• Title/Summary/Keyword: open-circuit

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Stability analysis of transversely isotropic laminated Mindlin plates with piezoelectric layers using a Levy-type solution

  • Ghasemabadian, M.A.;Saidi, A.R.
    • Structural Engineering and Mechanics
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    • v.62 no.6
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    • pp.675-693
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    • 2017
  • In this paper, based on the first-order shear deformation plate theory, buckling analysis of piezoelectric coupled transversely isotropic rectangular plates is investigated. By assuming the transverse distribution of electric potential to be a combination of a parabolic and a linear function of thickness coordinate, the equilibrium equations for buckling analysis of plate with surface bonded piezoelectric layers are established. The Maxwell's equation and all boundary conditions including the conditions on the top and bottom surfaces of the plate for closed and open circuited are satisfied. The analytical solution is obtained for Levy type of boundary conditions. The accurate buckling load of laminated plate is presented for both open and closed circuit conditions. From the numerical results it is found that, the critical buckling load for open circuit is more than that of closed circuit in all boundary and loading conditions. Furthermore, the critical buckling loads and the buckling mode number increase by increasing the thickness of piezoelectric layers for both open and closed circuit conditions.

AVR Parameter tuning with On-line System model using Parameter optimization technique (On-line 시스템 모델과 파라메터 최적화 기법을 이용한 AVR의 최적 파라메터 튜닝)

  • Kim, Jung-Mun;Moon, Seung-Ill
    • Proceedings of the KIEE Conference
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    • 1999.07c
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    • pp.1242-1244
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    • 1999
  • AVR parameter tuning for voltage control of power system generators has generally been done with the open-circuit model of the synchronous generator. When the generator is connected on-line and operating at rated load conditions, the AVR operates in an entirely different environment from the open-circuit conditions. This paper describes a new method for AVR parameter tuning using optimization technique with on-line linearized system model. As this method considers not only the on-line models but also the off-line open-circuit models, AVR parameters tuned by this method can give the sufficiently stable performance at the open-circuit commissioning phase and give the desired performance at the operating conditions. Also this method estimates the optimum parameters for desired performance indices that are chosen for satisfying requirements in some practical applications, the performance of the AVR can satisfy the various requirements.

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The Study of Corrosion of Heat Exchanger Tube for Absorption Refrigeration Machine (흡수식냉동기용 열교환기 세관의 부식에 관한 연구)

  • 임우조;정기철;윤병두
    • Proceedings of the Korean Society of Marine Engineers Conference
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    • 2002.05a
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    • pp.147-152
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    • 2002
  • This paper was studied on corrosion of heat exchanger tube for absorption refrigeration machine. In the 62 % lithium bromide solution at $60^{\circ}C$, polarization test of Cu, Al-brass, 10 % cupro nickel(90-10 % Cu-Ni) and 30 % cupronickel(70-30 % Cu-Ni) tube was carried out. And polarization behavior, polarization resistance characteristics, open circuit potential, anodic polarization of heat exchanger tube for absorption refrigeration machine were considered. The main results are as following: The open circuit potential of Al-brass tube becomes less noble than that of Cu tube, corrosion current density of that becomes lower than Cu tube. The open circuit potential of cupronickel tube is more noble than that of Cu tube, corrosion current density of that is controlled than Cu tube. The passivation critical current of 30 % Cu-Ni tube is lower than that of 10 % Cu-Ni tube, potential of passive region of that is more wide than 10 % Cu-Ni tube.

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Investigation of buckling behavior of functionally graded piezoelectric (FGP) rectangular plates under open and closed circuit conditions

  • Ghasemabadian, M.A.;Kadkhodayan, M.
    • Structural Engineering and Mechanics
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    • v.60 no.2
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    • pp.271-299
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    • 2016
  • In this article, based on the higher-order shear deformation plate theory, buckling analysis of a rectangular plate made of functionally graded piezoelectric materials and its effective parameters are investigated. Assuming the transverse distribution of electric potential to be a combination of a parabolic and a linear function of thickness coordinate, the equilibrium equations for the buckling analysis of an FGP rectangular plate are established. In addition to the Maxwell equation, all boundary conditions including the conditions on the top and bottom surfaces of the plate for closed and open circuited are satisfied. Considering double sine solution (Navier solution) for displacement field and electric potential, an analytical solution is obtained for full simply supported boundary conditions. The accurate buckling load of FGP plate is presented for both open and closed circuit conditions. It is found that the critical buckling load for open circuit is more than that of closed circuit in all loading conditions. Furthermore, it is observed that the influence of dielectric constants on the critical buckling load is more than those of others.

A Current Dynamic Analysis Based Open-Circuit Fault Diagnosis Method in Voltage-Source Inverter Fed Induction Motors

  • Tian, Lisi;Wu, Feng;Shi, Yi;Zhao, Jin
    • Journal of Power Electronics
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    • v.17 no.3
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    • pp.725-732
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    • 2017
  • This paper proposed a real-time, low-cost, fast transistor open-circuit fault diagnosis method for voltage-source inverter fed induction motors. A transistor open-circuit changes the symmetry of the inverter topology, leading to different similarities among three phase load currents. In this paper, dynamic time warping is proposed to describe the similarities among load currents. The proposed diagnosis is independent of the system model and needs no extra sensors or electrical circuits. Both simulation and experimental results show the high efficiency of the proposed fault diagnosis method.

