• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.16 no.6
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• pp.471-476
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• 2003

Au/oxide/n-InP Schottky diodes were fabricated from heteroepitaxial InP layers grown on GaAs substrates by the metalorganic vapor phase epitaxy (MOVPE) method from a new combination of source materials: ethyldimethylindium (EDMIn) and tertiarybutylphosphine (TBP). Anodic oxidation technique by using a solution of 10 g of ammonium pentaborate in 100 cc of ethylene glycole as the electrolyte was used to deposit a thin oxide layer. The barrier heights determined from three different techniques, current-voltage (I-V) measurements at room temperature and in the temperature range of 273 K - 373 K, and room temperature capacitance-voltage (C-V) measurements are in good agreement, 0.7 - 0.9 eV which is considerably high as compared to the 0.45 - 0.55 eV in Au/n-InP Schottky diode without a Passivation layer. The ideality factors of 1.1 - 1.3 of the Schottky diodes were also determined from the I-Y characteristics. Deep level transient spectroscopy (DLTS) studies revealed only one shallow electron state at 92.6 meV below the bottom of the conduction band and no deep state in the heteroepitaxial InP layers grown from EDMIn and TBP.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 1998.11a
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• pp.163-166
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• 1998

The mechanism of methane sensing by Pd-SiC diode was investigated over the temperature range of 400~$600^{\circ}C$. The effects or methane gas reaction on the parameters such as barrier height, initial rate of methane gas reaction are investigated. The methane gas reaction kinetics on the device are also discussed. The physical and chemical mechanism responsible for methane detection are proposed. Analysis of steady-state reaction kinetics using I-V method confirmed that methane gas reaction processes are responsible for the barrier height change in the diode.

• Journal of the Korean Institute of Telematics and Electronics S
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• v.34S no.2
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• pp.112-120
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• 1997

The clamp mode (CM) forward zero voltage switching multi resonant converter (ZVS-MPC) with self-driven synchronous rectifier is studied. The loss at the synchronous rectification stage of the converter is analyzed using MOSFET piecewise linear model and is compared with the loss at the conventional schottky diode rectification stage of th econverter. From the results of the analysis, it is known that the use fo MOSFETs as a synchronous rectifier reduces the loss at the rectification stage overthe whole load range comparing the use of schottky diodes as a conventional rectifier in the converter. In order to verify the validit of the analysis, we have built a 33W(3.3V/10A) CM forward ZVS-MRC with self-driven synchronous rectifier, in which switching frequency is 1MHz, and tested. FRom the experimental results, it is known that the synchronous rectification achieved about 1W improvement in the loss at the rectification stage and about 3% in the efficiency at the converter as compared with the conventional schottky diode rectification.

• JSTS:Journal of Semiconductor Technology and Science
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• v.13 no.4
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• pp.381-386
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• 2013

A new resistance model for a Schottky Barrier Diode (SBD) in CMOS technology is proposed in this paper. The proposed model includes the n-well thickness as a variable to explain the operational behavior of a planar SBD which is firstly introduced in this paper. The model is verified using the simulation methodology ATLAS. For verification of the analyzed model and the ATLAS simulation results, SBD prototypes are fabricated using a $0.13{\mu}m$ CMOS process. It is demonstrated that the model and simulation results are consistent with measurement results of fabricated SBD.

• Journal of the Korean Institute of Telematics and Electronics
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• v.9 no.3
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• pp.22-28
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• 1972

A new full-adder is proposed and it's operation-characteristic is described. The circuit proposed here was improved in operational stability and cicuit-configuration. The circuit is composed of a tunnel diode, Schottky-barrier diodes. The circuit design and it's opration is explained by considering the change of the load line when the input current is applied. The explanations are proved by experimental details.

• Proceedings of the KIEE Conference
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• 1996.07c
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• pp.1612-1614
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• 1996

Analytical expression for the breakdown voltage of the Schottky diode with double epitaxial layer has been obtained. Analytical results agree reasonably with the numerical simulations using MEDICI. It is expected that our results can be used for the optimum design of power MOSFET as well as the Schottky diodes with double epitaxial layer.

