• Title/Summary/Keyword: excimer laser annealing

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The effect of annealing method on dopant-activation and damage-recovery in ion-shower-doped Poly-Si using $PH_3/H_2$

  • Kim, Dong-Min;Kim, Dae-Sup;Ro, Jae-Sang;Choi, Kyu-Hwan;Lee, Ki-Yong
    • 한국정보디스플레이학회:학술대회논문집
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    • 2004.08a
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    • pp.1072-1075
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    • 2004
  • Ion shower doping using a source gas of $PH_3/H_2$ was conducted on excimer-laser-annealed (ELA) Poly-Si. As-implanted damage is accumulated more and more with the increase of an acceleration voltage and a doping time. In this study we found that dopant-activation is relatively a rapid kinetic-process while damage-recovery is not.

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Inverse Sta99ered Poly-Si TFT with a-Si Offset formed by Selective Excimer Laser Annealing (선택적 레이저 어닐링을 이용하여 비정질 실리콘 오프셋을 갖는 Inverse Staggered 다결정 실리콘 박막 트랜지스터)

  • Park, Kee-Chan;Choi, Kwon-Young;Kim, Cheon-Hong;Han, Min-Koo
    • Proceedings of the KIEE Conference
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    • 1997.07d
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    • pp.1633-1635
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    • 1997
  • For AMLCD pixel switching device, poly-Si TFT has the advantage of high field effect mobility over a-Si TFT. However, it also has some disadvantage such as large leakage current and more masking steps. We propose a new Inverse Staggered poly-Si TFT with a-Si offset. We have fabricated the new device and verified high ON/OFF current ratio. The device has lower leakage current level than the conventional Inverse Staggered poly-Si TFT and the same number of masking steps compared with conventional a-Si TFT's.

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Effective ELA for Advanced Si TFT System on Insulator

  • Noguchi, Takashi
    • 한국정보디스플레이학회:학술대회논문집
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    • 2006.08a
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    • pp.45-48
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    • 2006
  • Effectiveness and its possibility of ELA (Excimer Laser Annealing) for advanced Si TFT system on insulator are described. Currently, extensive study is carried out to realize an advanced SoG (System on Glass) based on LTPS (Low Temperature Poly-Si) technique. By reducing further the process temperature and by improving the fabrication process of LTPS, addressing TFT circuits for FPD (Flat Panel Display) can be mounted onto a flexible plastic as well as onto a glass substrate. Functional devices on the insulating panels are developed to be formed by using ELA. Although technical issues are remained for the fabrication process, Si transistors including 3D TFT structure formed by ELA is expected as a functional Si system on insulator in the ubiquitous IT era.

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A New Poly-Si TFT with Selectively Doped Channel Fabricated by Novel Excimer Laser Annealing (새로운 레이저 어닐링 방법을 이용한 다결정 실리콘 박막 트랜지스터)

  • Lee, Jae-Hoon;Lee, Min-Cheol;Jeon, Jae-Hong;Han, Min-Koo
    • Proceedings of the KIEE Conference
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    • 2001.07c
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    • pp.1448-1450
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    • 2001
  • 본 연구에서는 알루미늄 마스크를 이용하여 다결정 실리콘 결정립의 수평성장을 유도하는 새로운 엑시머 레이저 어닐링 방법을 제안한다. 제안된 방법은 비정질 실리콘 박막 위에 알루미늄 패턴을 형성하여 선택적으로 레이저 빔을 차단시키고, 액상 실리콘의 열을 금속박막을 통해 방출시킴으로써 다결정 실리콘 결정립의 수평성장을 유도할 수 있다. 제안된 레이저 결정화 방법을 이용하여 최대 1.6${\mu}m$의 수평성장 결정립을 형성하였고, 알루미늄 패턴의 경계로부터 결정립을 성장시킴으로써 결정립 경계의 위치를 제어하였다. 제안된 방법을 이용하여 제작한 다결정 실리콘 박막 트랜지스터는 기존의 다결정 실리콘 박막 트랜지스터에 비해 전계효과 이동도 및 온/오프 전류비 등의 전기적 특성이 우수하였다.

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Electrical properties of poly-Si TFT by crystallization method for embedded TFT memory application (임베다드 TFT 메모리 적용을 위한 결정화 방법에 따른 전기적 특성평가)

  • You, Hee-Wook;Cbo, Won-Ju
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2010.06a
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    • pp.356-356
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    • 2010
  • In this paper, Poly silicon thin-film transistors (poly-Si TFTs) with employed the SPC (Solid phase crystallization) and ELA (Excimer laser annealing) methods on glass panel substrate are fabricated to investigate the electrical poperies. Poly-Si TFTs have recess-channel structure with formated source/drain regions by LPCVD n+ poly Si in low $650^{\circ}C$ temperature. the ELA-TFT show higher on/off current ratio and subthreshold swing than a-Si and SPC TFT that therefore, these results showed that the ELA-TFT might be beneficial for practical embedded TFT memory device application.

