Proceedings of the Korean Reliability Society Conference (한국신뢰성학회:학술대회논문집)

The Korean Reliability Society (한국신뢰성학회)
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A Study for Accelerated Life Testing and Failure Analysis of Chip Varistor

Varistor 의 ALT(Accelerated Life Testing) 설계 및 주 고장모드 분석

  • Chang Woo-Sung (Dept. of Industrial Engineering, Kyung Hee University) ;
  • Lee Jun-Hyuk (Dept. of Industrial Engineering, Kyung Hee University) ;
  • Lee Kwan-Hun (Reliability O Failure Analysis Center, KETI) ;
  • Oh Young-Hwan (Dept. of Industrial Engineering, Kyung Hee University)
  • 장우성 (광운대학교 전자통신과 통신망연구실) ;
  • 이준혁 (광운대학교 전자통신과 통신망연구실) ;
  • 이관훈 (전자부품연구원 신뢰성평가센터) ;
  • 오영환 (광운대학교 전자통신과 통신망연구실)
  • Published : 2005.06.01
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Abstract

General chip SMD parts(chip resistance, chip capacitor, chip varistor etc.) are very wide sed electronics parts for IT units. But, failure modes are indistinct for these chip parts. In factory and field the failure modes are recognized to accidental failure mope caused by potential defect. In this paper used chip varistor ALT(Accelerate Life Test) test for verify general failure modes in chip SMD parts. Also the results are useful for general chip SMD ALT tests.

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