• Proceedings of the KSRS Conference
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• 2003.11a
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• pp.505-507
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• 2003

This paper describes techniques for the automated creation of geometric 3D models of the urban area us ing two 2D laser scanners and aerial images. One of the laser scanners scans an environment horizontally and the other scans vertically. Horizontal scanner is used for position estimation and vertical scanner is used for building 3D model. Aerial image is used for registration with scan data. Those models can be used for virtual reality, tele-presence, digital cinematography, and urban planning applications. Results are shown with 3D point cloud in urban area.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.42 no.12
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• pp.79-90
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• 2005

In this paper, we propose a new clustered reconfigurable interconnect network (CRIN) BIST to improve the embedding probabilities of random-pattern-resistant-patterns. The proposed method uses a scan-cell reordering technique based on the signal probabilities of given test cubes and specific hardware blocks that increases the embedding probabilities of care bit clustered scan chain test cubes. We have developed a simulated annealing based algorithm that maximizes the embedding probabilities of scan chain test cubes to reorder scan cells, and an iterative algorithm for synthesizing the CRIN hardware. Experimental results demonstrate that the proposed CRIN BIST technique achieves complete fault coverage with lower storage requirement and shorter testing time in comparison with the conventional methods.

• 한국신재생에너지학회:학술대회논문집
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• 2011.11a
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• pp.60.2-60.2
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• 2011

A study of the non-linear optical properties of nanocrystal-Si embedded in SiO2 has been performed by using the z-scan method in the nanosecond and femtosecond ranges. Substoichiometric SiOx films were grown by plasma-enhanced chemical-vapor deposition(PECVD) on silica substrates for Si excesses up to 24 at/%. An annealing at $1250^{\circ}C$ for 1 hour was performed in order to precipitate nanocrystal-Si, as shown by EFTEM images. Z-scan results have shown that, by using 5-ns pulses, the non-linear process is ruled by thermal effects and only a negative contribution can be observed in the non-linear refractive index, with typical values around $-10-10cm^2/W$. On the other hand, femtosecond excitation has revealed a pure electronic contribution to the nonlinear refractive index, obtaining values in the order of 10-12 cm2/W. Simulations of heat propagation have shown that the onset of the temperature rise is delayed more than half pulse-width respect to the starting edge of the excitation. A maximum temperature increase of ${\Delta}T=123.1^{\circ}C$ has been found after 3.5ns of the laser pulse maximum. In order to minimize the thermal contribution to the z-scan transmittance and extract the electronic part, the sample response has been analyzed during the first few nanoseconds. By this method we found a reduction of 20% in the thermal effects. So that, shorter pulses have to be used obtain just pure electronic nonlinearities.

• Proceedings of the KSME Conference
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• 2008.11a
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• pp.1255-1258
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• 2008

Roll to roll (R2R) system, known as 'web processing', is the process of producing these electronic devices on a roll of flexible plastic. With the need of improved performance and productivity in R2R industry, effective control and on-line supervision for web quality is essential. In this report, we present a system for on-line measurement of wrinkles, one of defects incurring due to compressive stresses developed in the web. This system is able to capture an image generated when a well defined line shape laser beam passes through a transparent web. The system calculates 3D shape information, including the height of the wrinkle on the web, and displays the images for the shape information of the web in real time. By using area scan camera and machine vision laser, this system takes more advantages of setting up as a simple and low cost system compared to the line scan camera systems that widely used in web manufacturing. Specific calibration method and analysis on the achievable accuracy will be discussed.

• Proceedings of the KIEE Conference
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• 1993.07a
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• pp.9-11
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• 1993

This paper decribed the development of Thermal Imaging Oservation System(TIOS) using the serial-parallel scan method. The detectors scan five lines at a time. These are put into serial order by electronic scan converter. Digital memory and high speed multiplexer are used for the serial conversion instead of charge coupled devices. As a result, thermal imaging system be presented with exellent performance which MRTD value is less than $0.5^{\circ}K$ at 7.5 cycles/mm.

• Proceedings of the KIEE Conference
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• 1993.07b
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• pp.543-545
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• 1993

This paper decribed the development of Thermal Imaging Oservation System(TIOS) using the serial-parallel scan method. The detectors scan five lines at a tine. These are put into serial order by electronic scan converter. Digital memory and high speed multiplexer are used for the serial conversion instead of charge coupled devices. As a result, thermal imaging system be presented with exellent performance which MRTD value is less than $0.5^{\circ}K$ at 7.5 cycles/mm.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.43 no.9 s.351
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• pp.38-43
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• 2006

In this paper, we propose the efficient dead pixel detection algorithm for CMOS image sensors and its hardware architecture. The CMOS image sensors as image input devices are becoming popular due to the demand for miniaturized, low-power and cost-effective imaging systems. However, the presence of the dead pixels degrade the image quality. To detect the dead pixels, the proposed algorithm is composed of scan, trace and detection step. The experimental results showed that it could detect 99.99% of dead pixels. It was designed in a hardware description language and total logic gate count is 3.2k using 0.25 CMOS standard cell library.

• Journal of the Korea Institute of Military Science and Technology
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• v.14 no.6
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• pp.1091-1096
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• 2011

The main factors of radar signals used in electronic warfare are Radio Frequency(RF), Pulse Repetition Interval(PRI), Pulse Width(PW), Scan Parameter(SP) and so on. This radar signals may have some important information for the electronic warfare. So, there is a necessity for making a threat database to decide whether the radar signal is a threat or not. When the electronic support system collects some threat radar signals, it needs the search band to control the receivers and filter banks of the system. In this paper we propose search band implementation considering the type and center frequency of the receivers of the electronic support system.

• Journal of the Korean Society for Nondestructive Testing
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• v.29 no.1
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• pp.15-20
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• 2009

The results of crack evaluation by conventional UT(Ultrasonic Test)is highly depend on the inspector's experience or knowledge of ultrasound. Phased array UT system and its application methods for small crack length evaluation will be a good alternative method which overcome present UT weakness. This study was aimed at checking the accuracy of crack length evaluation method by electronic scanning and discuss about characteristics of electronic scanning for crack length evaluation. Especially ultrasonic phased array with electronic scan technique was used in carrying out both sizing and detect ability of crack as its length changes. The response of ultrasonic phased array was analyzed to obtain the special method of determining crack length without moving the transducer and detect-ability of crack minimal length and depth from the material. A method of crack length determining by electronic scanning for the small crack is very real method which has it's accuracy and verify the effectiveness of method compared to a conventional crack length determination.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.14 no.9
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• pp.4467-4471
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• 2013

In this research, developed full-scan photoresist coating system(FPCS) can improve the efficiency of the photoresist coating system essential for spinner equipment in nano semiconductor manufacturing process. The devices developed in this research, which can be swiftly replaced in case abnormal state element changes or wafer manufacturing defect occurs, are anticipated to improve module yield as well as real-time monitoring on the state element in order to prevent the complex process defect due to the photoresist miss coating.