An Instrumentation System Design for Electrical Accident Prevention of 3-Phase Electrical Control Panel (3상 전기제어반 전기사고 예방을 위한 계측시스템 설계)

  • Kwak, D.K.;Choi, J.K.;Kim, J.J.;Kwon, Y.J.;Song, G.
    • Proceedings of the KIPE Conference
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    • 2016.07a
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    • pp.36-37
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    • 2016
  • The main cause of electrical fires are caused due to short circuit and open circuit. This is generates an instantaneous electric arc or spark accompanied with such electric faults. These arcs generate a pressed wire, contact badness, and a weakness in the wire coating etc.. This research proposes a protection circuit to prevent open-phase accident due to contact failure of electromagnetic contactor, tracking arc fault, open-phase within the three-phase electrical control panel which is the most commonly applied in the industry. The proposed circuit also alarms and cuts off of power system when electrical faults occurs. In addition, the proposed circuit is validated by various electric accident simulator.

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A Comparative Study of Two Diagnostic Methods Based on the Switching Voltage Pattern for IGBT Open-Circuit Faults in Voltage-Source Inverters

  • Wang, Yuxi;Li, Zhan;Xu, Minghui;Ma, Hao
    • Journal of Power Electronics
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    • v.16 no.3
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    • pp.1087-1096
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    • 2016
  • This paper reports an investigation conducted on two diagnostic methods based on the switching voltage pattern of IGBT open-circuit faults in voltage-source inverters (VSIs). One method was based on the bridge arm pole voltage, and the other was based on bridge arm line voltage. With an additional simple circuit, these two diagnostic methods detected and effectively identified single and multiple open-circuit faults of inverter IGBTs. A comparison of the times for the diagnosis and anti-interference features between these two methods is presented. The diagnostic time of both methods was less than 280ns in the best case. The diagnostic time for the method based on the bridge arm pole voltage was less than that of the method based on the bridge arm line voltage and was 1/2 of the fundamental period in the worst case. An experimental study was carried out to show the effectiveness of and the differences between these two methods.

A nuclear battery based on silicon p-i-n structures with electroplating 63Ni layer

  • Krasnov, Andrey;Legotin, Sergey;Kuzmina, Ksenia;Ershova, Nadezhda;Rogozev, Boris
    • Nuclear Engineering and Technology
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    • v.51 no.8
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    • pp.1978-1982
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    • 2019
  • The paper presents the electrical performance measurements of a prototype nuclear battery and two types of betavoltaic cells. The electrical performance was assessed by measuring current-voltage properties (I-V) and determining the short-circuit current and the open-circuit voltage. With 63Ni as an irradiation source, the open-circuit voltage and the short-circuit current were determined as 1 V and 64 nA, respectively. The prototype consisted of 10 betavoltaic cells that were prepared using radioactive 63Ni. Electroplating of the radioactive 63Ni on an ohmic contact (Ti-Ni) was carried out at a current density of 20 mA/㎠. Two types of betavoltaic cells were studied: with an external 63Ni source and a 63Ni-covered source. Under irradiation of the 63Ni source with an activity of 10 mCi, the open-circuit voltage Voc of the fabricated cells reached 151 mV and 109 mV; the short-circuit current density Jsc was measured to be 72.9 nA/cm2 and 64.6 nA/㎠, respectively. The betavoltaic cells had the fill factor of 55% and 50%, respectively.

Test Pattern Generation for Detection of Sutck-Open Faults in BiCMOS Circuits (BiCMOS 회로의 Stuck-Open 고장 검출을 위한테스트 패턴 생성)

  • Sin, Jae-Hong
    • The Transactions of the Korean Institute of Electrical Engineers P
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    • v.53 no.1
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    • pp.22-27
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    • 2004
  • BiCMOS circuit consist of CMOS part which constructs logic function, and bipolar part which drives output load. In BiCMOS circuits, transistor stuck-open faults exhibit delay faults in addition to sequential behavior. In this paper, proposes a method for efficiently generating test pattern which detect stuck-open in BiCMOS circuits. In proposed method, BiCMOS circuit is divided into pull-up part and pull-down part, using structural property of BiCMOS circuit, and we generate test pattern using set theory for efficiently detecting faults which occured each divided blocks.

Test Pattern Genration for Detection of Stuck-Open and Stuck-On Faults in BiCMOS Circuits (BiCMOS 회로의Stuck-Open 고장과 Stuck-On 고장 검출을 위한 테스트 패턴 생성)

  • 신재흥;임인칠
    • Journal of the Korean Institute of Telematics and Electronics C
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    • v.34C no.1
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    • pp.1-11
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    • 1997
  • A BiCMOS circuit consists of the CMOS part which performs the logic function, and the bipolar part which drives output load. In BiCMOS circuits, transistor stuck-open faults exhibit delay faults in addition to sequential beavior. Also, stuck-on faults enhanced IDDQ (quiscent power supply current) at steady state. In this paper, a method is proposed which efficiently generates test patterns to detect stuck-open faults and stuck-on faults in BiCMOS circuits. The proposed method divides the BiCMOS circuit into pull-up part and pull-down part, and generates test patterns detect faults occured in each part by structural property of the BiCMOS circuit.

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