Improving Lifetime Prediction Modeling for SiON Dielectric nMOSFETs with Time-Dependent Dielectric Breakdown Degradation (SiON 절연층 nMOSFET의 Time Dependent Dielectric Breakdown 열화 수명 예측 모델링 개선)
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- The Journal of Korea Institute of Information, Electronics, and Communication Technology
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- v.16 no.4
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- pp.173-179
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- 2023