• Title/Summary/Keyword: nonlinear refractive index

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Measurements of optical nonlinear refractive index through the Z-scan method with circular symmetric beam (원형대칭 빛살 Z-스캔 방법에 의한 광학적 비선형 굴절율 측정)

  • Kim, Gi-Hun;Im, Yong-Sik;Park, Jong-Dae;Kim, Chil-Min;Jo, Chang-Ho
    • The Journal of Natural Sciences
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    • v.7
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    • pp.11-17
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    • 1995
  • The optical nonlinear refractive index of $Bil_3$ semiconductor microcluster colloid has been measured by the Z-scan method with circular symmetric beam. The value of nonlinear refractive index was -1.53 x $10^12($cm^2/W) at $0.532\mum$and the nonlinearities were mainly due to thermal effect induced by 20 ns laser pulse. And the absorption coefficient was measured to be -$10^8$(cm/W)

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Linear and Nonlinear Optical Properties of Vanadium Pentoxide Films Prepared by Pulsed-Laser Deposition

  • Cui, Liqi;Wang, Ruiteng;Wang, Weitian
    • Korean Journal of Materials Research
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    • v.31 no.7
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    • pp.382-385
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    • 2021
  • Well-crystallized vanadium pentoxide V2O5 thin films are fabricated on MgO single crystal substrates by using pulsed-laser deposition technique. The linear optical transmission spectra are measured and found to be in a wavelength range from 300 to 800 nm; the data are used to determine the linear refractive index of the V2O5 films. The value of linear refractive index decreases with increasing wavelength, and the relationship can be well explained by Wemple's theory. The third-order nonlinear optical properties of the films are determined by a single beam z-scan method at a wavelength of 532 nm. The results show that the prepared V2O5 films exhibit a fast third-order nonlinear optical response with nonlinear absorption coefficient and nonlinear refractive index of 2.13 × 10-10 m/W and 2.07 × 10-15 cm2/kW, respectively. The real and imaginary parts of the nonlinear susceptibility are determined to be 3.03 × 10-11 esu and 1.12 × 10-11 esu, respectively. The enhancement of the nonlinear optical properties is discussed.

Analysis of a Nonlinear Integrated-Mirror Etalon by the Characteristic Matrix Method (특성행렬을 이용한 비선형 집적거울 Etalon의 해석)

  • 김덕봉
    • Korean Journal of Optics and Photonics
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    • v.4 no.3
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    • pp.317-322
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    • 1993
  • In this paper we propose a method to analyze the nonlinear behavior of an integrated-mirror etalon by the characteristic matrix method. If the dependence of the refractive index and the absorption coefficient upon the light intensity are known, we can couple this with an equation by which we can evaluate the light intensity distribution inside an etalon for the given values of the refractive index and the absorption coefficient. By solving these coupled equations by the iteration method, we evaluate the transmission characteristics of a nonlinear integrated-mirror etalon. By the characteristic matrix method, we have demonstrated the static and dynamic bistable behavior of a nonlinear integrated-mirror etalon.

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Optical and Electrical Properties of $Ti_xSi_{1-x}O_y$ Films

  • Lim, Jung-Wook;Yun, Sun-Jin;Kim, Je-Ha
    • ETRI Journal
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    • v.31 no.6
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    • pp.675-679
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    • 2009
  • $Ti_xSi_{1-x}O_y$ (TSO) thin films are fabricated using plasma-enhanced atomic layer deposition. The Ti content in the TSO films is controlled by adjusting the sub-cycle ratio of $TiO_2$ and $SiO_2$. The refractive indices of $SiO_2$ and $TiO_2$ are 1.4 and 2.4, respectively. Hence, tailoring of the refractivity indices from 1.4 to 2.4 is feasible. The controllability of the refractive index and film thickness enables application of an antireflection coating layer to TSO films for use as a thin film solar cell. The TSO coating layer on an Si wafer dramatically reduces reflectivity compared to a bare Si wafer. In the measurement of the current-voltage characteristics, a nonlinear coefficient of 13.6 is obtained in the TSO films.

Measurement of the Third Order Nonlinear Optical Susceptibility of the Conducting Polymer Film by Maker Fringe Method (Maker fringe 방법에 의한 전도성 박막의 3차 비선형 광학 감수율의 측정)

  • 이건준;유성규;김동호
    • Korean Journal of Optics and Photonics
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    • v.5 no.1
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    • pp.18-24
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    • 1994
  • We have investigated a method to measure the refractive index, coherence length, and the third order nonlinear optical susceptibility ($x^{(3)}$) of the conducting polymer film. ($x^{(3)}$) of polymer film was obtained, by comparing Maker fringe of polymer film with that of fused quartz, and by calculating the correction factor due to the linear refractive index. The linear refractive index of polymer film was determined from the envelopes of the maxima and minima in the transmission spectrum. Poly ((1,4-phenylenevinylene$)_{0.34}$-co-(2-methoxy-1,4-phen ylene vinylene$)_{0.66}$) [PP$V_{0.34}$-PMP$V_{0.66}$] thin film was prepared by spin coating method. From transmission spectrum and Maker fringe data, we found that the refractive index, coherence length, and the third order nonlinear optical susceptibility ($x^{(3)}$) of the [PP$V_{0.34}$-PMP$V_{0.66}$] are 1.786, 17.86 ${\mu}m$ and 5.8${\times}10^{-12}$esu, respectively.

