Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference (한국전기전자재료학회:학술대회논문집)
- 2006.06a
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- Pages.501-502
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- 2006
A Study on Failure Analysis of Low Voltage Breakers with Aging
경년열화에 따른 배선용 차단기류의 고장점 분석 연구
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Cho, Han-Goo
(Korea Electrotechnology Research Institute)
;
- Lee, Un-Yong (Korea Electrotechnology Research Institute) ;
- Lee, You-Jung (Korea Electrotechnology Research Institute) ;
- Lee, Hae-Ki (ChungChung College) ;
- Kang, Seong-Hwa (ChungChung College)
- Published : 2006.06.22
Abstract
In this paper, new and aging sample of MCCB and ELCB are investigated the main performance test such as short circuit test, mechanical and electrical endurance test, dielectric test and surge current test. The surface conditions of new and aging sample are analyzed by SEM, TGA and DSC. The ELCB occurred badness mainly in short circuit test and surge current test. The badness cause of short circuit test was confirmed due to imperfect contact of contact part.