• Title/Summary/Keyword: defect engineering

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Capacitance Aging Behavior of Acceptor-Doped BaTiO3 under DC Electrical Field (직류 전계에 의한 Acceptor 첨가 BaTiO3의 유전특성 열화 현상)

  • Hahn, Dong-Woo;Han, Young-Ho
    • Journal of the Korean Ceramic Society
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    • v.46 no.2
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    • pp.219-223
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    • 2009
  • Effects of MgO or $R_2O_3$(R:Dy, Ho, Yb) on the capacitance aging behavior of multilayer ceramic capacitors (MLCCs) based on $BaTiO_3$ dielectrics under DC electrical fields has been studied. At a DC field of 1 $V{/\mu}m$, the capacitance of MLCC specimens dropped immediately in a very short period (<10 s, the first stage) and then decreased continuously with time (the second stage). Mn doping significantly increased the aging rate in the second stage. The addition of MgO or $R_2O_3$ notably decreased the second stage aging rate of Mn-doped specimens. Yb doping gives rise to the lowest aging rate in the second stage, which is due to the larger population of defect dipoles associated with oxygen vacancies.

Three-dimensional TEM Characterization of Highly Oriented Diamond Films on a (100) Silicon Substrate

  • Seung Joon Jeon;Arun Kymar Chawla;Young Joon Baik;Changmo Sung
    • The Korean Journal of Ceramics
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    • v.3 no.3
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    • pp.155-158
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    • 1997
  • Highly oriented diamond films were deposited on a (100) silicon substrate by bias enhanced nucleation technique. Both plan-view and cross-section TEM were applied to study the nucleation and growth mechanism of diamond grains. Randomly oriented polycrystalline diamond grains with internal microtwins were observed at the nucleation stage while defect free regions were retained at the growth stage and were apparently related with the epitaxy of diamond films. From our experimental results, the nucleation and texture formation mechanism of diamond films is discussed.

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Performance Improvement of Asynchronous Mass Memory Module Using Error Correction Code (에러 보정 코드를 이용한 비동기용 대용량 메모리 모듈의 성능 향상)

  • Ahn, Jae Hyun;Yang, Oh;Yeon, Jun Sang
    • Journal of the Semiconductor & Display Technology
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    • v.19 no.3
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    • pp.112-117
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    • 2020
  • NAND flash memory is a non-volatile memory that retains stored data even without power supply. Internal memory used as a data storage device and solid-state drive (SSD) is used in portable devices such as smartphones and digital cameras. However, NAND flash memory carries the risk of electric shock, which can cause errors during read/write operations, so use error correction codes to ensure reliability. It efficiently recovers bad block information, which is a defect in NAND flash memory. BBT (Bad Block Table) is configured to manage data to increase stability, and as a result of experimenting with the error correction code algorithm, the bit error rate per page unit of 4Mbytes memory was on average 0ppm, and 100ppm without error correction code. Through the error correction code algorithm, data stability and reliability can be improved.

Condition Assessment Models and Fuzzy Reliability Analysis of Structural Systems (구조시스템의 퍼지신뢰성해석 및 상태평가모델)

  • 이증빈;손용우;박주원
    • Proceedings of the Computational Structural Engineering Institute Conference
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    • 1998.10a
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    • pp.61-68
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    • 1998
  • It has become important to evaluate the qualitive reliability and condition assessment of existing structural systems in order to establish a rational program for repair and maintenance. Since most of if existing structural system may suffer from defect corrosion and damage, it is necessary to account for their effects in fuzzy reliability analysis, In this paper, an attempt is made to develope a reliability analysis for damaged structural systems using failure possibility theory. Damage state is specified in terms of linguistic valiables using natural language information and numerical information, which are defined by fuzzy sets. Using a subjective condition index of failure possibility and information of the damage state is introduced into the calculation of failure probability. The subjective condition index of quantitative and qualitative analysis method is newly proposed based on the fuzzy set operations, namely logical product, drastic product, logical sum and drastic sum

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A modification of double projection method for adaptive analysis of Element-free Galerkin Method (적응적 Element-free Galerkin Method 해석을 위한 이중투영법의 개선)

  • 이계희;정흥진;이태열
    • Proceedings of the Computational Structural Engineering Institute Conference
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    • 2002.10a
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    • pp.615-622
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    • 2002
  • In this paper, the modification of double projection method for the adaptive analysis of Element-free Galerkin(EFG) method were proposed. As results of the double projection method, the smoothed error profile that is adequate for adaptive analysis was obtained by re-projection of error that means the differences of EFG stress and projected stress. However, it was found that the efficiency of double projection method is degraded as increase of the numerical integration order. Since, the iterative refinement to single step error estimation made the same effect as increasing of integration order, the application of the iterative refinement base on double projection method could be produced the inadequately refined analysis model. To overcome this defect, a modified scheme of double projection were proposed. In the numerical example, the results did not show degradation of double projection effect in iterative refinement and the efficiency of proposed scheme were proved.

