• Title/Summary/Keyword: passivation effect

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[ $SiO_2$ ] Effect on the Electrochemical Properties of Polymeric Gel Electrolytes Reinforced with Glass Fiber Cloth ($SiO_2$가 유리섬유로 보강된 고분자 겔 전해질의 전기 화학적 특성에 미치는 영향)

  • Park Ho Cheol;Kim Sang Heon;Chun Jong Han;Kim Dong Won;Ko Jang Myoun
    • Journal of the Korean Electrochemical Society
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    • v.4 no.1
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    • pp.6-9
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    • 2001
  • [ $SiO_2$ ] effect on the electrochemical properties of polymeric gel electrolytes(PGEs) reinforced with glass fiber cloth(GFC) was investigated . PGEs were composed of polyacrylronitrile(PAN), poly(vinylidenefluoride-co-hexafluoropropylene) (P(VdF-co-HFP)), $LiClO_4$ and three kind of plasticizer(ethylene carbonate, dietyl carbonate, propylene carbonate). $SiO_2$ was added to PGEs in the weight fraction of 10, 20, $30\%$ respectively. PGEs containing $SiO_2$ showed conductivity of over $10^{-3}S/cm\;at\;23^{\circ}C$ and electrochemical stability window to 4.8V. In the impedance spectra of the cells, which were constructed by lithium metals as electrodes, interfacial resistance increased due to growth of passivation layer during storage time and remarkable difference was not observed with content of $SiO_2$. In the impedance spectra of the lithium ion polymer batteries consisted of $LiClO_2$ and mesophase pitch-based carbon fiber(MCF), ohmic cell resistance of $SiO_2-free$ PGE was changed continuously with number of cycle, but those of $SiO_2-dispersed$ PGEs were not. Discharge capacity of the PGE containing $20wt\%\;SiO_2$ showed 132 mAh/g at 0.2C rate and $85\%$ of discharge capacity was retained at 2C rate.

A Study of Failure Mechanism through abnormal AlXOY Layer after pressure Cooker Test for DRAM device (DRAM 소자의 PCT 신뢰성 측정 후 비정상 AlXOY 층 형성에 의해 발생된 불량 연구)

  • Choi, Deuk-Sung;Jeong, Seung-Hyun;Choi, Chae-Hyoung
    • Journal of the Microelectronics and Packaging Society
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    • v.25 no.3
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    • pp.31-36
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    • 2018
  • This research scrutinizes the reason of failure after pressure cooker test (PCT) for DRAM device. We use the physical inspecting tools, such as microscope, SEM and TEM, and finally find the discolor phenomenon, corrosion of Al and delamination of inter-metal dielectric (IMD) in the failed devices after PCT. Furthermore, we discover the abnormal $Al_XO_Y$ layer on Al through the careful additional measurements. To find the reason, we evaluate the effect of package ball size and pinhole in passivation layer. Unfortunately, those aren't related to the problems. We also estimate halide effect of Al. The halogens such like Cl are contained within EMC material. Those result in the slight improving of PCT characteristics but do not perfectly solve the problems. We make a hypothesis of Galvanic corrosion. We can find the residue of Ti at the edge of pad open area. We can see the improving the PCT characteristics by the time split of repair etch. The possible mechanism of the PCT failure can be deduced as such following sequence of reactions. The remained Ti reacts on the pad Al by Galvanic corrosion. The ionized Al is easily react with the $H_2O$ supplied under PCT environment, and finally transfers to the abnormal $Al_XO_Y$ layer.

