• 제목/요약/키워드: n-type substrate

검색결과 500건 처리시간 0.032초

Cloning and Analysis of Medium-Chain-Length Poly(3-Hydroxyalkanoate) Depolymerase Gene of Pseudomonas luteola M13-4

  • Park, In-Jae;Rhee, Young-Ha;Cho, Nam-Young;Shin, Kwang-Soo
    • Journal of Microbiology and Biotechnology
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    • 제16권12호
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    • pp.1935-1939
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    • 2006
  • The gene encoding the extracellular medium-chain-length poly(3-hydroxyalkanoate) (MCL-PHA) depolymerase of Pseudomonas luteola Ml3-4, $phaZ_{plu}$, was cloned and analyzed. It was found to be 849 bp, with a deduced protein of 282 amino acids, and was revealed to have a typical leader peptide at its N terminus. The amino acid sequence of $PhaZ_{plu}$ revealed relatively low identity (69 to 72%) with those of other Pseudomonas MCL-PHA depolymerases. In comparison with the amino acid sequences of all available MCL-PHA depolymerases, the depolymerase was found to consist of three domains in sequential order; signal peptide, an N-terminal substrate binding domain, and a catalytic domain, indicating that $PhaZ_{plu}$ belongs to the type IV depolymerases family. The enzyme also contained Asn as an oxyanion hole amino acid.

ONO 구조의 nc-si NVM의 전기적 특성

  • 백경현;정성욱;장경수;유경열;안시현;이준신
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2011년도 제40회 동계학술대회 초록집
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    • pp.136-136
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    • 2011
  • 반도체 및 전자기기 산업에 있어서 NVM은 아주 중요한 부분을 차지하고 있다. NVM은 디스플레이 분야에 많은 기여를 하고 있는데, 측히 AMOLED에 적용이 가능하여 온도에 따라 변하는 구동 전류, 휘도, color balance에 따른 문제를 해결하는데 큰 역할을 한다. 본 연구에서는 bottom gate 구조의 nc-Si NVM 실험을 진행하였다. P-type silicon substrate (0.01~0.02 ${\Omega}-cm$) 위에 Blocking layer 층인 SiO2 (SiH4:N2O=6:30)를 12.5nm증착하였고, Charge trap layer 층인 SiNx (SiH4:NH3=6:4)를 20 nm 증착하였다. 마지막으로 Tunneling layer 층인 SiOxNy은 N2O (2.5 sccm) 플라즈마 처리를 통해 2.5 nm 증착하였다. 이러한 ONO 구조층 위에 nc-Si을 50 nm 증착후에 Source와 Drain 층을 Al 120 nm로 evaporator 이용하여 증착하였다. 제작한 샘플을 전기적 특성인 Threshold voltage, Subthreshold swing, Field effect mobility, ON/OFF current ratio, Programming & Erasing 특성, Charge retention 특성 등을 알아보았다.

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고속 광통신용 GaInAs/InP PIN 수광소자 모듈 제작

  • 박찬용;박경현;이창원;이용탁
    • ETRI Journal
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    • 제13권4호
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    • pp.52-57
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    • 1991
  • We fabricated very high. speed PIN Photodiode module for the application of high speed optical receiver. OMVPE was used for the growth of InP layer on InGaAs absorption layer. The structure was the combination of mesa and planartype. Fabrication procedure was more complicated than simple mesa or simple planar type structure because we used semiinsulating InP substrate in order to reduce stray capacitance. The results at-5V were as follows : dark current was less than 1nA, capacitance was 0.55pF, and cutoff frequency was above 3GHz, and rise and fall time was about 100ps.

저온 GaN의 성장 온도에 따른 에피택셜 GaN의 stress relaxation 효과 (Effect of low-temperature GaN grown at different temperature on residual stress of epitaxial GaN)

  • 이승훈;이주형;오누리;이성철;박형빈;신란희;박재화
    • 한국결정성장학회지
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    • 제32권3호
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    • pp.83-88
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    • 2022
  • 이종 기판과 GaN의 물성 차이로 인해 발생하는 결함을 제어하기 위한 다양한 방법 중 동종 물질을 완충층으로 사용하는 LT-GaN 방법을 사용하여 완충층과 성장 온도의 상관성을 자체 제작한 성장 장비를 통해 확인하고자 하였다. 성장 온도에 따라 표면에 형성된 LT-GaN 결정성에 변화가 있었으며, annealing 후 LT-GaN가 나타내는 결정성에 따라 epiGaN의 응력 완화 효과에 차이점이 있었다. 반면 LT-GaN의 높은 결정성은 다결정을 형성하는 원인으로 작용하여 그 위에 성장하는 epi-GaN의 결정질을 저해하는 결과를 유발하였다.

Effect of thermal annealing for $CuInSe_2$ layers obtained by photoluminescience measurement

  • Hong, Kwang-Joon;Kim, Hae-Jeong
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2009년도 하계학술대회 논문집
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    • pp.86-87
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    • 2009
  • High quality $CuInSe_2$ (CIS) were grown on GaAs substrate by using the hot wall epitaxy method. The behavior of point defects in the CIS layer investigated by using photoluminescence (PL) at 10 K. Point defects originating from $V_{Cu}$, $V_{Se}$, $Cu_{int}$, and $Se_{int}$ were classified as donor or acceptor types. These PL results also led us to confirm that the p-type CIS layer had obviously converted into n-type after the Cu atmosphere treatment. Finally, we found that the In in the CIS layer did not form the native defects, because In existed in the form of stable bonds in the CIS layer.

