• Proceedings of the KSME Conference
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• 2007.05a
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• pp.1749-1753
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• 2007

The reliability, that is Long-Term Quality, require an approaching different from Short-Term Quality which is used before. As the electronic components are able to be easily normalized on the reliability testing, various testing standards are used. In this study, we proposed two reliability simulator that is PoF(Physics of Failure)-based and failure rate models-based. PoF-based simulator is introduced based on CalceEP program that is created by University of Maryland. This simulator can be modified by user interface of properties and PoF models and operated on stand alone system. Failure rate models-based simulator introduced according to analyzing reliability prediction documents. Also, unified database including failure data models is built from existing MIL-HDBK-217F N2, PRISM, and Bellcore, and web-based simulator is developed. The developed reliability simulator will service of the PoF model, properties, failure rate model accumulated and its data by web and internet.

• International Journal of Reliability and Applications
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• v.9 no.2
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• pp.125-140
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• 2008

The new better than used failure rate (NBUFR), Abouammoh and Ahmed (1988), and new better than average failure rate (NBAFR) Loh (1984) classes of life distributions, have been considered in the literature as natural weakenings of NBU (NWU) property. The paper considers testing exponentiality against strictly NBUFR (NBAFR) alternatives, or their duals, based on goodness of fit approach that is possible in life testing problems and that it results in simpler procedures that are asymptotically equivalent or better than standard ones. They may also have superior finite sample behavior. The asymptotic normality are proved. Powers, Pitman asymptotic efficiency and critical points are computed. Dealing with censored data case also studied. Practical applications of our tests in the medical sciences are present.

• Journal of Korean Society for Quality Management
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• v.22 no.3
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• pp.119-123
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• 1994

A frequently recurring question posed by researchers concerns a test of a constant failure rate against the alternative of a failure rate involving a single chang-point. Park (1988) has presented a new test procedure for testing constant failure rate against a bathtub shaped (upside-down bathtub shaped) failure rate. assuming that the proportion of population that fails at or before the change point of failure rate is known. Jeong (1992) has extended Park's test to randomly censored data under the same assumption. In this paper, we have investigated efficiency loss to the presence of censoring.

• Journal of Applied Reliability
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• v.16 no.4
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• pp.331-337
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• 2016

Purpose: The purpose of this study is the analysis of the failure mechanisms effect of circuit design characteristics of the ballast for LED Lamp Methods: Recently, electronic circuit of ballasts for LED lamp are being occurred on various failure mechanisms (whiskers, ion migration, heat dissipation problem, switching element damage) because electronic ballast circuit design characteristics are becoming more and more diverse. Results: we analysis failure mechanisms that occurs in accordance with the circuit design characteristics The ballast for LED lamp were divided into three different types (Type A, Type B, Type C) considering circuit design characteristics (thermal design, PCB patten spacing, element material) and it was experimented in the acceleration test conditions ($85^{\circ}C$, 85% R.H). Conclusion: We confirmed that failure mechanism of the ballast for LED Lamp had occurred differently in accordance with the circuit design characteristics.

• Nuclear Engineering and Technology
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• v.31 no.1
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• pp.49-57
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• 1999

It has been a critical issue to predict the safety critical software reliability in nuclear engineering area. For many years, many researches have focused on the quantification of software reliability and there have been many models developed to quantify software reliability. Most software reliability models estimate the reliability with the failure data collected during the test assuming that the test environments well represent the operation profile. User's interest is however on the operational reliability rather than on the test reliability. The experiences show that the operational reliability is higher than the test reliability. With the assumption that the difference in reliability results from the change of environment, from testing to operation, testing environment factors comprising the aging factor and the coverage factor are developed in this paper and used to predict the ultimate operational reliability with the failure data in testing phase. It is by incorporating test environments applied beyond the operational profile into testing environment factors. The application results show that the proposed method can estimate the operational reliability accurately.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.17 no.8
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• pp.62-68
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• 2016

