• 제목/요약/키워드: defect engineering

검색결과 2,235건 처리시간 0.986초

Study on LC Aligning Capability by the UV Alignment Method on a-C:H Thin Films

  • Jo, Yong-Min;Park, Chang-Joon;Hwang, Jeoung-Yeon;Seo, Dae-Shik;Rho, Soon-Joon;Baik, Hong-Koo
    • 한국정보디스플레이학회:학술대회논문집
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    • 한국정보디스플레이학회 2003년도 International Meeting on Information Display
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    • pp.500-503
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    • 2003
  • We studied the nematic liquid crystal (NLC) aligning capabilities by the UV alignment method on a a-C:H thin film surface. A good LC alignment by UV exposure on the a-C.H thin film surface at 200 ${\AA}$ of layer thickness was achieved. Also, a good LC alignment by the UV alignment method on the a-C:H thin film surface was observed at annealing temperature of 180 $^{\circ}C$. However, the alignment defect of the NLC was observed above annealing temperature of 200 $^{\circ}C$. Consequently, the good thermal stability of LC alignment by the UV alignment method on the a-C:H thin film surface can be achieved.

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A Study of Protocol comparison Analysis for MPLS Traffic Engineering (MPLS 트래픽 엔지니어링을 위한 프로토콜 비교 분석에 관한 연구)

  • Ha, Yun-Sik;Kim, Dong-Il;Choi, Sam-Gil
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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    • 한국해양정보통신학회 2005년도 춘계종합학술대회
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    • pp.105-108
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    • 2005
  • To support abruptly increasing data traffic in these days. network management is needed. And also to maintain the steady infra, there is MPLS need which can support traffic engineering. It's necessary that MPLS doesn't only manage network to support recently booming data traffic, but has capacity to support traffic engineering to keep static infrastructure. Traffic engineering, method that a large-scale user shifts traffic to the beforehand designated routes that pass through specific nodes on network, is operation that is mapping traffic flow to the physical network topology. In this paper, we supplement the defect of the traditional RSVP traffic engineering and to construct far more steady infra, we suggest the way of its development of ERSVP signaling protocol.

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A Study on Electrical Accident of Distributing Cable Termination with Simulated Badness Construction (평가시공불량을 모의한 배전급 케이블 종단부의 전기적 사고 연구)

  • Choi, Jae-Hyeong;Choi, Jin-Wook;Kim, Sang-Hyun;Kim, Young-Seok;Kim, Sun-Gu;Baek, Seung-Myeong
    • Proceedings of the Korea Institute of Fire Science and Engineering Conference
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    • 한국화재소방학회 2008년도 추계학술논문발표회 논문집
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    • pp.465-470
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    • 2008
  • This paper introduces experimental investigates of an electrical accident of the distributing cable termination with simulated badness construction. We prepared two termination kites, one is built-up type, the other is heat contraction type. Also, we manufactured cable termination that have simulated defect by badness construction and measured their insulation characteristics such as ac (35kV, 1min) and impulse (95kV, $1.2{\times}50{\mu}s$) withstand test. The influence of defects such as thickness and the gap between stress-con of housing and semi-conductor on insulating properties of the termination have been studied. The thickness decrease of insulator decreases ac breakdown strength. Dielectric breakdown traces of insulator that is damaged by knife displayed other shape. The gap of between housing and semiconductor deteriorates dielectric strength of insulator seriously.

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Effect of Hydrogen Radicals for Ion Implanted CVD Diamond Using Remote Hydrogen Plasma Treatment(RHPT)

