• 제목/요약/키워드: electron microscopy.

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Development of Dark Field image Processing Technique for the Investigation of Nanostructures

  • Jeon, Jongchul;Kim, Kyou-Hyun
    • 한국분말재료학회지
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    • 제24권4호
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    • pp.285-291
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    • 2017
  • We propose a custom analysis technique for the dark field (DF) image based on transmission electron microscopy (TEM). The custom analysis technique is developed based on the $DigitalMicrograph^{(R)}$ (DM) script language embedded in the Gatan digital microscopy software, which is used as the operational software for most TEM instruments. The developed software automatically scans an electron beam across a TEM sample and records a series of electron diffraction patterns. The recorded electron diffraction patterns provide DF and ADF images based on digital image processing. An experimental electron diffraction pattern is recorded from a IrMn polycrystal consisting of fine nanograins in order to test the proposed software. We demonstrate that the developed image processing technique well resolves nanograins of ~ 5 nm in diameter.

주사 투과 전자현미경을 활용한 음극형광 분석법 (Introduction to Cathodoluminescence Spectroscopy Using Scanning Transmission Electron Microscopy)

  • 김성대
    • 한국전기전자재료학회논문지
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    • 제36권4호
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    • pp.326-331
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    • 2023
  • The utilization of scanning transmission electron microscopy (STEM) in conjunction with cathodoluminescence (CL) has emerged as a valuable tool for the investigation of material optical properties. In recent years, this technique has facilitated significant advancements in the fields of plasmonics and quantum emitters by surpassing prior technical restrictions. The review commences by providing an outline of the diverse STEM-CL operating modes and technical aspects of the instrumentation. The review explains the fundamental physics of light production under electron beam irradiation and the physical basis for interpreting STEM-CL experiments for different types of excitations. Additionally, the review compares STEM-CL to other related techniques such as scanning electron microscope CL, photoluminescence, and electron energy-loss spectroscopy.

Atomically sculptured heart in oxide film using convergent electron beam

  • Gwangyeob Lee;Seung-Hyub Baek;Hye Jung Chang
    • Applied Microscopy
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    • 제51권
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    • pp.1.1-1.2
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    • 2021
  • We demonstrate a fabrication of an atomically controlled single-crystal heart-shaped nanostructure using a convergent electron beam in a scanning transmission electron microscope. The delicately controlled e-beam enable epitaxial crystallization of perovskite oxide LaAlO3 grown out of the relative conductive interface (i.e. 2 dimensional electron gas) between amorphous LaAlO3/crystalline SrTiO3.

Studies on the Biology and Predatory Behaviour of Eocanthecona furcellata (Wolff.) Predating on Spilarctia obliqua (Walk.) in Mulberry Plantation

  • Kumar, Vineet;Morrison, M.N.;Rajadurai, S.;Babu, A.M.;Thiagarajan, V.;Datta, R.K.
    • International Journal of Industrial Entomology and Biomaterials
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    • 제2권2호
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    • pp.173-180
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    • 2001
  • The stink bug, Eocanthecona furcellata (Wolff.) is a natural and potential biocontrol agent of Spilarctia obliqua (Walk.). The present investigation reveals the biology, predatory efficiency and reproductive parameters of the predator which feeds on S. obliqua caterpillars in mulberry plantation. In order to find out the role of prey sine on the biology of the predators the predatory insects were separately fed with small and large caterpillars of S. obliqua. The incubation period of the eggs of E. furcellata was 8.37${\pm}$0.44 days, while the nymphal duration varied as per the prey sine. The predator when supplied with small larvae of prey, consumed 61.1 larvae and completed nymphal stage in 19.9 days; while those fed with larger prey, consumed 36.1 larvae and completed their nymphal stage in 21.55 days. The prey size also influences the reproductive parameters of the predator, The adult female predator is more voracious feeder than the adult male and consumed 41.9${\pm}$0.64 small larvae and 42.2${\pm}$0.87 large larvae during their life span. The longevity of male and female was observed as 20.7 and 29.4 days respectively. Visualization of the predator as well as the movement of the prey increases the predatory efficiency. Scanning electron microscopic studies on the feeding part explain its support in effective predation. Field observations indicated a drastic fall in the incidence of the mulberry pest, S. obliqua with the increased population E. furcellata in mulberry plantation.

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A Study on the Scanning Electron Microscopy of the Buffalo Mammary Gland

  • Dang, A.K.;Ludri, R.S.
    • Asian-Australasian Journal of Animal Sciences
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    • 제14권1호
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    • pp.101-103
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    • 2001
  • Scanning Electron Microscopy of twelve lactating buffalo mammary gland was done. The lactating mammary gland showed alveolus, arrangement of blood vessels and myoepithelial cells on the alveolus, the formation of lobules and interlobular connective tissue. From the exposed alveolar lumen fat globule formation can be seen which is still attached to the alveolar surface by microvilli. This technique should further be extended to study the alveolar structure in detail during different stages of mammary gland development in buffaloes.