The feeder cable assembly is an automotive part used for telecommunication. If it malfunctions, the control and safety of the automobile can be put at risk. ALT (Accelerated Life Testing) is a testing process for products in which they are subjected to conditions (stress, strain, temperatures, etc.) in excess of their normal service parameters in an attempt to uncover faults and potential modes of failure in a short amount of time. Failure is caused by defects in the design, process, quality, or application of the part, and these defects are the underlying causes of failure or which initiate a process leading to failure. Thermal shock occurs when a thermal gradient causes different parts of an object to expand by different amounts. Thermal shock testing is performed to determine the ability of parts and components to withstand sudden changes in temperature. In this research, the main causes of failure of the feeder cable assembly were snapping, shorting and electro-pressure resistance failure. Using the Coffin-Manson model for ALT, the normal conditions were from Tmax = $80^{\circ}C$ to Tmin = $-40^{\circ}C$, the accelerated testing conditions were from Tmax = $120^{\circ}C$ to Tmin = $-60^{\circ}C$, the AF (Acceleration Factor) was 2.25 and the testing time was reduced from 1,000 cycles to 444 cycles. Using the Bxlife test, the number of samples was 5, the required life was B0.04%.10years, in the acceleration condition, 747 cycles were obtained. After the thermal shock test under different conditions, the feeder cable assembly was examined by a network analyzer and compared with the Weibull distribution modulus parameter. The results obtained showed good results in acceleration life test mode. For the same reliability rate, the testing time was decreased by a quarter using ALT.

• Journal of Advanced Engineering and Technology
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• v.11 no.4
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• pp.259-265
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• 2018

In this paper, we propose a test method to evaluate the reliability of the recliner sofa in the early stage of production. In order to develop the test method, we analyzed the failure mechanism occurring in the field and designed the performance test, environmental test, accelerated life test methods based on the analysis of failure mechanism. The failure mechanism is reproduced by applying the designed test. The reliability of the recliner sofa can be verified at the production stage through the proposed test method.

• Journal of Applied Reliability
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• v.12 no.3
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• pp.177-186
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• 2012

This paper presents a comparison of the failure mechanism for high power converted white LEDs(3W) with the commercially available YAG:Ce and silicate phosphor. We carry out the normal aging life test for 10,000 hours, the high temperature aging test for 8,000 hours, the high temperature and humidity aging test for 8,000 hours and the current aging testing for 5,000 hours. The optical and electrical parameters of LEDs were monitored, such as lumen, correlated color temperature (CCT), chromaticity coordinates(x, y), thermal resistance, I -V curve and spectrum intensity. The stress induced a luminous flux decay on LED in all experiments and causes a failure. So we try to find out what's a main failure mechanism for a high power LED.

• Journal of Welding and Joining
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• v.11 no.1
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• pp.21-32
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• 1993

A cracking failure of a austenitic stainless steel elbow in a naphtha cracking line in a petrochenmical plant occurred, resulting in leakage of organic compound flowing inside the elbow. Due to the failure, emergency shutdown of the plant was enforced to repair the troubled part of the line. The repair cost as well as production loss during the unscheduled plant shutdown has cost the company a great amount of financial loss. In this studies, a failure analysis of the cracked elbow was performed using NDT, chemical analysis, microstructural analysis including optical microscopy as well as scanning electron microscopy with EPMA, mechanical testings such as tensile testing, hardness testing and Charphy impact test fractography. The results indicated that several problems such as a welding defect and presence of a detrimental phase which was found to be relate to improper postforming heat treatment process was identified and the failure was concluded to be due to a low temperature embrittlement of the defect-containing elbows.

• Journal of Advanced Navigation Technology
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• v.14 no.1
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• pp.119-126
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• 2010

The software reliability growth model(SRGM) has been developed in order to estimate such reliability measures as remaining fault number, failure rate and reliability for the developing stage software. Almost of them assumed that the faults detected during testing were eventually removed. Namely, they have studied SRGM based on the assumption that the faults detected during testing were perfectly removed. The fault removing efficiency, however, is imperfect and it is widely known as so in general. It is very difficult to remove detected fault perfectly because the fault detecting is not easy and new error may be introduced during debugging and correcting. Therefore, We want to study imperfect software testing effort for the logistic testing effort which is thought to be the most adequate in this paper.