• Journal of Magnetics
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• v.7 no.3
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• pp.94-97
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• 2002

The dependence on nickel oxide thickness and a ferromagnetic layer thickness in unidirectional and isotropic exchange-coupled NiO/NiFe(Fe) bilayer films was investigated by magnetic force microscopy to better understand the relation between magnetic domain structure and exchange biasing at microscopic length scales. As the NiO thickness increased, the domain structure of unidirectional biased films formed smaller and more complex in-plane domains. By contrast, for the isotropically coupled films, large domains generally formed with increasing NiO thickness including a cross type domain with out-of plane magnetization orientation. The density of the cross domain is proportional to exchange biasing field, and the fact that the domain mainly originated from the strongest exchange coupled region was confirmed by imaging in an applied external field during a magnetization cycle.

• Journal of Magnetics
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• v.7 no.1
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• pp.9-13
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• 2002

The dependences of microscopic magnetic domain on film thickness in unidirectional and isotropic exchange-coupled NiO/NiFe bilayers were investigated by magnetic force microscopy to better understand for exchange biasing. As NiO thickness increases, microscopic domain structure of unidirectional biased film changed to smaller and more complicated domains. However, for isotropic-coupled film a new cross type domain appeared with out-of plane magnetization orientation. The density of the cross domain is proportional to exchange biasing fields and the fact that the domain was originated by the strongest exchange coupling region was confirmed from the dynamic domain configuration during a magnetization cycle.

• Proceedings of the Korean Magnestics Society Conference
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• 1998.10a
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• pp.18-19
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• 1998

• Journal of Magnetics
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• v.11 no.2
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• pp.66-69
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• 2006

Local magnetization reversal in the exchange-biased NiFe/FeMn and $[Pd/Co]_5/FeMn$ multilayers with in-plane and out-of-plane magnetic anisotropy was achieved by using laser annealing. The local annealed NiFe/FeMn film under the opposite magnetic field shows a magnetoresistance (MR) curve having two symmetric peaks at the positive and negative exchange biasing field (${\pm}H_{ex}$). The intensity of the nucleated MR peak rises as the exposed area extends during the laser annealing process, and the peak disappears under the reverse magnetic field. In the case of [Pd/Co]/FeMn films, the local magnetization reversal increased gradually as the laser power increases. The locally reversed magnetization was restored under the opposite magnetic field.

• Proceedings of the Korean Magnestics Society Conference
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• 2003.06a
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• pp.72-73
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• 2003

• Proceedings of the Korean Magnestics Society Conference
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• 1998.10a
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• pp.16-17
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• 1998

• Proceedings of the Korean Magnestics Society Conference
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• 1999.10a
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• pp.96-97
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• 1999

• Journal of Magnetics
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• v.5 no.1
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• pp.23-25
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• 2000

We have investigated the effects of Ar and$O_2$-ion milling on the exchange coupling field ($H_{ex}$) and coercive field ($H_c$) at the interfaces between substrates and NiO/NiFe films, to understand the exchange biasing mechanism. The $O_2$-ion milling was successfully performed by means of the electron cyclotron resonance (ECR) process. We found that the local roughness gradient of the NiO surface increased by $O_2$-ion milling. The ratio of $H_{ex}/H_c$ increased from 0.87 to 1.77, whereas $H_c$ decreased by almost a half as a results of the ion milling. The decrease in $H_c$could be interpreted as due to the refinement of magnetic domain size, which arose from the increase of the local roughness gradient of the NiO surface. The decrease in low $H_c$, and increase in $H_{ex}$ in NiO spin valves by ECR-ion milling are in the right direction far use in magnetoresistance (MR) heads.

• Proceedings of the Korean Magnestics Society Conference
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• 2007.05a
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• pp.158.1-158.1
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• 2007

• Journal of the Korean Magnetics Society
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• v.12 no.3
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• pp.103-108
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• 2002

We investigated magnetoresistance(MR) and exchange bias properties by annealing in top and bosom type spin valves (SV) with nano-oxide layers (NOL). In top SVs with NOL, MR ratio of 9.2% is obtained after postdeposition annealing at 250$\^{C}$. In bottom SVs with NOL, MR ratio of 10.1 % is obtained after postdeposition annealing at 250$\^{C}$. Therefore, specular reflection of the NOL in bottom SVs is higher than that of the NOL in top SVs. Exchange biasing of bottom SVs with NOL is 28% higher than that of bottom SVs without NOL after annealing. This enhancement of exchange biasing is thought to be due to the reduced magnetic moment of the pinned layer with NOL and enhanced (111) FeMn texture.