• 제목/요약/키워드: defect inspection

검색결과 594건 처리시간 0.027초

건설감리 검측데이터 분석을 통한 공사 진행도별 중점관리공종 도출 (A Study on the Derivation of Key Management Works by Construction Progress through the Analysis of Construction Supervision Data)

  • 유나영;김하늘;김하림;조훈희
    • 한국건축시공학회:학술대회논문집
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    • 한국건축시공학회 2022년도 가을 학술논문 발표대회
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    • pp.131-132
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    • 2022
  • The type and proportion of construction work varies depending on the stage of progress, and the frequency of inspection and defect occurrences are different. If it is determined to be defective after the inspection, a delay may occur, and additional manpower and resources are required. Therefore, it is necessary to prevent these risks by classifying, deriving, and managing key management woks according to the progress. This study aims to contribute to the efficiency of the supervisor's inspection work by identifying the types of construction that should be managed intensively for each construction progress and deriving the time when defects occur frequently in each construction type.

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자동외관검사를 위한 검출위치 클러스터링 알고리즘 (Detected Point Clustering Algorithm For Automatic Visual Inspection)

  • 유선중
    • 반도체디스플레이기술학회지
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    • 제13권3호
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    • pp.1-6
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    • 2014
  • Visual defect inspection for electronics parts manufacturing processes is comprised of 2 steps - automatic visual inspection by machine and inspection by human inspectors. It is necessary that spatial points which were detected by the machine should be adequately clustered for subsequent human inspection. This research deals with the spatial clustering algorithm for the purpose of process productivity improvement. Distribution based clustering is newly developed and experimentally confirmed to show better clustering efficiency than existing algorithm - area based clustering.

냉연 강판의 개별 흠 분리를 위한 고속 레이블링에 관한 연구 (Fast labeling a1gorithm for the surface defect inspection of Cold Mill Strip)

  • 김경민;박중조
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 2000년도 하계학술대회 논문집 D
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    • pp.3056-3059
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    • 2000
  • This paper describes a fast image labeling algorithm for the feature extraction of connected components. Labeling the connected regions of a digitized image is a fundamental computation in image analysis and machine vision, with a large number of application that can be found in various literature. This algorithm is designed for the surface defect inspection of Cold Mill Strip. The labeling algorithm permits to separate all of the connected components appearing on the Cold Mill Strip.

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SQI를 이용한 지하 매설 가스 배관 결함 길이 추정 (Defect Length Estimation Using SQI for Underground Gas Pipelines)

  • 김민호;최두현
    • 한국가스학회지
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    • 제15권2호
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    • pp.27-32
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    • 2011
  • 본 논문에서는 자기 누설 탐상법을 이용하여 획득한 자기 누설 신호에 SQI(self quotient image)를 적용하여 지하에 매설된 가스 배관에 발생한 결함의 길이를 추정하는 방법을 소개한다. 자기 누설 탐상 시스템(MFL)이 지나간 가스 배관은 탐상 시스템의 영구 자석에 의해 착자(magnetization) 된다. 착자된 가스 배관에 결함이나 부식 등의 손상이 있을 경우 손상 부위에서는 누설 자속이 증가한다. 본 논문에서는 자기 누설 탐상 시스템의 홀센서를 이용하여 누설 자속을 계측한 후 SQI를 적용하여 결함의 길이를 추정한다. 한국가스공사(KOGAS)의 모의 시험 배관(KPSF)에 설치된 74개의 인공결함에 대해 제안한 알고리즘과 기존의 결함 길이 추정 알고리즘들의 성능을 비교하였다.

샘플링검사를 이용한 PLC의 불량률 추정 및 불량원인 개선 사례연구 (A Case Study for Estimating the Defect Rate of PLC Using Sampling Inspection and Improving the Cause of Defects)

  • 문인선;이동형
    • 산업경영시스템학회지
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    • 제44권4호
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    • pp.128-135
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    • 2021
  • WDM(Wavelength Division Multiplexing) is called a wavelength division multiplexing optical transmission method and is a next-generation optical transmission technology. Case company F has recently developed and sold PLC(Planar Lightwave Circuit), a key element necessary for WDM system production. Although Chinese processing companies are being used as a global outsourcing strategy to increase price competitiveness by lowering manufacturing unit prices, the average defect rate of products manufactured by Chinese processing companies is more than 50%, causing many problems. However, Chinese processing companies are trying to avoid responsibility, saying that the cause of the defect is the defective PLC Wafer provided by Company F. Therefore, in this study, the responsibility of the PLC defect is clearly identified through estimating the defect rate of PLC using the sampling inspection method, and the improvement plan for each cause of the PLC defect for PLC yeild improvement is proposed. The result of this research will greatly contribute to eliminating the controversy over providing the cause of defects between global outsourcing companies and the head office. In addition, it is expected to form a partnership with Company F and a Chinese processing company, which will serve as a cornerstone for successful global outsourcing. In the future, it is necessary to increase the reliability of the PLC yield calculation by extracting more precisely the number of defects.