Effects of Ar/N2 Two-step Plasma Treatment on the Quantitative Interfacial Adhesion Energy of Low-Temperature Cu-Cu Bonding Interface (Ar/N2 2단계 플라즈마 처리에 따른 저온 Cu-Cu 직접 접합부의 정량적 계면접착에너지 평가 및 분석)

  • Choi, Seonghun;Kim, Gahui;Seo, Hankyeol;Kim, Sarah Eunkyung;Park, Young-Bae
    • Journal of the Microelectronics and Packaging Society
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    • v.28 no.2
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    • pp.29-37
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    • 2021
  • The effect of Ar/N2 two-step plasma treatment on the quantitative interfacial adhesion energy of low temperature Cu-Cu bonding interface were systematically investigated. X-ray photoelectron spectroscopy analysis showed that Ar/N2 2-step plasma treatment has less copper oxide due to the formation of an effective Cu4N passivation layer. Quantitative measurements of interfacial adhesion energy of Cu-Cu bonding interface with Ar/N2 2-step plasma treatment were performed using a double cantilever beam (DCB) and 4-point bending (4-PB) test, where the measured values were 1.63±0.24 J/m2 and 2.33±0.67 J/m2, respectively. This can be explained by the increased interfacial adhesion energy according phase angle due to the effect of the higher interface roughness of 4-PB test than that of DCB test.

Synthesis and Performance of Dialkylamine (di-)nitrobenzoates for Vapor Corrosion Inhibitor (기화성방청제 Dialkylamine (di-)nitrobenzoates 합성 및 방청성능)

  • Chun, Yong-Jin;Park, Yong-Sung;Soh, Soon-Young
    • Applied Chemistry for Engineering
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    • v.10 no.1
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    • pp.6-11
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    • 1999
  • Dialkylamine (di-)nitrobenzoates as vapor corrosion inhibitor were synthesized with dialkylamines and (di-)nitrobenzoic acids. The compounds were analyzed by elemental analyzer, FT-IR and $^1H$-NMR spectrophotometer. Corrosion inhibition of synthetic compounds and additives [$(NH_4)_2CO_3$, $NaHCO_3$] against ferrous and non-ferrous metal was investigated by potentiostatic method [1% (w/v) corrosion inhibitor in 1M $Na_2SO_4$ aqueous solution] respectively. For corrosion inhibition of ferrous metal, dialkylamine 4-nitrobenzoates were better inhibitor than dialkylamine 3, 5-dinitrobenzoates, the passivating current density ($i_p$) of dialkylamine 4-nitrobenzoate was shown $4.78mA/cm^2$. While, for non-ferrous metal, dialkylamine 3, 5-dinitrobenzoates were better, those of dipropylamine 3, 5-dinitrobenzoate and hexamethyleneimine 3, 5-dinitrobenzoate were shown 36 and $37mA/cm^2$. Additive effect of $(NH_4)_2CO_3$ and $NaHCO_3$ for corrosion inhibition of ferrous metal was excellent but that of non-ferrous metal was not. Optimum ratios of diethylamine 4-nitrobenzoate with $(NH_4)_2CO_3$ and $NaHCO_3$ were 4 : 6 and 5 : 5 (V/V), and passivating current densities ($i_p$) of the mixtures were shown 0.26 and $0.85mA/cm^2$, respectively.

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Bond Strength of Wafer Stack Including Inorganic and Organic Thin Films (무기 및 유기 박막을 포함하는 웨이퍼 적층 구조의 본딩 결합력)

  • Kwon, Yongchai;Seok, Jongwon
    • Korean Chemical Engineering Research
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    • v.46 no.3
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    • pp.619-625
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    • 2008
  • The effects of thermal cycling on residual stresses in both inorganic passivation/insulating layer that is deposited by plasma enhanced chemical vapor deposition (PECVD) and organic thin film that is used as a bonding adhesive are evaluated by 4 point bending method and wafer curvature method. $SiO_2/SiN_x$ and BCB (Benzocyclobutene) are used as inorganic and organic layers, respectively. A model about the effect of thermal cycling on residual stress and bond strength (Strain energy release rate), $G_c$, at the interface between inorganic thin film and organic adhesive is developed. In thermal cycling experiments conducted between $25^{\circ}C$ and either $350^{\circ}C$ or $400^{\circ}C$, $G_c$ at the interface between BCB and PECVD $ SiN_x $ decreases after the first cycle. This trend in $G_c$ agreed well with the prediction based on our model that the increase in residual tensile stress within the $SiN_x$ layer after thermal cycling leads to the decrease in $G_c$. This result is compared with that obtained for the interface between BCB and PECVD $SiO_2$, where the relaxation in residual compressive stress within the $SiO_2$ induces an increase in $G_c$. These opposite trends in $G_cs$ of the structures including either PECVD $ SiN_x $ or PECVD $SiO_2$ are caused by reactions in the hydrogen-bonded chemical structure of the PECVD layers, followed by desorption of water.