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Refractive index change of nonlinear polymer thin films induced by corona poling and quantitative evaluation of poling effect (코로나 극성배향이 비선형 고분자박막의 복소굴절율에 미치는 영향 및 배향효과의 정량화)

  • 길현옥;김상준;방현용;김상열
    • Korean Journal of Optics and Photonics
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    • v.10 no.3
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    • pp.181-187
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    • 1999
  • We prepared the side-chain type nonlinear optical NPP(N-(6-nitrophenyl)-(L)-prolinol) polymer films by spin coating method. Ellipsometric spectra were in situ collected by using spectroscopic phase modulated ellipsometer while the NPP polymer films were being corona poled at the temperature above glass transition. We calculated film thickness and the refractive index dispersion by modeling the spectro-ellipsometry data in transparent region. We also calculated the refractive index and the extinction coefficient of the polymer films by numerically inverting the spectro-ellipsometry data in absorbing region, while the previously determined film thickness was used. The independently determined extinction coefficient spectra from the analysis of transmission spectra were compared with those by spectro-ellipsometry and they showed an excellent agreement with each other. From the analysis of the complex refractive index change of the NPP polymer thin films induced by the corona poling, we could determine the vertical complex refractive index and the horizontal complex refractive index separately. Using the volume fraction of the vertical component f⊥, the degree of poling of poled NPP polymer films was quantitatively addressed. It is suggested that the present method can be used to quantitatively address the degree of poling in an absolute manner and to depth profile the poled fraction of thick polymer films. It will be useful to understand the structural change of polymer films and hence the poling mechanism during the poling process.

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Dispersion and Nonlinear Properties of Elliptical Air Hole Photonic Crystal Fiber

  • Rao, MP Srinivasa;Singh, Vivek
    • Current Optics and Photonics
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    • v.2 no.6
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    • pp.525-531
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    • 2018
  • The effect of eccentricity on dispersion and nonlinear properties of a photonic crystal fiber having elliptical air holes is investigated using a fully vectorial effective index method. It is found that the effective refractive index increases with increase of eccentricity. The dependence of dispersion and nonlinear properties of the PCF on the eccentricity of the air hole is investigated. It is revealed that eccentricity of the air hole affects the zero dispersion wavelength. Further, the nonlinear properties such as mode field area, nonlinear coefficient and self phase modulation of the Photonic crystal fibers are analyzed. The mode field area increases and the nonlinear coefficient decreases with increase in eccentricity. The variation of the self phase modulation with elliptical air hole is also discussed.

Measurement of the Nonlinear Optical Properties by use of the Far-Field Phase Modulation Method (Far-field 위상 변조량 측정법을 이용한 광학매질의 비선형 특성 측정)

  • 김성훈;양준목;김용평;이영우;신동주;정영붕
    • Korean Journal of Optics and Photonics
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    • v.9 no.3
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    • pp.168-174
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    • 1998
  • We have measured nonlinear refractive index and nonlinear absorption coefficient of optical materials by using a far-field phase modulation technique. The phase variation of the probe beam in the nonlinear material is transformed into the spatial phase modulation in the far-field so that the spatial distribution of the optical intensity in conjunction with the computer simulation analysis can give the nonlinear optical constants. We have obtained the nonlinear refractive indices and nonlinear absorption coefficient of $CS_2$ and $BaF_2$ by fitting the experimental values and numerical simulation analysis of far-field measurements. The nonlinear refractive indices of $CS_2$ and $BaF_2$were obtained as $1.2{\times}10^{-11}$ esu and $1.0{\times}10^{-13}$ esu, respectively at 616 nm, and the nonlinear absorption coefficient of BaF$_2$as $5.0{\times}10^{-11}$cm/W at 308nm. These measured values were in good agreement with previous reports.

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Analysis of ethanol concentration and refractive-index by use of surface plasmon resonance effect (표면 플라즈몬 공명에 의한 에탄올의 농도 및 굴절률 분석)

  • 도용화;이관수;송석호;손대원;이상선
    • Korean Journal of Optics and Photonics
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    • v.13 no.1
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    • pp.9-14
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    • 2002
  • A surface plasmon sensor has been fabricated for detection of concentration and refractive-index of a mixed solution. Based on the Kretschmann-Raether attenuated-total-reflection configuration, the sensor consists of 54 nm-thick Ag metal layer under a prism and a cell containing the mixed solution. We have observed a nonlinear refractive-index change as the ethanol-water concentration increased. The experimental results show us that the detection limit of the SPR sensor is 3$\times$10$^{-2}$ % in ethanol mass ratio. The concentration-to-index curve shows a linear increase in the range of ethanol concentration from 0% to 50%, but a nonlinearity is observed beyond 50%. We have modeled the nonlinearity and compared it with the experimental results.