• 제목/요약/키워드: film crystallinity

검색결과 643건 처리시간 0.032초

$(Sr_{1-x}Ca_x)TiO_3$세라믹 박막의 미세구조 및 특성 (Microstructure and Properties of $(Sr_{1-x}Ca_x)TiO_3$Ceramic Thin film)

  • 김진사;이준웅
    • 대한전기학회논문지:전기물성ㆍ응용부문C
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    • 제50권10호
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    • pp.504-508
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    • 2001
  • The$(Sr_{1-x}Ca_x)TiO_3$(SCT) thin films are deposited on Pt-coated electrode $(Pt-TiN /SiO_2Si)$ using RF sputtering method at various deposition temperature. The crystallinity of thin films was increased with increased of deposition temperature n the temperature range of 200~500 $[^{\circ}C]$. The capacitance changes almost linearly in temperature ranges of -80~+90$[^{\circ}C]$. All SCT thin films used in the study the phenomena of dielectric relaxation with the increase of frequency, and the relaxation frequency is observed above 200[kHz]. V-I characteristics of SCT thin films show the increasing leakage current with the increases of deposition temperature.

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텅스텐을 첨가한 $V_{2-x}W_xO_5$ 박막의 전기적 특성 (Electrical properties of $V_{2-x}W_xO_5$ thin film doped Tungsten contents)

  • 남성필;노현지;이성갑;배선기;이영희
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 2009년도 제40회 하계학술대회
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    • pp.1322_1323
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    • 2009
  • The $V_{1.85}W_{0.15}O_5$ thin films deposited on Pt/Ti/$SiO_2$/Si substrates by RF sputtering method exhibited fairly good TCR and dielectric properties. It was found that film crystallinity, dielectric properties, and TCR properties were strongly dependent upon the annealing temperature. The dielectric constants of the $V_{1.85}W_{0.15}O_5$ thin films annealed at $400^{\circ}C$ were 38.11, with a dielectric loss of 1%, respectively. Also, the TCR values of the $V_{1.85}W_{0.15}O_5$ thin films annealed at $400^{\circ}C$ were about -3.45%/K.

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A STUDY ON PIEZOELECTRIC PROPERTIES OF PVDF AND ITS COPOLYMERS

  • Ansari, Mohd.Zahid;Cho, Chong-Du
    • 대한기계학회:학술대회논문집
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    • 대한기계학회 2007년도 춘계학술대회A
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    • pp.584-589
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    • 2007
  • Polyvinylidene fluoride (PVDF) is a type of electroactive polymer which shows significant shape change when exposed to electric field. PVDF is generally used as a film sensor in non-destructive evaluation (NDE) of materials. In this study, however, its properties relevant to film actuator are considered. Since most of the electromechanical applications that use PVDF and its copolymers as actuators use their piezoelectric properties, only the piezoelectric properties of PVDF are discussed here. These properties depend mainly on the degree of crystallinity of PVDF. Available data from recent research publications are used to simulate the response of a PVDF bimorph beam on the application of electric field, by a commercial finite element analysis package ANSYS. Finally, the factors that affect mechanical behavior of PVDF bimorph beam are discussed.

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Acoustic Performance Enhancement in PVDF Speakers by Using Buckled Nanospring Carbon Nanotubes

  • Ham, Sora;Lee, Yun Jae;Kim, Jung-Hyuk;Kim, Sung-Ryong;Choi, Won Kook
    • 센서학회지
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    • 제28권6호
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    • pp.360-365
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    • 2019
  • A polyvinylidene fluoride (PVDF)-based film speaker is successfully fabricated with enhanced bass sound by incorporating buckled nanospring carbon nanotubes (NS-CNTs) as fillers. Various concentrations up to 1-7 wt% of uniformly dispersed buckled NS-CNTs are loaded to increase the beta (β)-phase fraction, crystallinity, and dielectric constant of the speaker, and this results in the bass part enhancement of about 19 dB full scale (dBFS) at 7 wt% filler loading of the piezoelectric film speaker.

화학적기상증착법에 의한 구리박막의 전기전도도 개선에 관한 연구 (A Study on the Enhancement of Electrical Conductivity of Copper Thin Films Prepared by CVD Technology)

  • 조남인;김용석;김창교
    • 한국전기전자재료학회논문지
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    • 제13권6호
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    • pp.459-466
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    • 2000
  • For the applications in the ultra-large-scale-integration (ULSI) metallization processing copper thin films have been prepared by metal organic chemical vapor deposition (MOCVD) technology on TiN/Si substrates. The films have been deposited with varying the experimental conditions of substrate temperatures and copper source vapor pressures. The films were then annealed in a vacuum condition after the deposition and the annealing effect to the electrical conductivity of the films was measured. The grain size and the crystallinity of the films were observed to be increased by the post annealing and the electrical conductivity was also increased. The best electrical property of the copper film was obtained by in-situ annealing treatment at above 40$0^{\circ}C$ for the sample prepared at 18$0^{\circ}C$ of the substrate temperature.

