• Title/Summary/Keyword: radio-frequency plasma-enhanced chemical vapor deposition (RF-PECVD)

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결정질 실리콘 태양전지에서 RF-PECVD를 이용한 실리콘 질화막의 패시베이션 향상 연구

  • Song, Se-Yeong;Sin, Gyeong-Cheol;Gang, Min-Gu;Song, Hui-Eun;Jang, Hyo-Sik
    • Proceedings of the Korean Vacuum Society Conference
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    • 2014.02a
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    • pp.470.2-470.2
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    • 2014
  • RF-PECVD 장치에 의해 증착된 실리콘 질화막(SiNx)은 결정질 실리콘 태양전지에서 반사 방지막 효과 및 우수한 표면 패시베이션 특성을 제공하는 것으로 알려져 있다. 본 논문에서는 실리콘 질화막의 패시베이션 특성을 향상시키기 위해서 공정온도를 $400^{\circ}C$로 고정하고 공정압력, 가스비, RF (radio frequency) power를 가변하였다. 이 때의 실리콘 질화막의 굴절률 및 두께는 각각 2.0, 80 nm로 증착하여 그에 따른 특성에 대해 분석하였다. 공정 압력이 감소할수록 실리콘 질화막이 증착된 결정질 실리콘 태양전지의 유효 반송자 수명이 증가함을 보였고, 반면에 증착속도는 감소하였다. 또한 RF-power 500 W에서 실리콘 질화막이 증착된 결정질 실리콘 태양전지의 유효 반송자 수명이 상대적으로 높았으며 출력이 올라갈수록 증착속도가 증가하였다. 결과적으로 결정질 실리콘 태양전지에 증착한 실리콘 질화막은 0.8torr 공정 압력과 RF-power 500 W에서 $38.8{\mu}s$로 가장 좋은 유효 반송자 수명을 확인하였다. 위의 결과를 바탕으로 결정질 실리콘 태양전지를 제작하였고 향상된 패시베이션 특성을 갖는 실리콘 질화막의 조건을 찾기 위해서 개방전압(open circuit voltage)을 비교하였다. 공정압력 0.8 torr, RF-power 500 W에서 가장 높은 결과를 보였으며 이는 유효 반송자 수명과 유사한 결과를 나타냈다. 하지만 낮은 FF (fill factor)로 인해 변환 효율이 낮은 결과를 보였다. 태양전지 제작시 낮은 fill factor를 보인 이유와 위의 단점을 보완하기 위해 추가 실험을 수행하였으며, 개선된 fill factor를 통해 18.3% 효율의 태양전지를 제작하였다.

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DLC/Diamond 박막의 원자력분야 응용을 위한 기본연구

  • 박광준;전용범;서중석;박성원;진억용
    • Proceedings of the Korean Nuclear Society Conference
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    • 1997.05b
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    • pp.223-230
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    • 1997
  • 최근들어 그 활용도가 점점 증대되고 있는 DLU(Diamond-like Carbon) /Diamond 박막(thin film)의 합성기술을 개발하여 원자력분야에 응용하고자 시도하였다. 이를 위하여 13.56 MHz의 고주파(RF: radio-frequency)를 사용하는 플라즈마 화학증착(PECVD: Plasma Enhanced Chemical Vapor Deposition) 장치를 직접 제작하여 탄소함유(CH$_4$, $CO_2$...등) 기체로부터 기본적인 DLC 박막증착시험을 수행하였다. 실험은 진공증착기(vacuum chamber)내의 압력(pressure), 탄소함유 기체의 조성비, 그리고 바이어스전압(negative self-bias voltage)둥을 변화시키면서 수행하였다. 증착속도(deposition rate)는 증착층의 두께를 알파스템($\alpha$-step)으로 측정하여 결정하였으며, 이로부터 증착속도가 압력 및 바이어스 전압의 증가에 따라 증가함을 알 수 있었다. 또한 바이어스 전압 300V 이상에서 $CO_2$량 증가가 증착속도를 촉진시킨다는 사실도 확인하였다. 그리고 EPMA(electron probe micro-analyser) 및 Raman 스펙트럼분석을 통하여 증착층의 구조가 DLC 임을 확인하였다.

