• Transactions on Electrical and Electronic Materials
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• v.5 no.4
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• pp.138-142
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• 2004

This paper presents the improved bum-in method for the reliability of SRAM in Multi Chip Package (MCP). Semiconductor reliability is commonly improved through the bum-in process. Reliability problem is more significant in MCP that includes over two chips in a package, because the failure of one chip (SRAM) has a large influence on the yield and quality of the other chips - Flash Memory, DRAM, etc. Therefore, the quality of SRAM must be guaranteed. To improve the quality of SRAM, we applied the improved wafer level bum-in process using multi cells selection method in addition to the previously used methods. That method is effective in detecting special failure. Finally, with the composition of some kind of methods, we could achieve the high quality of SRAM in Multi Chip Package.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2004.11a
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• pp.53-56
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• 2004

This paper presents the improved burn-in method for the reliability of SRAM in MCP Semiconductor reliability is commonly improved through the burn-in process. Reliability problem is more significant in the Multi Chip Package, because of including over two devices in a package. In the SRAM-based Multi Chip Package, the failure of SRAM has a large effect on the yield and quality of the other chips - Flash Memory, DRAM, etc. So, the quality of SRAM must be guaranteed. To improve the quality of SRAM, we applied the improved wafer level burn-in process using multi cell selection method in addition to the current used methods. That method is effective in detecting special failure. Finally, with the composition of some kinds of methods, we could achieve the high qualify of SRAM in Multi Chip Package.

• Journal of Industrial Technology
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• v.2
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• pp.3-11
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• 1982

Reliability analysis methods have been employed in this study to determine the safety index ${\beta}$ for flexure associated with reinforced concrete designs that are in accordance with current USD code of Korea. In reliability analysis, the mean first-order second-moment methods are employed. The following specific conclusions can be drawn from this study; 1) Levels of safety for reinforced concrete design, measured by ${\beta}$, vary from 2.8 to 3.8 in flexure depending on the limit state, the ratio of live load to dead load and the uncertainties. 2) Target reliability ${\beta}$ associated with reinforced concrete beams in flexure is assumed to be 3.5~4.0 in Korea. 3) Load factors and resistance factors in flexure associated with the current provisions contained in USD code generally seem to be too high. The writer concluded the factors as following; ${\phi}=0.8,\;{\gamma}_D=1.1\;{\gamma}_L=1.75$.

• Journal of Applied Reliability
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• v.11 no.2
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• pp.187-212
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• 2011

KHP project sets total ownership cost as the target cost by applying CAIV and administrates total ownership cost through compromise analysis, a periodical estimate and management of design alternatives for each development. Based on expected cost results, sensibility of total ownership cost is analyzed complying with the change of reliability, availability, maintainability and other related factors. By considering potential total ownership cost saving methods, first of all, this paper identifies total ownership cost changing effects for each related factor, secondly, suggests total ownership cost and maintenance and operating cost saving methods via finding components that affect total ownership cost and lastly, suggests total ownership cost saving directions that may be applied to other projects in the future.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.18 no.6
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• pp.506-509
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• 2005

This paper presents the improved burn-in method for the reliability of SRAM in Multi Chip Package (MCP). Semiconductor reliability is commonly improved by the burn-in process. Reliability Problem is very significant in the MCP which includes over two chips in a package because the failure of one SRAM chip has a large influence on the yield and quality of the other chips such as Flash Memory, DRAM, etc. Therefore the quality of SRAM must be guaranteed. To improve the qualify of SRAM, we applied the improved wafer level burn-in process using multi cell selection method in addition to the previously used methods and it is found to be effective in detecting particular failures. Finally, with the composition of some kinds of methods, we achieved the high quality of SRAM in MCP.

• Proceedings of the KIEE Conference
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• 2001.11b
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• pp.34-37
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• 2001

This paper evaluate reliability indices of a part of transmission network of KEPCO system. Quantitative evaluation of transmission system reliability is very important because successful operation of an electric power system in the deregulated electricity market depends on transmission system reliability management. Monte Carlo methods are often preferable, when complex operating conditions are involved and/or the number of sever events is relatively large. Monte Carlo simulation methods and CMELDC(CoMposite power system Effective Load Duration Curve) were used in this paper.

• Structural Engineering and Mechanics
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• v.3 no.3
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• pp.201-213
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• 1995

At present Level 2 and importance sampling methods are the main tools used to estimate reliability of structural systems. But sometimes application of these techniques to realistic problems involves certain difficulties. In order to overcome the difficulties it is suggested to use Monte Carlo simulation in combination with two other techniques-extreme value and tail entropy approximations; an appropriate Pearson's curve is fit to represent simulation results. On the basis of this approach an algorithm and computer program for structural reliability estimation are developed. A number of specially chosen numerical examples are considered with the aim of checking the accuracy of the approach and comparing it with the Level 2 and importance sampling methods. The field of application of the approach is revealed.

• Journal of Korean Society of Industrial and Systems Engineering
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• v.36 no.1
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• pp.44-52
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• 2013

For evaluating participation in collaboration project, the peer assement method is mostly used and various scoring methods have been proposed. But, the reliability and validity of the peer assessment method are still doubted for all most method. In order to overcome these weaknesss, some guidelines and training methods have been recommended. In this article, however, statistical technique is proposed for measuring individual contributions to collaboration projects considering each assessor's reliability. The gist of our proposed algorithm is that an assessor's reliability depends on the evaluation policy, and this reliability is evaluated by an analysis of variance of the scores assigned by the assessor. We also show that the proposed method is very efficient by case study in university class.

• Journal of Institute of Control, Robotics and Systems
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• v.17 no.11
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• pp.1132-1137
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• 2011

Critical systems with high reliability feature fault tolerant redundancy. Conventional analytical reliability analysis methods that use the Reliability Block Diagram do not adequately reflect characteristics of the redundancy management system and are not suitable for this applications. This paper uses Monte-Carlo method to calculate the reliability of complicated redundant systems. The method was first validated for cases with analytical solutions. Then, the tool was successfully applied to analyze reliability of the flight control systems with a voter as redundancy management system.

• Proceedings of the Computational Structural Engineering Institute Conference
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• 2008.04a
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• pp.602-607
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• 2008

A technique for reliability-based design optimization(RBDO) is developed based on the Bayesian approach, which can deal with the epistemic uncertainty arising due to the limited number of data. Until recently, the conventional RBDO was implemented mostly by assuming the uncertainty as aleatory which means the statistical properties are completely known. In practice, however, this is not the case due to the insufficient data for estimating the statistical information, which makes the existing RBDO methods less useful. In this study, a Bayesian reliability is introduced to take account of the epistemic uncertainty, which is defined as the lower confidence bound of the probability distribution of the original reliability. In this case, the Bayesian reliability requires double loop of the conventional reliability analyses, which can be computationally expensive. Kriging based dimension reduction method(KDRM), which is a new efficient tool for the reliability analysis, is employed to this end. The proposed method is illustrated using a couple of numerical examples.