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Fabrication of Schottky barrier Thin-Film-Transistor (SB-TFT) on glass substrate with metallic source/drain

  • Jang, Hyun-June;Oh, Jun-Seok;Cho, Won-Ju
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2010.06a
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    • pp.343-343
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    • 2010
  • In this paper, Schottky barrier thin-film-transistors (SB-TFTs) with platinum silicide at source/drain region based on glass substrate were fabricated. Poly-silicon on glass substrates was crystallized by excimer laser annealing (ELA) method. The formation of pt-silicide at source/drain region is the most important process for SB-TFTs fabrication. We study the optimal condition of Pt-silicidation on glass substrate. Also, we propose this device as promising structure in the future.

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Electrical characteristic analysis of TEOS/Ozone oxide for gate insulator (게이트 절연막 활용을 위한 TEOS/Ozone 산화막의 전기적 특성 분석)

  • Park, Joon-Sung;Kim, Jae-Hong;Lee, Jun-Sin
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2008.11a
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    • pp.89-90
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    • 2008
  • 본 연구에서는 PECVD(Plasma Enhanced CVD) 에서 사용하는 유해 가스인 $SiH_4$ 대신에 유기 사일렌 반응 물질인 TEOS(Tetraethyl Orthosilicate, Si$(OC_2H_5)_4)$를 이용하여 상압 화학 기상 증착법 (Atmospheric Pressure CVD, APCVD)으로 실리콘 산화막을 증착하고 박막의 조성과 특성 및 화학적, 전기적 특성들을 살펴보았다. TEOS 반응원료를 이용한 CVD 공정에서 공정 온도를 낮추기 위한 방법으로 강력한 산화제인 오존을 이용하여 공정온도를 $400^{\circ}C$이하로 낮췄으며, 유리기판 상의 ELA(Excimer Laser Annealing)처리된 다결정 실리콘 기판에 트랜지스터 소자를 제작하고, 게이트 절연막으로의 전기적 특성을 살펴보았다.

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Hafnium Oxide Nano-Film Deposited on Poly-Si by Atomic Layer Deposition

  • Wei, Hung-Wen;Ting, Hung-Che;Chang, Chung-Shu
    • 한국정보디스플레이학회:학술대회논문집
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    • 2005.07a
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    • pp.496-498
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    • 2005
  • We reported that high dielectric hafnium oxide nano-film deposited by thermal atomic layer deposition on the poly-silicon film (poly-Si). The poly -Si film was produced by plasma enhanced chemical vapor deposition and excimer laser annealing. We used the hafniu m chloride ($HfCl_4$) and water as the precursors and analyzed the hafnium oxide film by transmission electron microscope and secondary ion mass spectrometer. Hafnium oxide produced by the ALD method showed very good coverage on the rough surface of poly-Si film. While deposited with 200 cycles, these hafnium oxide films revealed a relatively smooth surface and good uniformity, but the cumulative roughness produced by the incomplete reaction was apparent when the amount of deposition cycle increased to 600 cycles.

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The properties of low hydrogen content silicon thin films for ELA(Excimer Laser Annealing) (ELA를 위한 저수소화 Si 박막의 특성에 관한 연구)

  • 권도현;류세원;박성계;남승의;김형준
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2000.11a
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    • pp.476-479
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    • 2000
  • In this study, mesh-type PECVD system was suggested to minimize the hydrogen concentration. The main structural difference between the triode system and a conventional system is that a mesh was attached to the substrate holding electrode. We investigated several conditions to compare with conventional PECVD. The main effect of mesh was to minimize the substrate damage by ion bombardment and to enhance the surface reaction to induce hydrogen desorption. It was also found that hydrogen concentration decreased but deposition rate increased as increasing applied dias. Applied DC bias enhanced sputtering process. Intense ion bombardment causes the weakly bonded hydrogen or hydrogen-containing species to leave the growing film and increased adatom mobility. Furthermore, addition of hydrogen gas enhance the surface diffusion of adatom. The structural properties of poly-Si films were analyzed by scanning electron microscopy(SEM).

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The characteristics of poly-Si(ELA) TFTs with various channel lengths (다양한 채널 길이에 따른 ELA를 이용한 poly-Si TFT의 특징)

  • Son, Hyuk-Joo;Kim, Jae-Hong;Lee, Jeoung-In;Yi, Jun-Sin
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2007.06a
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    • pp.91-92
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    • 2007
  • 이 논문에서는 다양한 채널길이에 따른 n-채널 다결정 실리콘 TFT의 특징을 보고한다. Excimer laser annealing (ELA)를 이용한 다결정 실리콘은 디스플레이의 재료로써 줄은 특성을 갖는다. 유리기판 위에 buffered oxide 층을 올리고 ELA 처리를 하여 다결정 실리콘을 제작 하였다. 그 위에 $SiO_2$, $SiN_x$를 증착시켜 n-채널 다결정 실리콘 TFT를 만들었다. 다양한 채널의 길이에 따른 n-채널 TFT의 문턱전압 ($V_{TH}$), ON/OFF 전류비($I_{ON}/I_{OFF}$), 포화 전륙(IDSAT)를 조사하였다. 그 결과 채널의 길이가 짧은 소자에서 더 줄은 TFT의 특징이 나타난다.

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