레이저 스페클 전단간섭법을 이용한 압력용기 내부결함의 측정 가능한 결함 크기의 평가 (Evaluation of Detectable Defect Size for Inner Defect of Pressure Vessel Using Laser Speckle Shearing Interferometry)

  • 김경석;선상우;최태호;강찬근;나만균;정현철
    • 비파괴검사학회지
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    • 제34권2호
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    • pp.135-140
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    • 2014
  • 최근 압력용기가 다양한 산업분야에서 사용되고 있다. 압력용기의 내부 또는 외부에 결함이 발생하면 대형 사고를 유발하게 된다. 압력용기의 외부에 발생하는 결함은 육안검사를 통해 어느 정도 해결이 가능하지만, 압력용기 내부에 발생하는 결함은 육안검사로는 측정하기 어렵다. 이러한 형태의 결함을 측정하기 위해서는 비파괴검사가 적합하다. 전단간섭법은 광계측을 이용한 비파괴검사법 중 하나이며, 비접촉식으로 전체 측정영역에 대해 실시간으로 한 번의 실험을 통해 결함을 측정할 수 있다는 장점을 지니고 있다. 본 논문에서는 레이저 스페클 전단간섭법을 이용하여 측정할 수 있는 압력용기의 내부에 존재하는 결함 크기를 평가하였다. ASTM A53 Gr.B 재질로 제작된 압력용기 시험편 내부에 인위적인 결함을 가공하고 공압을 이용하여 압력용기에 내압을 가하여 결함을 측정하였다. 실험을 통해 0.2 MPa의 압력차에서도 압력용기의 원래 두께의 25 %의 깊이로 발생한 결함까지는 측정 가능함을 확인하였다.

초음파 다중 반사를 이용한 추진제/라이너 미접착 검출 기법 연구 (Inspection Technology of Detection of Propellant/Liner Debond Using Ultrasonic Multi-reflection)

  • 나성엽;김동륜;류백능
    • 한국추진공학회:학술대회논문집
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    • 한국추진공학회 2007년도 제28회 춘계학술대회논문집
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    • pp.17-21
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    • 2007
  • 초음파를 이용한 로켓 모타의 비파괴검사는 X-ray 검사에 비하여 경제성이 우수하고, 미접착 등의 결함 검출이 우수한 편이다. 그리고 전용 시설 없이 현장에서 실시간으로 검사가 가능하며 방사선 작업에 비하여 안전한 방법이다. 본 논문에서는 초음파 다중반사에 의한 추진제/라이너 미접착 검출 기법에 대하여 실험 및 이론적 모델링으로 분석하였다. 실험 결과, 추진제/라이너 미접착의 신호가 정상 접착과 구별되는 뚜렷한 신호 차이를 보였으며, 실험에서 측정한 신호와 이론적 모델링 신호가 대체적으로 일치하였다.

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결함검출을 위한 실험적 연구

  • 목종수
    • 한국공작기계학회:학술대회논문집
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    • 한국공작기계학회 1996년도 춘계학술대회 논문집
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    • pp.24-29
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    • 1996
  • The seniconductor, which is precision product, requires many inspection processes. The surface conditions of the semiconductor chip effect on the functions of the semiconductors. The defects of the chip surface is crack or void. Because general inspection method requires many inspection processes, the inspection system which searches immediately and preciselythe defects of the semiconductor chip surface. We propose the inspection method by using the computer vision system. This study presents an image processing algorithm for inspecting the surface defects(crack, void)of the semiconductor test samples. The proposed image processing algorithm aims to reduce inspection time, and to analyze those experienced operator. This paper regards the chip surface as random texture, and deals with the image modeling of randon texture image for searching the surface defects. For texture modeling, we consider the relation of a pixel and neighborhood pixels as noncasul model and extract the statistical characteristics from the radom texture field by using the 2D AR model(Aut oregressive). This paper regards on image as the output of linear system, and considers the fidelity or intelligibility criteria for measuring the quality of an image or the performance of the processing techinque. This study utilizes the variance of prediction error which is computed by substituting the gary level of pixel of another texture field into the two dimensional AR(autoregressive model)model fitted to the texture field, estimate the parameter us-ing the PAA(parameter adaptation algorithm) and design the defect detection filter. Later, we next try to study the defect detection search algorithm.

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A Mixed 0-1 Linear Program for the Inspection Location Problem

  • Yum, Bong-Jin
    • 대한산업공학회지
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    • 제10권1호
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    • pp.11-16
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    • 1984
  • An economic model is developed for determining optimal locations of screening inspection stations in a multistage production system. The effect of screening inspection on the production rate is explicitly considered, and a fixed cost for maintaining an inspection station is assumed. The product is allowed to have multiple defects, each of which may be inspected at any inspection station after the defect-generating operation. The problem is formulated as a mixed 0-1 linear program which offers the advantage of versatility in handling various system constraints.

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Application of Generic Algorithm to Inspection Planning of Fatigue Deteriorating Structure

  • Kim, Sung-chan;Fujimoto, Yukio;Hamada, Kunihiro
    • Journal of Ship and Ocean Technology
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    • 제2권1호
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    • pp.42-57
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    • 1998
  • Genetic Algorithm (GA) is applied to obtain optimal Inspection plan for fatigue deteriorating structures. The optimization problem is defined so as to minimize inspection cost in the 1ifs-time of the structure under the constraint that the increment of failure probability in each inspection interval is maintained below a target value. Optimization parameters are the inspection timing and the inspection quality. The inspection timing is selected from the discrete intervals such as one year, two years, three years, etc. The inspection quality is selected from the followings; no inspection, normal inspection, sampling inspection or precise inspection. The applicability of the proposed GA approach is demonstrated through the numerical calculations assuming a structure consisting of four member sets. Influences of the level of target failure probability, initial defect condition and stress increase due to plate thickness reduction caused by corrosion on inspection planning are discussed.

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