• Title/Summary/Keyword: parts reliability

검색결과 879건 처리시간 0.034초

A study of guaranteeing reliability for IC of electronic instruments according temperature

  • Yoon, Geon;Park, Yong-Oon;Kwon, Soon-Chang
    • 제어로봇시스템학회:학술대회논문집
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    • 제어로봇시스템학회 2005년도 ICCAS
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    • pp.320-323
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    • 2005
  • This paper discusses heat problem of IC, which composes the electronic instruments, to guarantee reliability of electronic instruments. And also proposes the unified equivalent model for various electronic instrument products to guarantee reliability and life of its parts. Because electronic instruments are down sizing and operated with high frequency, the internal temperature of electronic instruments is rising steadily. The internal temperature of the electronic instruments gives a big effect to electronic instrument's reliability and life. The semiconductor parts are the representative heat generation parts because of its complicated function, high frequency and high density. Consequently, guaranteeing reliability and life of electronic semiconductor is the important start point in securing the reliability and life of the electronic instrument product. Unfortunately, there are many factors, which affect heat dissipation efficiency. The heat dissipation efficiency follows the environment where the electronic instrument products are used. Therefore it is very difficult to define reliability and life of the electronic manufactures. Electronic instrument products are composed of printed circuit board (PCB), integrated circuit (IC), resistance, and capacitor and so on. And there are superposed thermal resistances, because the parts are arrayed on the printed circuit board (PCB), Therefore the total thermal resistance is variable. Consequently it cannot have same thermal model for each electronic instrument products. In the next part, we propose the unified equivalent model for various electronic instruments. And using the proposed equivalent model proofs the method for analysis reliability of electronic parts.

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뻐꾸기 탐색 방법을 활용한 다계층 시스템의 중복 할당 최적화 (Redundancy Allocation in A Multi-Level Series System by Cuckoo Search)

  • 정일한
    • 한국산학기술학회논문지
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    • 제18권4호
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    • pp.334-340
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    • 2017
  • 신뢰도는 열차, 비행기, 여객선과 같이 시스템에 한번 고장이 발생한 경우 치명적인 결과로 이어져 시스템에서 중요한 설계 요인으로 고려되어진다. 상당히 높은 신뢰도를 요구하는 시스템에서 시스템의 신뢰도를 향상시키는 방법에는 다양하게 있지만, 부품의 중복은 시스템 신뢰도를 향상시키기 위한 효율적인 방법으로 알려져 있다. 신뢰도를 높이기 위해 부품을 중복하는 경우에는 어떤 부품을 몇 개를 중복해야 하는지를 시스템 신뢰도 측면과 비용, 기타 설계자원 측면에서 고려하여야 한다. 본 연구에서는 직렬 구조를 가지는 다계층 시스템에 대한 중복할당의 방법을 다룬다. 다계층시스템에 대한 정의를 설명하고, 제약된 설계비용에서 시스템 신뢰도를 최대화하기 위한 중복 부품의 선정과 중복수량을 최적화하는 방법을 다룬다. 특히, 다계층 시스템에서 경로집합 중에 단 하나의 품목만 중복이 가능한 경우에 대해서 다루며, 유효한 해를 찾기 위한 방법을 제시한다. 최적화를 위해 뻐꾸기 탐색 알고리즘을 적용한다. 뻐꾸기 탐색 알고리즘에서는 다계층시스템의 중복할당 최적화를 위한 탐색절차, 이웃해의 탐색 방법, 해의 표현 등을 제시한다. 수치예제를 통해 기존에 유전알고리즘과 뻐꾸기 탐색 알고리즘의 성능을 비교한다.

에너지절감형 대형기계류부품용 수명시험장치의 개발 (Development of energy saving type life testing device for large machinery parts)

  • 이용범;신석신;박종호
    • 한국신뢰성학회지:신뢰성응용연구
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    • 제13권1호
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    • pp.55-63
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    • 2013
  • For a reliability assessment of large machinery parts, reliable data should be obtained from testing many samples for a long time. However, in case of testing these samples, testing cost is excessive; in case of life test for long time, power consumption is high; and in case of accelerated test by over load, very high cost is required to build the life testing device. Especially it is very frequent that the expensive device's life has ended during a accelerated test by over load. In this study, the design mechanism of the life testing device which excels in energy saving during the reliability test of large machinery parts has been introduced.

집중관리부품 선정을 위한 평가요소 개발과 활용방안 연구 (A Study on the Evaluation Criteria Development for Selecting Intensive Management Items and Its Application Plan)

  • 우희성;정상규;이창우
    • 품질경영학회지
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    • 제41권3호
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    • pp.475-486
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    • 2013
  • Purpose: In this study, we propose the evaluation criteria and method for selecting intensive management items which, in order to improve the parts management.1) Methods: Parts management such as MIL-STD-3018, SD-19, SD-22 is used for devising the proposed evaluation criteria and method of selecting intensive management items. Especially, proposed evaluation criteria is customized by using AHP method. Results: We approved the importance of evaluation criteria for selecting intensive management items using AHP method. In production step, the parts problem record, the parts reliability, the supplier reliability, DMSM S1). In development step, the parts problem record, a counterfeit, the parts reliability, MTTF2). Conclusion: The evaluation criteria and method for selecting intensive management items which is applicable to the domestic weapon acquisition environment is proposed.