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The Annealing Effect of Diamond-like Carbon Films for RF MEMS Switch

  • Hwang, Hyun-Suk;Choi, Won-Seok;Cha, Jae-Sang
    • The Journal of Korean Institute of Communications and Information Sciences
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    • v.35 no.11A
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    • pp.1091-1096
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    • 2010
  • Stiction in microelectromechanical systems (MEMS) has been a major failure mechanism. Especially, in RF MEMS switches, moving parts often suffered in-use and release related stiction problems. Some materials and methods have been used to prevent this problem. Diamond-like carbon (DLC) has not only been used as a protective material owing to its good mechanical properties but also has been used as a hydrophobic material. Its properties could be controlled by post annealing treatment in various conditions. We synthesized DLC films using a radio frequency plasma enhanced chemical vapor deposition (RF PECVD) method on silicon substrates using methane ($CH_4$) and hydrogen ($H_2$) gas. Then, the change of the hydrophobic property of the films was investigated undervarious annealing temperatures in nitrogen and in oxygen ambient. The films, that were annealed above $700^{\circ}C$ in nitrogen ambient, showed a high contact angle of water (> $90^{\circ}$) even though their mechanical property was sacrificed to some degree. The structural variation and the changes of the hydrophobic and mechanical properties of the DLC films were analyzed by Raman spectrum, contact angle measurement, surface profiler, and a nanoindentation test.

Superhydrophobic nanostructured non-woven fabric using plasma modification

  • Shin, Bong-Su;Lee, Kwang-Reoul;Kim, Ho-Young;Moon, Myoung-Woon
    • Proceedings of the Korean Vacuum Society Conference
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    • 2011.02a
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    • pp.320-320
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    • 2011
  • We describe fabrication of superhydrophobic surface on non-woven fabric (NWF) having nano-hairy structures and a hydrophobic surface coating. Oxygen plasma was irradiated on NWF for nano-texuring and a precursor of HMDSO (Hexamethydisiloxane) was introduced as a surface chemical modification for obtaining superhydrophobicity using 13.56 MHz radio frequency-Plasma Enhanced Chemical Vapor Deposition (rf-PECVD). O2 plasma treatment time was varied from 1 min to 60 min at a bias voltage of 400V, which fabricated pillar-like structures with diameter of 30 nm and height of 150 nm on NWF. Subsequently, hydrophobic coating using hexamethyldisiloxane vapor was deposited with 10 nm thickness on NWF substrate at a bias voltage of 400 V. We evaluate superhydrophobicity of the modified NWF with sessile drop using goniometer and high speed camera, in which aspect ratio of nanohairy structures, contact angle and contact angle hysteresis of the surfaces were measured. With the increase of aspect ratio, the wetting angle increased from $103^{\circ}$ to $163^{\circ}$, and the contact angle hysteresis decreased dramatically below $5^{\circ}$. In addition, we had conducted experiment for nucleation and condensation of water via E-SEM. During increasing vapor pressure inside E-SEM from 3.7 Torr to over 6 Torr which is beyond saturation point at $2^{\circ}C$, we observed condensation of water droplet on the superhydropobic NWF. While the condensation of water on oxygen plasma treated NWF (superhydrophilic) occurred easily and rapidly, superhydrophobic NWF which was fabricated by oxygen and HMDSO was hardly wet even under supersaturation condition. From the result of wetting experiment and water condensation via E-SEM, it is confirmed that superhydrophobic NWF shows the grate water repellent abilities.

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DLC Structure Layer for Piezoelectric MEMS Switch (압전 MEMS 스위치 구현을 위한 DLC 구조층에 관한 연구)

  • Hwang, Hyun-Suk;Lee, Kyong-Gun;Yu, Young-Sik;Lim, Yun-Sik;Song, Woo-Chang
    • Journal of Satellite, Information and Communications
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    • v.6 no.1
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    • pp.28-31
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    • 2011
  • In this paper, a new set of structural and sacrificial material that is diamond like carbon (DLC)/photoresist for high performance piezoelectric RF-MEMS switches which are actuated in d33 mode is suggested. To avoid curing problem of photoresist sacrificial layer, DLC structure layer is deposited at room temperature by radio frequency plasma enhanced chemical vapor deposition (RF-PECVD) method. And lead zirconate titanate (PZT) piezoelectric layer is deposited on structure layer directly at room temperature by rf magnetron sputtering system and crystallized by rapid thermal annealing (RTA) equipment. Particular attention is paid to the annealing of PZT film in order to crystallize into perovskite and the variation of mechanical properties of DLC layer as a function of annealing temperature. The DLC layer shows good performance for structure layer in aspect to Young's modulus and hardness. The fabrication becomes much simpler and cheaper with use of a photoresist.

