A Study on the Defect Detection of Silicon-Chip Surrounding by Ultrasonic Wave - Automatic Determination Method of Threshold Value by Image Processing - (초음파를 이용할 실리콘 칩 주위의 결함 검출에 관한 연구 - 화상처리에 의한 threshold value의 자동 결정법 -)
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- Proceedings of the Korean Society of Precision Engineering Conference
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- 1991.11a
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- pp.87-94
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- 1991