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Cloning and Characterization of TMPRSS6, a Novel Type 2 Transmembrane Serine Protease

  • Park, Tae Joo;Lee, Yong Jae;Kim, Hye Jin;Park, Hye Gyeong;Park, Woo Jin
    • Molecules and Cells
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    • 제19권2호
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    • pp.223-227
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    • 2005
  • We have identified TMPRSS6, a novel type 2 transmembrane serine protease. TMPRSS6 possesses all the signature motifs of the family of transmembrane serine proteases (TMPRSSs), including a transmembrane domain, an LDL receptor class A (LDLRA) domain, a scavenger receptor cysteine-rich (SRCR) domain, and a serine protease domain. The substrate specificity of TMPRSS6 is slightly different from those of other TMPRSS family members. Combined with the finding that TMPRSS6 is expressed strongly in the thyroid and weakly in the trachea, this may indicate that TMPRSS6 has a specialized role.

얇은막 산화철 광반도성 전극의 제조와 그 특성 (PREPARATION AND CHARACTERIZATION ON THIN FILMS OF DOPED IRON OXIDE PHOTOSEMICONDUCTIVE ELECTRODES.)

  • 김일광;김윤근;박태영;박춘배
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 1993년도 춘계학술대회 논문집
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    • pp.104-108
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    • 1993
  • Thin films of MgO-doped and CaO-doped iron oxide were prepared y spray pyrolysis. The films were characterized b X-ray diffraction, scanning electron microscopy and voltammetric techniques. The photoelectrochemical behavior of thin film electrodes depended greatly on the doping level, sintering temperature, substrate temperature and added photosensitizing compounds in solution, showed p-type photoelectrochemical behavior, while the CaO-doped iron oxide thin films prepared at low temperature showed n-type photoelectrochemical behavior. This characteristic change was interpreted in terms of the surface structure change of the thin films and doping effect of metal oxide.

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Doping-free Transparent Conducting Schottky Type Heterojunction Solar Cells

  • Kim, Joon-Dong
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2012년도 제42회 동계 정기 학술대회 초록집
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    • pp.209-209
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    • 2012
  • High-efficient transparent conductive oxide (TCO) film-embedding Si heterojunction solar cells were fabricated. An additional doping was not applied for heterojunction solar cells due to the spontaneous junction formation between TCO films and an n-type Si substrate. Three different TCO coatings were formed by sputtering method for an Al-doped ZnO (AZO) film, an indium-tin-oxide (ITO) film and double stacks of ITO/AZO films. An improved crystalline ITO film was grown on an AZO template upon hetero-epitaxial growth. This double TCO films-embedding Si heterojunction solar cell provided significantly enhanced efficiency of 9.23% as compared to the single TCO/Si devices. The effective arrangement of TCO films (ITO/AZO) provides benefits of a lower front contact resistance and a smaller band offset to Si leading enhanced photovoltaic performances. This demonstrates a potential scheme of the effective TCO film-embedding heterojunction Si solar cells.

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재산화된 질화 산화막을 게이트 절연막으로 사용한 MOSFET의 특성 (The Characteristics of MOSFET with Reoxidized Nitrided Oxide Gate Dielectrics)

  • 양광선;박훈수;김봉렬
    • 전자공학회논문지A
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    • 제28A권9호
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    • pp.736-742
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    • 1991
  • N$^{+}$poly gate NMOSFETs and p$^{+}$ poly gate (surface type) PMOSFETs with three different gate oxides(SiO2, NO, and ONO) were fabricated. The rapid thermal nitridation and reoxidation techniques have been applied to gate oxide formation. The current drivability of the ONO NMOSFET shows larger values than that of the SiO2 NMOSFET. The snap-back occurs at a lower drain voltage for SiO$_2$ cases for ONO NMOSFET. Under the maximum substrate current bias conditions, hot-carrier effects inducting threshold voltage shift and transconductance degradation were investigated. The results indicate that ONO films exhibit less degradation in terms of threshold voltage shift. It was confirmed that the ONO samples achieve good improvement of hot-carrier immunity. In a SiO$_2$ SC-PMOSFET, with significant boron penetration, it becomes a depletion type (normally-on). But ONO films show excellent impurity barrier properties to boron penetration from the gate.

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LSMCD 장비를 이용 Boron 도핑 ZnO 박막제조 및 특성평가 (New Transparent Conducting B-doped ZnO Films by Liquid Source Misted Chemical Deposition Method)

  • 김길호;우성일;방정식
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2008년도 하계학술대회 논문집 Vol.9
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    • pp.307-308
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    • 2008
  • Zinc oxide is a direct band gap wurtzite-type semiconductor with band gap energy of 3.37eV at room temperature. the n-type doped ZnO oxides, B doped ZnO (BZO) is widely studied in TCOs materials as it shows good electrical, optical, and luminescent properties. we focused on the fabrication of B doped ZnO films with glass substrate using the LSMCD at low temperature. And Novel boron-doped ZnO thin films were deposited and characterized from the structural, optical, electrical point of view. The structure, morphology, and optical properties of the films were studied as a function of by employing the XRD, SEM, Hall system and micro Raman system.

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