• Communications for Statistical Applications and Methods
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• v.28 no.6
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• pp.595-610
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• 2021

Recently a few articles have derived robust first-order rotatable and D-optimal designs for the lifetime response having distributions gamma, lognormal, Weibull, exponential assuming errors that are correlated with different correlation structures such as autocorrelated, intra-class, inter-class, tri-diagonal, compound symmetry. Practically, a first-order model is an adequate approximation to the true surface in a small region of the explanatory variables. A second-order model is always appropriate for an unknown region, or if there is any curvature in the system. The current article aims to extend the ideas of these articles for second-order models. Invariant (free of the above four distributions) robust (free of correlation parameter values) second-order rotatable designs have been derived for the intra-class and inter-class correlated error structures. Second-order rotatability conditions have been derived herein assuming the response follows non-normal distribution (any one of the above four distributions) and errors have a general correlated error structure. These conditions are further simplified under intra-class and inter-class correlated error structures, and second-order rotatable designs are developed under these two structures for the response having anyone of the above four distributions. It is derived herein that robust second-order rotatable designs depend on the respective error variance covariance structure but they are independent of the correlation parameter values, as well as the considered four response lifetime distributions.

• Communications for Statistical Applications and Methods
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• v.24 no.2
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• pp.129-142
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• 2017

In this paper we consider the problem of the model selection/discrimination among three different positively skewed lifetime distributions. Lindley, Weibull, and gamma distributions have been used to effectively analyze positively skewed lifetime data. This paper assesses how much closer the Lindley distribution gets to Weibull and gamma distributions. We consider three techniques that involve the likelihood ratio test, asymptotic likelihood ratio test, and minimum Kolmogorov distance as optimality criteria to diagnose the appropriate fitting model among the three distributions for a given data set. Monte Carlo simulation study is performed for computing the probability of correct selection based on the considered optimality criteria among these families of distributions for various choices of sample sizes and shape parameters. It is observed that overall, the Lindley distribution is closer to Weibull distribution in the sense of likelihood ratio and Kolmogorov criteria. A real data set is presented and analyzed for illustrative purposes.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.30 no.9
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• pp.551-557
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• 2017

It is extremely important to improve methodologies for the lifetime assessment of porcelain insulators. While there has been a considerable amount of work regarding the phenomena of lifetime distributions, most of the studies assume that aging distributions follow the Weibull distribution. However, the true underlying distribution is unknown, giving rise to unrealistic inferences, such as parameter estimations. In this article, we review several distributions that are commonly used in reliability and survival analysis, such as the exponential, Weibull, log-normal, and gamma distributions. Some properties, including the characteristics of failure rates of these distributions, are presented. We use a Bayesian approach for model selection and parameter estimation procedures. A well-known measure, called the Bayes factor, is used to find the most plausible model among several contending models. The posterior mean can be used as a parameter estimate for unknown parameters, once a model with the highest posterior probability is selected. Extensive simulation studies are performed to demonstrate our methodologies.

• Journal of applied mathematics & informatics
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• v.37 no.1_2
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• pp.105-121
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• 2019

One of the main objective of manufacturing industries is to assess the capability performance of different processes. In this paper, we use the lifetime performance index $C_L$ as a criterion to measure larger-the-better type quality characteristic for evaluating the product performance. The lifetimes of products are assumed to follow a general class of inverted exponentiated distributions. We use maximum likelihood estimator to estimate the lifetime performance index under the assumption that data are progressive type I interval censored. We also obtain asymptotic distribution of this estimator. Based on this estimator, a new hypothesis testing procedure is developed with respect to a given lower specification limit. Finally, two numerical examples are discussed in support of the proposed testing procedure.

• Communications for Statistical Applications and Methods
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• v.23 no.5
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• pp.363-383
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• 2016

The Weibull family of lifetime distributions play a fundamental role in reliability engineering and life testing problems. This paper investigates the potential usefulness of transmuted new generalized Weibull (TNGW) distribution for modeling lifetime data. This distribution is an important competitive model that contains twenty-three lifetime distributions as special cases. We can obtain the TNGW distribution using the quadratic rank transmutation map (QRTM) technique. We derive the analytical shapes of the density and hazard functions for graphical illustrations. In addition, we explore some mathematical properties of the TNGW model including expressions for the quantile function, moments, entropies, mean deviation, Bonferroni and Lorenz curves and the moments of order statistics. The method of maximum likelihood is used to estimate the model parameters. Finally the applicability of the TNGW model is presented using nicotine in cigarettes data for illustration.

• Communications of the Korean Mathematical Society
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• v.34 no.4
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• pp.1335-1352
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• 2019

In this article, a new family of lifetime distributions by adding two additional parameters is introduced. The new family is called, the logarithmic Kumaraswamy family of distributions. For the proposed family, explicit expressions for some mathematical properties are derived. Maximum likelihood estimates of the model parameters are also obtained. This method is applied to develop a new lifetime model, called the logarithmic Kumaraswamy Weibull distribution. The proposed model is very flexible and capable of modeling data with increasing, decreasing, unimodal or modified unimodal shaped hazard rates. To access the behavior of the model parameters, a simulation study has been carried out. Finally, the potentiality of the new method is proved via analyzing two real data sets.

• Journal of the Korean Operations Research and Management Science Society
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• v.22 no.1
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• pp.87-99
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• 1997

This paper considers warranty servicing for repairable products when product lifetimes are phase-type(PH) distributions. Two replace-repair strategies are analyzed based on renwal processes. The quantities of interest can be expressed in terms of the renewal function which, in general, is very difficult to evaluate. By exploiting properties of PH distributions we obtain simplification to evaluate these performance measures. Numerical examples for four different PH distributions with typical functions are presented and the results are discussed.

• Proceedings of the Korean Operations and Management Science Society Conference
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• 1995.04a
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• pp.677-677
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• 1995

• Proceedings of the Korean Operations and Management Science Society Conference
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• 1996.04a
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• pp.260-260
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• 1996

• Journal of Applied Reliability
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• v.14 no.3
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• pp.182-190
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• 2014

This paper presents new practical accelerated life test plans with different censoring times at three levels of stress for Weibull and lognormal lifetime distributions, respectively. The proposed plans are compared with the corresponding two-level statistically optimal plans and three-level compromise and practical plans. Computational results indicate that new practical plans have been more precise and effective than the existing three-level plans under a constraint of total testing time. In addition, a procedure to determine useful ALT plans is illustrated with a numerical example.