• The Journal of Korean Institute of Communications and Information Sciences
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• v.19 no.6
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• pp.1038-1045
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• 1994

In this paper, algorithm and built-in test circuit for testing all PSF(Pattern Sensitive Fault) occuring in CAM(Content Addressable Memory) are proposed. That is, built-in test circuit that uses minimum additional circuit without external equipment is designed. Additional circuit consist`s of parallel comparator, error detector, and modified decoder for parallel testing. Besides, the study on eulerian path for effectiv test pattern is carried out simultaneously. Consequently, using proposed algorithm, we can test all contents of CAM with 325+2b(b:number of bits) operations regardless of number of words. The area occupied by test circuit is about 7.5% of total circuit area.

• The Transactions of the Korea Information Processing Society
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• v.1 no.2
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• pp.272-278
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• 1994

The paper proposes a test pattern generator and a signature analyzer for pseudoexhaustive testing of the combinational circuit part within a sequential circuit when performing built-in self test of the circuit. The test pattern generator can scan in the seed test pattern and generate exhaustive test patterns. The signature analyzer can perform the analysis of the circuit response and scan out the result. Such test pattern generator and signature analyzer have been developed using SRL(shift register latch) and LFSR(linear feedback shift register).

• The Transactions of the Korean Institute of Electrical Engineers D
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• v.52 no.12
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• pp.671-678
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• 2003

This paper proposes an expert system to generate automatically the test table of test system which can highly enhance the quality and productivity of product by inspecting quickly and accurately the defect device on the electronic circuit board tested. The expert system identifies accurately the tested components and the circuit patterns by tracing automatically the connectivity of circuit from electronic circuit database. And it generates automatically the test table to detect accurately the missing components, the misplaced components, and the wrong components for analog components such as resistance, coil, condenser, diode, and transistor, based on the experience knowledge of veteran expert. It is implemented in C computer language for the purpose of the implementation of the inference engine using the dynamic memory allocation technique, the interface with the electronic circuit database and the hardware direct control. And, the validity of the builded expert system is proved by simulating for a typical electronic board model.

• Proceedings of the KIEE Conference
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• 2000.07c
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• pp.1856-1858
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• 2000

This paper describes the principles of reignition system which has newly been developed and used as KERI's high power testing facilities. Synthetic short-circuit testing method is generally adopted to perform the short-circuit test of the ultra high-voltage circuit breakers, which consists of two separated sources such as the current source from short-circuit generator and the voltage source from charged energy in capacitor. And, in case of synthetic short-circuit test, it will be necessary to use the reignition system in order to extending the arcing time of the circuit breaker and provide the arc energy equivalent to the direct testing method.

• 한국정보디스플레이학회:학술대회논문집
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• 2008.10a
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• pp.914-917
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• 2008

A quad-functional built-in test circuit has been developed for DRAM-frame-memory embedded SOG-LCDs. The quad function consists of memory test, display test, serial transfer test, and parallel transfer test which is the normal operation mode for our SOG-LCD. Results of memory and display tests are shown.

• Journal of Electrical Engineering and Technology
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• v.9 no.4
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• pp.1332-1342
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• 2014

This paper proposes a novel test circuit for SiC transistors. On-state resistance under practical application conditions is an important characteristic for the device reliability and conduction efficiency of SiC transistors. In order to measure the on-state resistance in practical applications, high voltage is needed, and high current is also necessary to ignite performance for the devices. A soft-switching circuit based on synchronous buck topology is developed in this paper. To provide high-voltage and high-current stresses for the devices without additional spikes and oscillations, a resonant circuit has been introduced. Using the novel circuit technology, soft-switching can be successfully realized for all the switches. Furthermore, in order to achieve accurate measurement of on-state resistance under switching operations, an active clamp circuit is employed. Operation principle and design analysis of the circuit are discussed. The dynamic measurement method is illustrated in detail. Simulation and experiments were carried out to verify the feasibility of the circuit. A special test circuit has been developed and built. Experimental results confirm that the proposed circuit gives a good insight of the devices performance in real applications.

• The Transactions of the Korean Institute of Electrical Engineers A
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• v.54 no.6
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• pp.284-292
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• 2005

Because all of the short-circuit testing laboratories have the limitation of test facilities, the synthetic making test methods have been used to estimate the short-circuit making performance of the ultra high-voltage circuit breaker as the alternative to direct test methods. So, KERI(Korea Eelctrotechnology Research institute) has completed the construction of the synthetic making test facilities using the low capacity step-up transformer method which fulfill the requirements specified in newly revised IEC 62271-100 Edition 1.1(2003) and have the testing capability up to 550kV, 63kA full-pole circuit breaker. The test facilities using the low capacity step-up transformer method presented in this paper are made up of the unit equipments such as HCS(High-speed Closing Switch), ITMC(Initial Transient Making Current) circuit and UP TR(low capacity step-up transformer) and have the operating range of 17.6$^{\circ}$ $\~$ 145.1$^{\circ}$ for testing the circuit breaker rated on up to 50kA and 43.1$^{\circ}$ $\~$ 119.6$^{\circ}$ for more than 50kA.

• Journal of the Korean Institute of Telematics and Electronics
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• v.24 no.3
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• pp.535-540
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• 1987

This paper proposes a circuit partitioning method and a multifunctional BILBO which can perform the multimodule test in the case of testing VLSI circuits. By using these circuit partitioning method and multifunctional BILBO, test time and cost can be reduced greatly by performing the pipeline test method. And the quantity of circuit that shold be added for testing is also reduced in half by interposing only one BILBO between each module. Also, we confirmed that the multifunctional BILBO proposed here has high error detection capability by analyzing error detection capability of this multifunctional BILBO in mathematics.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2006.06a
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• pp.501-502
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• 2006

In this paper, new and aging sample of MCCB and ELCB are investigated the main performance test such as short circuit test, mechanical and electrical endurance test, dielectric test and surge current test. The surface conditions of new and aging sample are analyzed by SEM, TGA and DSC. The ELCB occurred badness mainly in short circuit test and surge current test. The badness cause of short circuit test was confirmed due to imperfect contact of contact part.

• Proceedings of the KIEE Conference
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• 2003.07a
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• pp.357-359
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• 2003

This paper is for the transient analysis of instant short-circuit test equipment according to the test of tripping limits and characteristics under IEC 60947-2. The in-rush current is harmful to almost equipments and the exact testing is not made because of it. LGIS has a instant short-circuit test equipment, but it is not suitable for carrying out instant short-circuit test on ELB(Earth Leakage Circuit breaker) by reason of that. Now, I am going to show a solution for that problem. After applying this method, manufacturer is going to acquire the exact testing result according to the IEC standard. Moreover, Testing laboratory will be trusted by clients.