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ICP 방법으로 증착한 SiC 박막의 성장 및 특성 고찰 (Characteristics of SiC thin films deposited by ICP-CVD)

  • 김동진;길태현;황성수;김용상
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 1998년도 추계학술대회 논문집 학회본부 C
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    • pp.850-852
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    • 1998
  • SiC thin film have been prepared by ICP-CVD for low temperature deposition and large area deposition. The structural properties of deposited SiC films are characterized by employing SEM, FT-IR, XRD, XPS and Raman Spectroscopy. From the experimetal results, good crystallinity has been achieved in $1000^{\circ}C$ grown SiC film which have carbonization step at $1100^{\circ}C$ for substrate bias of 30V.

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Co-sputtering of Microcrystalline SiGe Thin Films for Optoelectronic Devices

  • 김선조;김형준;김도영
    • 한국재료학회:학술대회논문집
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    • 한국재료학회 2011년도 춘계학술발표대회
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    • pp.64.2-64.2
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    • 2011
  • Recently, Silicon Germanium (SiGe) alloys have been received considerable attention for their great potentials in advanced electronic and optoelectronic devices. Especially, microcrystalline SiGe is a good channel material for thin film transistor due to its advantages such as narrow and variable band gap and process compatibility with Si based integrated circuits. In this work, microcrystalline silicon-germanium films (${\mu}c$-SiGe) were deposited by DC/RF magnetron co-sputtering method using Si and Ge target on Corning glass substrates. The film composition was controlled by changing DC and RF powers applied to each target. The substrate temperatures were changed from $100^{\circ}C$ to $450^{\circ}C$. The microstructure of the thin films was analyzed by x-ray diffraction (XRD) and Raman spectroscopy. The analysis results showed that the crystallinity of the films enhances with increasing Ge mole fraction. Also, crystallization temperature was reduced to $300^{\circ}C$ with $H_2$ dilution. Hall measurements indicated that the electrical properties were improved by Ge alloying.

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Effect of Structural and Morphological Changes on the Conductivity of Stretched PANI-DBSA/HIPS Film

  • Lee, Jong-Hyeok;Kim, Eun-Ok
    • Bulletin of the Korean Chemical Society
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    • 제32권8호
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    • pp.2661-2665
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    • 2011
  • We studied the effect of structural and morphological changes on the conductivity of a stretched conducting polymer film. To improve the poor processability of polyaniline, we used dodecylbenzenesulfonic acid as both a surfactant and a dopant during emulsion polymerization, followed by blending with high-impact polystyrene. UV-Vis/NIR spectra were obtained to observe conformational changes, and SEM and AFM were used to investigate morphological changes. FT-IR dichroism was applied to determine the microscopic orientation, and XRD patterns were obtained for quantitative crystallinity analysis. The electrical conductivity (${\sigma}_{\parallel}/{\sigma}_{\perp}$) was measured as a function of draw ratio. We found a clear correlation between morphological changes and (${\sigma}_{\parallel}/{\sigma}_{\perp}$), especially at the stretching limit. The conductivity of the films can be modified according to the desired application by controlling their structure and morphology.

Effective Annealing and Crystallization of Si Film for Advanced TFT System

  • Noguchi, Takashi
    • Journal of Information Display
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    • 제11권1호
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    • pp.12-16
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    • 2010
  • The effect of the crystallization and activated annealing of Si films using an excimer laser and the new CW blue laser are described and compared with furnace annealing for application in advanced TFTs and for future applications. Pulsed excimer laser annealing (ELA) is currently being used extensively as a low-temperature poly-silicon (LTPS) process on glass substrates as its efficiency is high in the ultra-violet (UV) region for thin Si films with thickness of 40-60 nm. ELA enables extremely low resistivity relating to high crystallinity for both the n- and p-type Si films. On the other hand, CW blue laser diode annealing (BLDA) enables the smooth Si surface to have arbitral crystal grains from micro-grains to an anisotropic huge grain structure only by controlling its power density. Both annealing techniques are expected to be applied in the future advanced TFT systems.

Development of the Printed Top Gate Organic Thin Film Transistor (OTFT)

  • Kang, H.S.;Kang, H.C.;Lee, M.H.;Park, S.Y.;Kim, M.J.;Heo, J.S.;Kim, D.W.;Noh, Y.H.;Lee, S.;Kim, J.Y.;Kim, C.D.;Kang, I.B.
    • 한국정보디스플레이학회:학술대회논문집
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    • 한국정보디스플레이학회 2008년도 International Meeting on Information Display
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    • pp.113-116
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    • 2008
  • The active layer thickness and curing condition dependent performance of an organic thin film transistor (OTFT) with inkjetted organic semiconductor (OSC) layer is studied The best performance of the OTFT was found when the thickness of ose was ~120 nm cured at $60^{\circ}C$. The performance enhancement of the OTFT with inkjetted OSC layer was discussed by comparing the OTFT with spin-coated ose layer.

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