• 제목/요약/키워드: electrical and optical properties

검색결과 2,224건 처리시간 0.033초

전기방사법을 이용하여 제조된 Sb-Doped SnO2 투명전도막의 전기적 및 광학적 특성 (Electrical and Optical Properties of Sb-Doped SnO2 Transparent Conductive Films Fabricated by Using Electrospinning)

  • 안하림;구본율;안효진;이태근
    • 한국재료학회지
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    • 제25권4호
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    • pp.177-182
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    • 2015
  • Sb-doped $SnO_2$(ATO) thin films were prepared using electrospinning. To investigate the optimum properties of the electrospun ATO thin films, the deposition numbers of the ATO nanofibers(NFs) were controlled to levels of 1, 2, 4, and 6. Together with the different levels of deposition number, the structural, chemical, morphological, electrical, and optical properties of the nanofibers were investigated. As the deposition number of the ATO NFs increased, the thickness of the ATO thin films increased and the film surfaces were gradually densified, which affected the electrical properties of the ATO thin films. 6 levels of the ATO thin film exhibited superior electrical properties due to the improved carrier concentration and Hall mobility resulting from the increased thickness and surface densification. Also, the thickness of the samples had an effect on the optical properties of the ATO thin films. The ATO thin films with 6 deposited levels displayed the lowest transmittance and highest haze. Therefore, the figure of merit(FOM) considering the electrical and optical properties showed the best value for ATO thin films with 4 deposited levels.

디스플레이 커버 글라스의 표면 처리에 의한 광학요소 제어 (Optical Properties Control by Surface Treatment on Display Cover Glass)

  • 김성수;황재석;전법주
    • 한국전기전자재료학회논문지
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    • 제28권9호
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    • pp.607-614
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    • 2015
  • To provide the clear images from the direct light on electrical board and display devices, anti glare treatment of display cover glass is needed. In this study, the effects of surface treatment temperature, concentration, and etching solution coating thickness of the gel phase on optical elements control such as gloss, haze of reflected light and transmittance, were investigated. Cover glasses were treated at different coating thickness and additive concentration. The optical properties were examined using spectrophotometer, gloss and haze meter. The surface morphology and roughness were measured by the optical microscope and Ra measuring instrument. The etching rate and surface morphologies were dramatically affected by the concentration of acid additive in the viscous gel because of re-crystallization of components in the etching solution, hydrogel formation and coagulant after coating on glass substrate. In our experimental range, cover glass which is surface-treated with various optical properties as well as the morphology uniformity was obtained; in particular, optical properties could be controlled by etching solution coating thickness of the gel phase and the concentration of additive. The gloss was depended on the surface roughness and it showed the linear relationship between optical transmittance and haze of reflected light, respectively.

광변조기용 CPW 전극제작 및 특성 (Fabrication and Properties of CPW Electrode for Optical Modulator)

  • 임영삼;김성구;박계춘;이진;정해덕
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 1999년도 춘계학술대회 논문집
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    • pp.278-281
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    • 1999
  • We designed and fabricated a travelingwave CPW(coplanar waveguide) electrode for LiNbO$_3$ optical modulator. To Investigate the variation of microwave refractive index of these electrodes, we prepared the CPW electrode samples as a function of electrode thickness and measured the TDR and S-parameter. From this results, we could know the electrode conditions of index matching to 2.20 for 1150 nm optical wave index for applying LiNbO$_3$ optical modulator. Also we discussed the some properties of CPW electrode for applying LiNbO$_3$ optical modulator.

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Thickness-dependent Electrical, Structural, and Optical Properties of ALD-grown ZnO Films

  • Choi, Yong-June;Kang, Kyung-Mun;Park, Hyung-Ho
    • 마이크로전자및패키징학회지
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    • 제21권2호
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    • pp.31-35
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    • 2014
  • The thickness dependent electrical, structural, and optical properties of ZnO films grown by atomic layer deposition (ALD) at various growth temperatures were investigated. In order to deposit ZnO films, diethylzinc and deionized water were used as metal precursor and reactant, respectively. ALD process window was found at the growth temperature range from $150^{\circ}C$ to $250^{\circ}C$ with a growth rate of about $1.7{\AA}/cycle$. The electrical properties were studied by using van der Pauw method with Hall effect measurement. The structural and optical properties of ZnO films were analyzed by using X-ray diffraction, field emission scanning electron microscopy, and UV-visible spectrometry as a function of thickness values of ZnO films, which were selected by the lowest electrical resistivity. Finally, the figure of merit of ZnO films could be estimated as a function of the film thickness. As a result, this investigation of thickness dependent electrical, structural, and optical properties of ZnO films can provide proper information when applying to optoelectronic devices, such as organic light-emitting diodes and solar cells.

Stress Profile Dependence of the Optical Properties in Strained Quantum Wire Arrays

  • Yi, Jong-Chang;Ji, Jeong-Beom
    • Journal of the Optical Society of Korea
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    • 제7권1호
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    • pp.13-19
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    • 2003
  • The effects of strain distribution in quantum wire arrays have been analyzed using a finite-element method including both the hydrostatic and shear strain components. Their effects on the optical properties of the quantum wire arrays are assessed for various types of stress profiles by calculating the optical gain and the polarization dependence. The results show unique polarization dependency, which can be exploited either for the single polarization or the polarization-independent operation in quantum wire photonic devices.