A study of the photoluminescence of undoped ZnO and Al doped ZnO single crystal films on sapphire substrate grown by RF magnetron sputtering (RF 스퍼터링법으로 사파이어 기판 위에 성장한 ZnO와 ZnO : A1 박막의 질소 및 수소 후열처리에 따른 Photoluminescence 특성)

  • Cho, Jung;Yoon, Ki-Hyun;Jung, Hyung-Jin;Choi, Won-Kook
    • Korean Journal of Materials Research
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    • v.11 no.10
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    • pp.889-894
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    • 2001
  • 2wt% $Al_2O_3-doped$ ZnO (AZO) thin films were deposited on sapphire (0001) single crystal substrate by parellel type rf magnetron sputtering at 55$0^{\circ}C$. The as-grown AZO thin films was polycrystalline and showed only broad deep defect-level photoluminescence (PL). In order to examine the change of PL property, AZO thin films were annealed in $N_2$ (N-AZO) and $H_2$ (H-AZO) at the temperature of $600^{\circ}C$~$1000^{\circ}C$ through rapid thermal annealing. After annealed at $800^{\circ}C$, N-AZO shows near band edge emission (NBE) with very small deep-level emission, and then N-AZO annealed at $900^{\circ}C$ shows only sharp NBE with 219 meV FWHM. In Comparison with N-AZO, H-AZO exhibits very interesting PL features. After $600^{\circ}C$ annealing, deep defect-level emission was quire quenched and NBE around 382 nm (3.2 eV) was observed, which can be explained by the $H_2$passivation effect. At elevated temperature, two interesting peaks corresponding to violet (406 nm, 3.05 eV) and blue (436 nm, 2.84 eV) emission was firstly observed in AZO thin films. Moreover, peculiar PL peak around 694 nm (1.78 eV) is also firstly observed in all the H-AZO thin films and this is believed good evidence of hydrogenation of AZO. Based on defect-level scheme calculated by using the full potential linear muffin-tin orbital (FP-LMTO), the emission 3.2 eV, 3.05 eV, 3.84 eV and 1.78 eV of H-AZO are substantially deginated as exciton emission, transition from conduction band maximum to $V_{ Zn},$ from $Zn_i$, to valence band maximum $(V_{BM})$ and from $V_{o} to V_BM}$, respectively.

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Chemical Effects on Head Loss across Containment Sump Strainer under Post-LOCA Environment (LOCA이후 환경에서 원자로건물집수조 여과기의 수두손실에 대한 화학적 영향)

  • Ku, Hee-Kwon;Jung, Bum-Young;Hong, Kwang;Jeong, Eun-Sun;Jung, Hyun-Jun;Park, Byung-Gi;Rhee, In-Hyoung;Park, Jong-Woon
    • Journal of the Korea Academia-Industrial cooperation Society
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    • v.10 no.11
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    • pp.3260-3268
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    • 2009
  • A test apparatus has been fabricated to simulate chemical effect on head loss through a strainer in a pressurized water reactor (PWR) containment water pool after a loss of coolant accident (LOCA). Tests were conducted under condition of same ratio of strainer surface area to water volume between the test appratus and the containment sump. A series of tests have been performed to investigate the effects of spray, existence of calcium-silicate with tri-sodium phosphate (TSP), and composition of materials. The results showed that head loss across the chemical bed with even a small amount of calcium-silicate insulation instantaneously increased as soon as TSP was added to the test solution. Also, the head loss across the test screen is strongly affected by spray duration and is increased rapidly at the early stage, because of high dissolution and precipitation of aluminum and zinc. After passivation of aluminum and zinc by corrosion, the head loss increase is much slowed down and is mainly induced by materials such as calcium, silicon, and magnesium leached from NUKONTM and concrete. Furthermore, it is newly found that the spay buffer agent, tri-sodium phosphate, to form protective coating on the aluminum surface and reduce aluminum leaching is not effective for a large amount of aluminum and a long spray.