제조 시스템의 최적 신뢰도 및 보전도 할당 (Allocation of the Optimal Reliability and Maintainability in Manufacturing Systems)

  • 이상철
    • 산업경영시스템학회지
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    • 제22권50호
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    • pp.23-32
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    • 1999
  • Reliability and maintainability allocation in the analysis of the system's design, with the objective of planning and installing the individual components in such a way that the system performance is achieved. This paper has been made to solve an important task in reliability management of manufacturing systems within the general objective being to increase productivity while maintaining costs low. Thus, the purpose of this paper is to provide an analytical approach to determine an optimal reliability and maintainability allocation, trading off among system performance and parts investment costs. Two important considerations will be addressed in this regard : (ⅰ) determine the reliability and maintainability allocation of parts which maximizes a given production index, having fixed the total cost of investments ; and (ⅱ) determine the reliability and maintainability allocation which minimizes the total cost of investments, having fixed a minimum acceptable level of productivity. The procedure proposed in this paper is able to provide to managers and designers useful indications on the reliability and maintainability characteristics of parts in series -parallel systems. And this heuristic model is a decision support tool for contractors who are involved in large scale design projects such as ship and aircraft design. Numerical examples prove that an approximate expression of the average throughput rate is sufficiently accurate to be used in a numerical optimization method.

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자이로의 신뢰성 예측모델에 관한 연구 (A Study on The Feliability Predication Model of Gyroscope)

  • 백순흠;문홍기;김호룡
    • 한국정밀공학회:학술대회논문집
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    • 한국정밀공학회 1993년도 추계학술대회 논문집
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    • pp.475-481
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    • 1993
  • The objective of this study is to develope the reliability prediction model for Float Rated Integrating Gyroscope( :FRIG) at maximum loading. The equation of motion for FRIG is firstly derived to set up the reliability prediction model. To analysis reliability or all parts of the gyro is not easy due to their complicated structure. Therefore the failure parts are chosen by Failure Mode Effective Analysis (:FMEA). F.E.M is utilized to calculate loads for the selseced rotating assembly and pivot / jewel. The technical reliability is calculated by applying reliability design theory with these results and the performance reliability is sought through distribution estimation with error test data. The bulk reliability of gyroscope is sought by applying the two results. The present prediction results are compared with the accumulation time in good agreement.

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Varistor의 ALT(Accelerated Life Testing) 설계 및 주 고장모드 분석 (A Study for Accelerated Life Testing and Failure Analysis of Chip Varistor)

  • 장우성;이준혁;이관훈;오영환
    • 한국신뢰성학회지:신뢰성응용연구
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    • 제5권2호
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    • pp.221-239
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    • 2005
  • General chip SMD parts(chip resistance, chip capacitor, chip varistor etc.) are very wide used electronics parts for IT units. But, failure modes are indistinct for these chip parts. In factory and field the failure modes are recognized to accidental failure mode caused by potential defect. In this paper used chip varistor ALT(Accelerate Life Test) test for verify general failure modes in chip SMD parts. Also the results are useful for general chip SMD ALT tests.

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Varistor 의 ALT(Accelerated Life Testing) 설계 및 주 고장모드 분석 (A Study for Accelerated Life Testing and Failure Analysis of Chip Varistor)

  • 장우성;이준혁;이관훈;오영환
    • 한국신뢰성학회:학술대회논문집
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    • 한국신뢰성학회 2005년도 학술발표대회 논문집
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    • pp.51-67
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    • 2005
  • General chip SMD parts(chip resistance, chip capacitor, chip varistor etc.) are very wide sed electronics parts for IT units. But, failure modes are indistinct for these chip parts. In factory and field the failure modes are recognized to accidental failure mope caused by potential defect. In this paper used chip varistor ALT(Accelerate Life Test) test for verify general failure modes in chip SMD parts. Also the results are useful for general chip SMD ALT tests.

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일부 전자부품을 중심으로 한 신뢰성 규격의 비교 (Comparison of Reliability Prediction Specifications through Some Electronic Parts)

  • 전태보
    • 산업기술연구
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    • 제27권B호
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    • pp.255-261
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    • 2007
  • Product reliability plays a significantly important role these days. This study has been performed to examine the widely being used specifications, MIL-HDBK-217 and SR-332 for electronic parts. We specifically selected an electronic ballast of the low wattage fluorescent lamp for the study. We briefly reviewed the reliability specifications with the basic concepts of the ballast. We then valuated failure rates of the parts using MIL-HDBK-217 and SR-332 specifications. Since the quality and environment factor values are subjectively determined for failure rate evaluations, we excluded them for comparison.

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Nondestructive Evaluation Technology and Reliability of Products

  • Lee, Joon-Hyun;Lee, Seung-Suck
    • 한국신뢰성학회:학술대회논문집
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    • 한국신뢰성학회 2001년도 정기학술대회
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    • pp.235-238
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    • 2001
  • It is well known that the reliability of materials of mechanical products is becoming more and more important not only for assurance of quality, but for international competition of products. In order to assure the reliability of materials or mechanical products nondestructive evaluation (NDE) techniques are playing more important roles. The existence of Internal defects in materials or mechanical parts is served as crack initiation site during the various loading condition. Historically, nondestructive evaluation (NDE) technique has been used almost exclusively for detecting microscopic discontinuities In materials or mechanical parts after they have been in service to expand the role of the NDE to include all aspects of materials production and application. Research efforts are being directed at developing and perfecting NDE techniques capable of monitoring (1) materials production processes (2) material integrity following transport, storage and fabrication and (3) the amount and rate of degradation during service. In addition, efforts are underway to develop technique capable of quantitative discontinuity sizing, permitting determination of response using fracture mechanics analysis, as well as techniques for quantitative materials characterization to replace the qualitative techniques used in the past. In this paper, the important role of NDE technology for reliability assurance of materials/mechanical parts is introduced.

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