N2 plasma treatment of pigments with minute particle sizes to improve their dispersion properties in deionized water

  • Zhang, Jingjing;Park, Yeong Min;Tan, Xing Yan;Bae, Mun Ki;Kim, Dong Jun;Jang, Tae Hwan;Kim, Min Su;Lee, Seung Whan;Kim, Tae Gyu
    • Journal of Ceramic Processing Research
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    • v.20 no.6
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    • pp.589-596
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    • 2019
  • Pigments with minute particle sizes, such as carbon black (CB) and pigment red 48:2 (P.R.48:2), are the most important types of pigment and have been widely used in many industrial applications. However, minute particles have large surface areas, high oil absorption and low surface energy. They therefore tend to be repellent to the vehicle and lose stability, resulting in significant increases in viscosity or reaggregation in the vehicle. Therefore, finding the best way to improve the dispersion properties of minute particle size pigments presents a major technical challenge. In this study, minute particle types of CB and P.R.48:2 were treated with nitrogen gas plasma generated via radio frequency-plasma enhanced chemical vapor deposition (RF-PECVD) to increase the dispersion properties of minute particles in deionized (DI) water. The morphologies and particle sizes of untreated and plasma treated particles were evaluated using scanning electron microscopy (SEM) and atomic force microscopy (AFM). The average distributions of particle size were measured using a laser particle sizer. Fourier transform infrared spectroscopy was carried out on the samples to identify changes in molecular interactions during plasma processing. The results of our analysis indicate that N2 plasma treatment is an effective method for improving the dispersibility of minute particles of pigment in DI water.

Characteristics of Diamond Like Carbon Film Fabricated by Plasma Enhanced Chemical Vapor Deposition Method with mixed Ar, N2 gas rate (혼합된 Ar, N2 가스 유량에 따른 PECVD 방법에 의하여 제작된 다이아몬드 상 탄소 박막의 특성)

  • Gang, Seong-Ho;Kim, Byeong-Jin;Bae, Gyeong-Tae;Ju, Seong-Hu
    • Proceedings of the Korean Institute of Surface Engineering Conference
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    • 2018.06a
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    • pp.87-87
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    • 2018
  • 다이아몬드 상 탄소(diamond-like carbon, DLC)는 상당량의 $sp^3$ 결합을 가지는 비정질 탄소(a-C) 또는 수소화 비정질 탄소(a-C:H)로 이루어진 준안정 형태의 탄소이다. DLC는 전기 저항과 굴절률이 높고 화학적으로 다른 물질과 반응하지 않으며, 마찰계수가 낮고 경도가 높아 자기 디스크, 광학 소자 등의 다양한 분야에서 적용되고 있다[1,2]. 또한 다이아몬드에 비해 상온에서 성장이 가능할 정도로 합성온도가 낮아 적용 기판의 제한이 거의 없고, 증착 방법과 조건에 따라 탄소 결합의 다양성과 비정질성이 변화하기 때문에 넓은 범위의 특성을 얻을 수 있는 장점이 있다. 지금까지 DLC 박막의 광학적 특성, 특히 굴절률, 광학적인 에너지 밴드 갭, 자외선과 적외선 투과성에 대해서는 많은 연구가 진행되었으나 가시광선의 투과성에 대한 연구는 제한적이며[4], 가시광선 투과도 개선에 대한 연구는 전무하다. 본 연구에서는 ITO 기판 위에 DLC를 합성하고 기계적 특성과 가시광선 영역 투과도를 조사하였다. RF-PECVD(radio frequency plasma enhanced chemical vapor deposition) 방법에 의해서 $C_2H_2+Ar$ 혼합 가스 비율과 $C_2H_2+N_2$ 혼합 가스 비율을 변화시켜 ITO 기판 위에 DLC 박막을 합성하였다. 공정 압력과 rf-power, 증착시간, 기판온도는 0.2 torr, 40 W, 5 분, $50^{\circ}C$로 고정하고, 공정 가스는 $C_2H_2+Ar$$C_2H_2+N_2$가 200 sccm이 되도록 비율을 변화하였다. $C_2H_2:Ar$$C_2H_2:N_2$의 비율은 180 : 20, 160 : 40, 140 : 60, 120 : 80, 100 : 100이 되도록 가스의 유량을 조절하였다. 투과도는 가시광선(380 ~ 780 nm) 범위에서 측정하였고 두께와 표면조도는 AFM으로 측정하였다. 투과도는 $C_2H_2+Ar$의 Ar 가스 비율이 증가할수록 증가해 140 : 60일 때 최댓값을 나타낸 후 다시 감소하였다. $C_2H_2+N_2$ 투과도는 $N_2$ 가스 비율이 증가할수록 감소하는 경향을 나타내었다. 표면 거칠기는 $C_2H_2+Ar$ 혼합 가스를 사용한 경우의 Ar의 가스 비율이 증가할수록 증가하였다. 그러나 $C_2H_2+N_2$ 혼합 가스를 사용한 경우에는 $N_2$ 가스의 혼합 비율이 증가할수록 감소하였다.