Effect of Al2O3 Inter-Layer Grown on FeCrAl Alloy Foam to Improve the Dispersion and Stability of NiO Catalysts (NiO 촉매의 분산성 및 안정성 향상을 위하여 FeCrAl 합금 폼 위에 성장된 Al2O3 Inter-Layer 효과)

  • Lee, Yu-Jin;Koo, Bon-Ryul;Baek, Seong-Ho;Park, Man-Ho;Ahn, Hyo-Jin
    • Korean Journal of Materials Research
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    • v.25 no.8
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    • pp.391-397
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    • 2015
  • NiO catalysts/$Al_2O_3$/FeCrAl alloy foam for hydrogen production was prepared using atomic layer deposition (ALD) and subsequent dip-coating methods. FeCrAl alloy foam and $Al_2O_3$ inter-layer were used as catalyst supports. To improve the dispersion and stability of NiO catalysts, an $Al_2O_3$ inter-layer was introduced and their thickness was systematically controlled to 0, 20, 50 and 80 nm using an ALD technique. The structural, chemical bonding and morphological properties (including dispersion) of the NiO catalysts/$Al_2O_3$/FeCrAl alloy foam were characterized by X-ray diffraction, X-ray photoelectron spectroscopy, field-emission scanning electron microscopy and scanning electron microscopy-energy dispersive spectroscopy. In particular, to evaluate the stability of the NiO catalysts grown on $Al_2O_3$/FeCrAl alloy foam, chronoamperometry tests were performed and then the ingredient amounts of electrolytes were analyzed via inductively coupled plasma spectrometer. We found that the introduction of $Al_2O_3$ inter-layer improved the dispersion and stability of the NiO catalysts on the supports. Thus, when an $Al_2O_3$ inter-layer with a 80 nm thickness was grown between the FeCrAl alloy foam and the NiO catalysts, it indicated improved dispersion and stability of the NiO catalysts compared to the other samples. The performance improvement can be explained by optimum thickness of $Al_2O_3$ inter-layer resulting from the role of a passivation layer.

Effect of SUS316L Bipolar Plate Corrosion on Contact Resistance and PEMFC Performance (SUS316L 분리판 부식에 의한 접촉저항 및 고분자전해질 연료전지 성능에 미치는 영향)

  • Kim, Junseob;Kim, Junbom
    • Applied Chemistry for Engineering
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    • v.32 no.6
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    • pp.664-670
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    • 2021
  • Stainless steel was applied as bipolar plate (BP) of polymer electrolyte membrane fuel cell (PEMFC) due to high mechanical strength, electrical conductivity, and good machinability. However, stainless steel was corroded and increased contact resistance resulting PEMFC performance decrease. Although the corrosion resistance could be improved by surface treatment such as noble metal coating, there is a disadvantage of cost increase. The stainless steel corrosion behavior and passive layer influence on PEMFC performance should be studied to improve durability and economics of metal bipolar plate. In this study, SUS316L bipolar plate of 25 cm2 active area was manufactured, and experiments were conducted for corrosion behavior at an anode and cathode. The influence of SUS316L BP corrosion on fuel cell performance was measured using the polarization curve, impedance, and contact resistance. The metal ion concentration in drained water was analyzed during fuel cell operation with SUS316L BP. It was confirmed that the corrosion occurs more severely at the anode than at the cathode for SUS316L BP. The contact resistance was increased due to the passivation of SUS316L during fuel cell operation, and metal ions continuously dissolved even after the passive layer formation.