Overview of Immunoelectron Microscopy

  • Park, Chang-Hyun;Kim, Hong Lim;Chang, Byung-Joon;Lee, Sang Hoon;Chang, Byung Soo;Bae, Chun-Sik;Cho, Ik-Hyun;Kim, Dong Heui;Han, Jung-Mi;Na, Ji Eun;Choi, Byung-Jin;Kim, Sang-Sik;Kim, Hyun-Wook;Kim, Jee-Woong;Rhyu, Im Joo;Uhm, Chang-Sub
    • Applied Microscopy
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    • 제48권4호
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    • pp.87-95
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    • 2018
  • Immunoelectron microscopy using an antigen-antibody reaction in an electron microscope is a very useful tool to identify the components of a tissue in an electron microscope. Many researchers also use immunoelectron microscopy. Nonetheless, immunoelectron microscopy is rarely introduced systematically, and immunoelectron microscopy can be carried out without fully understanding the principles, and cases of poor understanding can often be seen in the vicinity. Therefore, in order to make it easier to understand, we will first introduce the principles of immunoelectron microscopy and describe practical methods.

Preparation Method of Plan-View Transmission Electron Microscopy Specimen of the Cu Thin-Film Layer on Silicon Substrate Using the Focused Ion Beam with Gas-Assisted Etch

  • Kim, Ji-Soo;Nam, Sang-Yeol;Choi, Young-Hwan;Park, Ju-Cheol
    • Applied Microscopy
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    • 제45권4호
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    • pp.195-198
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    • 2015
  • Gas-assisted etching (GAE) with focused ion beam (FIB) was applied to prepare plan-view specimens of Cu thin-layer on a silicon substrate for transmission electron microscopy (TEM). GAE using $XeF_2$ gas selectively etched the silicon substrate without volume loss of the Cu thin-layer. The plan-view specimen of the Cu thin film prepared by FIB milling with GAE was observed by scanning electron microscopy and $C_S$-corrected high-resolution TEM to estimate the size and microstructure of the TEM specimen. The GAE with FIB technique overcame various artifacts of conventional FIB milling technique such as bending, shrinking and non-uniform thickness of the TEM specimens. The Cu thin film was uniform in thickness and relatively larger in size despite of the thickness of <200 nm.

Probing the Atomic Structures of Synthetic Monolayer and Bilayer Hexagonal Boron Nitride Using Electron Microscopy

  • Tay, Roland Yingjie;Lin, Jinjun;Tsang, Siu Hon;McCulloch, Dougal G.;Teo, Edwin Hang Tong
    • Applied Microscopy
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    • 제46권4호
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    • pp.217-226
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    • 2016
  • Monolayer hexagonal boron nitride (h-BN) is a phenomenal two-dimensional material; most of its physical properties rival those of graphene because of their structural similarities. This intriguing material has thus spurred scientists and researchers to develop novel synthetic methods to attain scalability for enabling its practical utilization. When probing the growth behaviors and structural characteristics of h-BN, the use of appropriate characterization techniques is important. In this review, we detail the use of scanning and transmission electron microscopies to investigate the atomic configurations of monolayer and bilayer h-BN grown via chemical vapor deposition. These advanced microscopy techniques have been demonstrated to provide intimate insights to the atomic structures of h-BN, which can be interpreted directly or indirectly using known growth mechanisms and existing theoretical calculations. This review provides a collective understanding of the structural characteristics and defects of synthetic h-BN films and facilitates a better perspective toward the development of new and improved synthesis techniques.

주사전자현미경을 활용한 세라믹의 분석 (Analysis of Ceramics Using Scanning Electron Microscopy)

  • 이수정
    • 세라미스트
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    • 제22권4호
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    • pp.368-380
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    • 2019
  • A ceramic is used as a key material in various fields. Accordingly, the use of scanning electron microscopy is increased for the purpose of evaluating the reliability and defects of advanced ceramic materials. The scanning electron microscope is developed to overcome the limitations of optical microscopy and uses accelerated electrons for imaging. Various signals such as SE, BSE and characteristic X-rays provide useful information about the surface microstructure of specimens and, the content and distribution of chemical components. The development of electron guns, such as FEG, and the improved lens system combined with the advanced in-lens detectors and STEM-in-SEM system have expanded the applications of SEM. Automated SEM-EDS analysis also greatly increases the amount of data, enabling more statistically reliable results. In addition, X-ray CT, XRF, and WDS, which are installed in scanning electron microscope, have transformed SEM a more versatile analytical equipment. The performance and specifications of the scanning electron microscope to evaluate ceramics were reviewed and the selection criteria for SEM analysis were described.