
  • Among many tests to verify the characteristics of power system apparatus, the short circuit test is performed to verify the performance characteristics of the apparatus under the short-circuited power system. The verification of the short-circuit performance is inevitable for the reliability of power system and the safety of the operator around. The short circuit performance test requires the suitable power source and Korea Electrotechnology Research Institute has 4000 MVA, 500 MVA short circuit generators for the short circuit performance test. This paper will study on the parameters of short-circuit generator and the estimation of them.

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합성단락시험용 재점호장치 (Reignition system for synthetic short-circuit test)

  • 박승처;김맹현;강영식;신영준;고희석
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 2000년도 하계학술대회 논문집 C
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    • pp.1856-1858
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    • 2000
  • This paper describes the principles of reignition system which has newly been developed and used as KERI's high power testing facilities. Synthetic short-circuit testing method is generally adopted to perform the short-circuit test of the ultra high-voltage circuit breakers, which consists of two separated sources such as the current source from short-circuit generator and the voltage source from charged energy in capacitor. And, in case of synthetic short-circuit test, it will be necessary to use the reignition system in order to extending the arcing time of the circuit breaker and provide the arc energy equivalent to the direct testing method.

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A New Approach for Built-in Self-Test of 4.5 to 5.5 GHz Low-Noise Amplifiers

  • Ryu, Jee-Youl;Noh, Seok-Ho
    • ETRI Journal
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    • 제28권3호
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    • pp.355-363
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    • 2006
  • This paper presents a low-cost RF parameter estimation technique using a new RF built-in self-test (BIST) circuit and efficient DC measurement for 4.5 to 5.5 GHz low noise amplifiers (LNAs). The BIST circuit measures gain, noise figure, input impedance, and input return loss for an LNA. The BIST circuit is designed using $0.18\;{\mu}m$ SiGe technology. The test technique utilizes input impedance matching and output DC voltage measurements. The technique is simple and inexpensive.

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