무수은 제논 EEFL의 전기적 특성 (Electric Properties of Mercury-free Xe EEFL)

  • 이성진;김남군;이종찬;박노준;박대희
    • 한국전기전자재료학회논문지
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    • 제20권7호
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    • pp.650-657
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    • 2007
  • This paper had mentioned about CCP light source application for increasing the efficiency of Xe lamp the mercury-free lamp. In order to increase the efficiency of Xe EEFL, we designed and manufactured the lamp used by mixture gas of Xe, Ne and He. Also, we have analyzed the electrical and optical properties with the firing voltage, sustain voltage, paschen's curve, wall charge, and capacitance. As a result, the firing voltage decreased by increasing the ration of mixture gas. and, It is owing to include the gas with high ionization energy. The firing voltage decreased in condition happening the penning effect, Because the ion of metastable state created from penning effect, Which can encourage the ionization phenomena. Also, the wavelength of 467.12 is increase. because of the energy transition in the wavelength of 147 nm. therefore, we can know about the affection of phosphor with UV emission properties. Through an experiment, Xe 100 % and Xe 75 % confirmed same spectrum properties by each mixture gas ratio. In the case of Xe 50 %, spectrum properties appeared Xe discharge and Ne-He discharge. That analyzed an electrical and optical properties. Therefore, confirmed that is excellent because properties of firing voltage, wall charge, capacitance in Xe 50 %, Ne : He = 9 : 1. We offered parameter in inverter manufacture and lamp manufacture by electrical and optical properties.

Electrical and optical properties of Li & P co-doped ZnO thin film by PLD

  • Choi, Im-Sic;Kim, Don-Hyeong;Heo, Young-Woo;Lee, Joon-Hyung;Kim, Jeong-Joo
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2009년도 하계학술대회 논문집
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    • pp.209-209
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    • 2009
  • Fabrication of p-type ZnO has already proven difficult and usually inconsistent despite numerous worldwide efforts. Many research groups studied electrical and optical properties P, Li, As, N single doped ZnO thin film. In P-doped ZnO thin film, the reproducibility of p-type conduction with $P_2O_5$ as a dopant source was shown to be relatively poor. In this study, we made P single doped and Li & P co-doped ZnO target. To investigate electrical and optical properties of P single doped and Li & P co-doped ZnO thin film using $P_2O_5$ and $Li_3PO_4$ dopant source respectively was deposited by PLD. The growth temperature was changed 500, $700^{\circ}C$ and various oxygen partial pressure and post-annealing conditions was changed temperature, different gas ambient($O_2,N_2$). We investigate that how to change electrical and optical properties as function of growth temperature, oxygen partial pressure and post-annealing(RTA).

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급속 열처리 온도 변화에 따른 AZO 박막의 구조, 전기 및 광학적 특성 (Structural, Electrical, and Optical Properties of AZO Thin Films Subjected to Rapid Thermal Annealing Temperature)

  • 정재용;조신호
    • 한국전기전자재료학회논문지
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    • 제23권4호
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    • pp.280-286
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    • 2010
  • We have investigated the influence of rapid thermal annealing (RTA) temperature on properties of Al-doped zinc oxide (AZO) thin films deposited on glass substrate by using radio-frequency magnetron sputtering. The RTA is performed in a nitrogen ambient in the temperature range from 300 to $600^{\circ}C$ for 1 minute in a rapid thermal annealer after growing the AZO thin films. The crystallographic structure and the surface morphology of AZO thin film are measured by using X-ray diffraction, and atomic force microscopy and scanning electron microscopy, respectively. The optical transmittance of the deposited thin films is examined in the wavelength range of 300-1100 nm, where the average transmittance is above the 90% in the visible and near-infrared regions. The optical bandgap is calculated from the Tauc's model, and it shows a significant dependence on the RTA temperature. As for the electrical properties of the thin films, the AZO thin film annealed at $400^{\circ}C$ shows the lowest electrical resistivity of $8.6{\times}10^{-3}{\Omega}cm$ and the Hall mobility of $11.3cm^2$/V-sec. These results suggest that the RTA temperature is an important parameter to influence on the structural, electrical, and optical properties of AZO thin films.

RF 파워에 따라 스퍼터된 Al doped ZnO 박막의 구조적, 광학적, 전기적 특성 (Structural, Optical, and Electrical Properties of Sputtered Al doped ZnO Thin Film Under Various RF Powers)

  • 김종욱;김덕규;김홍배
    • 한국전기전자재료학회논문지
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    • 제24권3호
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    • pp.177-181
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    • 2011
  • We have studied structural, optical, and electrical properties of the Al-doped ZnO (AZO) thin films being usable in transparent conducting oxides. The AZO thin films were deposited on the corning 1737 glass plate by the RF magnetron sputtering system. To find optimal properties of AZO for transparent conducting oxides, the RF power in sputtering process was varied as 40 W, 60 W, and 80 W, respectively. As RF power increased, the crystallinity of AZO thin film was decreased, the optical bandgap of AZO thin film increased. The transmittance of the film was over 80% in the visible light range regardless of the changes in RF power. The measurement of Hall effect characterizes the whole thin film as n-type, and the electrical property was improved with increasing RF power. The structural, optical, and electrical properties of the AZO thin films were affected by Al dopant content in AZO thin film.

PET 기판 위에 증착된 ITO 투명전도막의 전기적ㆍ광학적 특성 (Electrical and Optical Properties of ITO Thin films Prepared on the PET Substrate)

  • 송우창
    • 한국전기전자재료학회논문지
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    • 제17권12호
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    • pp.1277-1282
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    • 2004
  • ITO films on PET substrate were prepared by DC magnetron sputtering method using powdery target with different deposition conditions. In addition, the electrical and optical properties were investigated. As the sputtering power and working pressure were higher, the resistvity of ITO films increased. The optical transmittance deteriorated with increasing sputtering power and thickness. As the working pressure increased, however, the optical transmittance improved at visible region of light. From these results, we could deposited ITO films with 8${\times}$10$^{-3}$ $\Omega$-cm of resistivity and 80 % of transmittance at optimal conditions.