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The development of critical node method based heuristic procedure for Solving fuzzy assembly-line balancing problem (퍼지 조립라인밸런싱 문제 해결을 위한 주노드법에 기초한 휴리스틱 절차 개발)

  • 이상완;박병주
    • Journal of Korean Society of Industrial and Systems Engineering
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    • v.22 no.51
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    • pp.189-197
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    • 1999
  • Assembly line balancing problem is known as one of difficult combinatorial optimization problems. This problem has been solved with linear programming, dynamic programming approaches. but unfortunately these approaches do not lead to efficient algorithms. Recently, genetic algorithm has been recognized as an efficient procedure for solving hard combinatorial optimization problems, but has a defect that requires long-run time and computational complexties to find the solution. For this reason, we adapt a new method called the Critical Node Method that is intuitive, easy to understand, simple for implementation. Fuzzy set theory is frequently used to represent uncertainty of information. In this paper, to treat the data of real world problems we use a fuzzy number to represent the duration and Critical Node Method based heuristic procedure is developed for solving fuzzy assembly line balancing problem.

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Growth and Characteristic Infrared Raman Spectra of Potassium Lithium Niobate Single Crystals

  • Youbao Wan;Yoo, Sang-Im
    • Proceedings of the Korea Crystallographic Association Conference
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    • 2002.11a
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    • pp.15-15
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    • 2002
  • Homogeneous and crack-free potassium lithium niobate (K₃Li/sub 2-x/Nb/sub 5+x/O/sub 15/, 0<x<0.5, KLN) single crystals were successfully grown by the Czochralski technique. The KLN single crystals of several different compositions were employed for the investigation of the lattice vibration spectra using infrared Raman spectroscopy. The characteristic Raman spectra of the [NbO/sub 6/]/sup 7-/ octahedral ions were strikingly influenced by the Li ion content. The symmetric stretch vibrational modes V₁, V₂ are broadened, and the symmetric bend vibration mode V/sub 5/ is broadened and even split into three peaks with increasing the Li content, supporting that the bend vibration modes of the [NbO/sub 6/]/sup 7-/ octahedrons are obviously perturbed by Li ions in the C site. Enhanced Raman peak intensities after the post annealing at 900℃ and for 24 h evidenced that a residual stress in as-grown crystals was negligible and only a defect concentration might be reduced.

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A Study on the Low Temperature Growth of SiC Film with a 1,3-DSB Precursor (단일전구체(1,3-DSB)에 의한 저온 SiC박막 성장에 관한 연구)

  • 양재웅;노대호;윤진국;김재수
    • Journal of Surface Science and Engineering
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    • v.36 no.2
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    • pp.141-147
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    • 2003
  • Silicon carbide thin film was deposited in APCVD and LPCVD system with 1,3-DSB precursor 1,3-DSB is the single precursor to deposit SiC on Si at low temperature. SiC film was deposited at $850^{\circ}C$ lower than ordinary temperature ($1000~1200^{\circ}C$) in CVD process. SiC thin film glowed to high oriented (111) plane in APCVD system. In LPCVD system, SiC film groved to preferred (220) plane at same temperature. This discrepancy between preferred planes can be described by the difference of deposition mechanism. Amorphous phase and crystal defect were observed in APCVD system with the main growth mechanism of mass transport limited region. But in LPCVD system, we got the SIC film of uniform, faceted structure and high quality.

Streptomyces Cytochrome P450 and Electron Transport System (방선균 시토크롬 P450와 전자전이시스템)

  • Sohng, Jae-Kyung;Oh, Tae-Jin
    • Microbiology and Biotechnology Letters
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    • v.38 no.3
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    • pp.227-234
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    • 2010
  • Cytochrome P450 enzymes which require the supply of electrons from NAD(P)H have a great biotechnological impact as they catalyze valuable reactions on a vast variety of substrates. However, very limited biotechnological application has been reported so far due to their functional complexity, limited stability (instability) and, in most cases, low catalytic activity. In this present review, we introduce some possibilities for improving their defect by exploring electron transport system and substrate flexibility in field of Streptomyces cytochrome P450.

A need of safety evaluation for product planning step (제품기획단계의 안전성 평가 필요성에 관한 연구)

  • Park, Ji-Yong;Cho, Am
    • Journal of the Korea Safety Management & Science
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    • v.10 no.1
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    • pp.23-31
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    • 2008
  • Recently, there is a rise of accident by some defective products, especially it reported that a serious fact is a defect of design causing some problem since execute a product liability(PL), people who use products have been able to bo remunerated for a damage to those defects, so responsibilities of companies are rising more and more. Therefore, companies that are obligated to manufacture a safety product, and should make preparation for PL. For solving the problem, even though manufacturers tried to make a safety product ay mixed ways, it is seldom that its safety is considered from planning a design. This thesis has suggested a way aimed at improving a safety of products through considering a stage of a plan, by searching and analyzing the design-process in to each steps.