• JSTS:Journal of Semiconductor Technology and Science
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• v.10 no.2
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• pp.152-159
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• 2010

We propose a semi-analytical current conduction model for depletion-mode n-type nanowire field-effect transistors (NWFETs) with top-gate structure. The NWFET model is based on an equivalent circuit consisting of two back-to-back Schottky diodes for the metal-semiconductor (MS) contacts and the intrinsic top-gate NWFET. The intrinsic top-gate NWFET model is derived from the current conduction mechanisms due to bulk charges through the center neutral region as well as of accumulation charges through the surface accumulation region, based on the electrostatic method, and thus it includes all current conduction mechanisms of the NWFET operating at various top-gate bias conditions. Our previously developed Schottky diode model is used for the MS contacts. The newly developed model is integrated into ADS, in which the intrinsic part of the NWFET is developed by utilizing the Symbolically Defined Device (SDD) for an equation-based nonlinear model. The results simulated from the newly developed NWFET model reproduce considerably well the reported experimental results.

• Proceedings of the Korean Vacuum Society Conference
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• 2000.02a
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• pp.53-53
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• 2000

반도체 산업에서 유기물질의 응용에 많은 관심을 나타내고있으며, 그 응용의 예로는 발광 다이오드(light emitting diode)와 박막트랜지스터(thinfilm transistor)가 주를 이루고 있다. 이러한 유기 물질을 이용하면 소자의 제작 공정의 단순화와 제작 가격을 낮출 수 있는 이점을 기대할 수 있다. 본 연구에서는 유리 기판 위에 pentcence 다이오드를 제작하였다. 유리 기판 위에 silicon dioxide를 PECVD으로 성막하였다. 전극으로는 Ohmic contact를 이루기 위해 금(Au)을 사용하였으며 schottky contact을 이루기 위해서 알루미늄(Al), 인듐(In), 크롬(Cr), 은(Ag), 금(Au)을 각각 사용하였다. 소자의 활성 층으로는 pentcene을 가장 단순한 열 증착법으로 성막하였고, 진공도는 10-8Torr를 유지하였으며 성막 속도는 0.3 $\AA$/sec로 성막하였다. 제작된 소자들은 $\alpha$-step, I-V, C-V, AFM, IR등을 이용하여 측정, 분석하였다.

• The Journal of the Institute of Internet, Broadcasting and Communication
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• v.17 no.6
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• pp.79-82
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• 2017

In this paper, we proposed the wireless communication system using millimeter-wave envelope detector. The sub-harmonic mixer based on schottky barrier diode was used in the transmitter. The receiver was used millimeter-wave envelope detector. The transmitter was composed of schottky diode sub-harmonic mixer, frequency tripler, and horn antenna. The receiver was composed of horn antenna, millimeter-wave envelope detector, low pass filter, base band amplifier, and limiting amplifier. At 1.485 Gbps and 300 GHz, the eye-diagram showed a very good performance as measured by the error free. Communication distance is reduced compared to the heterodyne receiver, but compact and lightweight is possible.

• Journal of the Korean Institute of Telematics and Electronics
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• v.20 no.3
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• pp.33-39
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• 1983

New Schottky devices with thin stepped oxide layer (about 1000 ${\AA}$) along the edge of metal-semiconductor junction have been designed and fabricated. The breakdown voltages of these diodes have been compared with those of conventional metal overlap and P guard ring Schottky diode structures. Thin stepped oxide layer has been grown by the process of T.C.E. oxidation. In order to compare and demonstrate the improved down phenomena of these devices, conventional metal overlap diode and P guard ring which have the same dimension with new devices have also been integrated in a same New Schottty devices structured with thin stepped oxide layer have shown significant improvement in breakdown phenomena compared with conventional diodes.