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Effect of Oxygen and Diborane Gas Ratio on P-type Amorphous Silicon Oxide films and Its Application to Amorphous Silicon Solar Cells

  • Park, Jin-Joo;Kim, Young-Kuk;Lee, Sun-Wha;Lee, Youn-Jung;Yi, Jun-Sin;Hussain, Shahzada Qamar;Balaji, Nagarajan
    • Transactions on Electrical and Electronic Materials
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    • v.13 no.4
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    • pp.192-195
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    • 2012
  • We reported diborane ($B_2H_6$) doped wide bandgap hydrogenated amorphous silicon oxide (p-type a-SiOx:H) films prepared by using silane ($SiH_4$) hydrogen ($H_2$) and nitrous oxide ($N_2O$) in a radio frequency (RF) plasma enhanced chemical vapor deposition (PECVD) system. We improved the $E_{opt}$ and conductivity of p-type a-SiOx:H films with various $N_2O$ and $B_2H_6$ ratios and applied those films in regards to the a-Si thin film solar cells. For the single layer p-type a-SiOx:H films, we achieved an optical band gap energy ($E_{opt}$) of 1.91 and 1.99 eV, electrical conductivity of approximately $10^{-7}$ S/cm and activation energy ($E_a$) of 0.57 to 0.52 eV with various $N_2O$ and $B_2H_6$ ratios. We applied those films for the a-Si thin film solar cell and the current-voltage characteristics are as given as: $V_{oc}$ = 853 and 842 mV, $J_{sc}$ = 13.87 and 15.13 $mA/cm^2$. FF = 0.645 and 0.656 and ${\eta}$ = 7.54 and 8.36% with $B_2H_6$ ratios of 0.5 and 1% respectively.

A Study on Solid-Phase Epitaxy Emitter in Silicon Solar Cells (고상 성장법을 이용한 실리콘 태양전지 에미터 형성 연구)

  • Kim, Hyunho;Ji, Kwang-Sun;Bae, Soohyun;Lee, Kyung Dong;Kim, Seongtak;Park, Hyomin;Lee, Heon-Min;Kang, Yoonmook;Lee, Hae-Seok;Kim, Donghwan
    • Current Photovoltaic Research
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    • v.3 no.3
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    • pp.80-84
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    • 2015
  • We suggest new emitter formation method using solid-phase epitaxy (SPE); solid-phase epitaxy emitter (SEE). This method expect simplification and cost reduction of process compared with furnace process (POCl3 or BBr3). The solid-phase epitaxy emitter (SEE) deposited a-Si:H layer by radio-frequency plasma-enhanced chemical vapor deposition (RF-PECVD) on substrate (c-Si), then thin layer growth solid-phase epitaxy (SPE) using rapid thermal process (RTP). This is possible in various emitter profile formation through dopant gas ($PH_3$) control at deposited a-Si:H layer. We fabricated solar cell to apply solid-phase epitaxy emitter (SEE). Its performance have an effect on crystallinity of phase transition layer (a-Si to c-Si). We confirmed crystallinity of this with a-Si:H layer thickness and annealing temperature by using raman spectroscopy, spectroscopic ellipsometry and transmission electron microscope. The crystallinity is excellent as the thickness of a-Si layer is thin (~50 nm) and annealing temperature is high (<$900^{\circ}C$). We fabricated a 16.7% solid-phase epitaxy emitter (SEE) cell. We anticipate its performance improvement applying thin tunnel oxide (<2nm).