  • Won, Jaihyung;Hatta, Akimitsu;Yagi, Hiromasa;Wang, Chunlei;Jiang, Nan;Jeon, Hyeongmin;Deguehi, Masahiro;Kitabatake, Makoto;Ito, Toshimichi;Sasaki, Takatomo;Hiraki, Akio
    • The Korean Journal of Ceramics
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    • 제4권1호
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    • pp.15-19
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    • 1998
  • Defects formation of Chemical Vapor Deposition (CVD) diamond on $^4He^{2+}$ irradiation and after remote hydrogen plasma treatment(RHPT) were investigated by cathodoluminescence(CL). As calculated in the TRIM simulation, the light elements of $^4He^{2-}$ can be penetrated into the diamond bulk structure at 3~4 $\mu\textrm{m}$ depth. The effects of the implantation region were observed when 5 keV~20 keV electron energy (insight 0.3~4.0$\mu\textrm{m}$) of CL measurement was irradiated to diamond at temperature 80 K. After the RHPT, rehybridization of irradiation damaged diamond was studied. The intensity of 5RL center(intrinsic defect of C) was diminished. The 2.16 eV center (N-V center) occurring usually by annealing could not be seen after RHPT. The diamond was rehybridized by hydrogen radicals without etching and thermal degradation by the RHPT.

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Investigation of the Alignment Phenomena on the a-C:H Thin Films by PECVD System using Ion-beam Alignment Method

  • Park, Chang-Joon;Hwang, Jeoung-Yeon;Seo, Dae-Shik;Ahn, Han-Jin;Kim, Kyung-Chan;Baik, Hong-Koo
    • Transactions on Electrical and Electronic Materials
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    • 제5권1호
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    • pp.15-18
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    • 2004
  • We studied the nematic liquid crystal (NLC) aligning capabilities using the new alignment material of a-C:H thin film by plasma enhanced chemical vapor deposition (PECVD) system for 30 sec under 30W rf power at a gas pressure of 1.4*10$\^$-1/ torr. A high pretilt angle of about 5 by ion beam exposure on the a-C:H thin film surface was measured. A good LC alignment by the ion beam alignment method on the a-C:H thin film surface was observed at annealing temperature of 250$^{\circ}C$, and the alignment defect of NLC was observed above annealing temperature of 300$^{\circ}C$. Consequently, the high LC pretilt angle and the good thermal stability of LC alignment by the ion beam alignment method on the a-C:H thin film by PECVD method as working gas at 30W rf bias condition can be achieved.

Density control of ZnO nanorod arrays using ultrathin seed layer by atomic layer deposition

  • Shin, Seokyoon;Park, Joohyun;Lee, Juhyun;Choi, Hyeongsu;Park, Hyunwoo;Bang, Minwook;Lim, Kyungpil;Kim, Hyunjun;Jeon, Hyeongtag
    • Journal of Ceramic Processing Research
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    • 제19권5호
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    • pp.401-406
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    • 2018
  • We investigated the effect of ZnO seed layer thickness on the density of ZnO nanorod arrays. ZnO has been deposited using two distinct processes consisting of the seed layer deposition using ALD and subsequent hydrothermal ZnO growth. Due to the coexistence of the growth and dissociation during ZnO hydrothermal growth process on the seed layer, the thickness of seed layer plays a critical role in determining the nanorod growth and morphology. The optimized thickness resulted in the regular ZnO nanorod growth. Moreover, the introduction of ALD to form the seed layer facilitates the growth of the nanorods on ultrathin seed layer and enables the densification of nanorods with a narrow change in the seed layer thickness. This study demonstrates that ALD technique can produce densely packed, virtually defect-free, and highly uniform seed layers and two distinctive processes may form ZnO as the final product via the initial nucleation step consisting of the reaction between $Zn^{2+}$ ions from respective zinc precursors and $OH^-$ ions from $H_2O$.

Current-Voltage and Impedance Characteristics of ZnO-Zn2BiVO6-Co3O4 Varistor with Temperature (ZnO-Zn2BiVO6-Co3O4 바리스터의 전류-전압 및 임피던스의 온도)

  • Hong, Youn Woo;Kim, You Bi;Paik, Jong Hoo;Cho, Jeong Ho;Jeong, Young Hun;Yun, Ji Sun;Park, Woon Ik
    • Journal of Sensor Science and Technology
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    • 제25권6호
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    • pp.440-446
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    • 2016
  • This study introduces the characteristics of current-voltage (I-V) and impedance variance for $ZnO-Zn_2BiVO_6-Co_3O_4$ (ZZCo), which is sintered at $900^{\circ}C$, according to temperature changes. ZZCo varistor demonstrates dramatic improvement of non-linear coefficient, ${\alpha}=66$, with lower leakage current and higher insulating resistivity than those of ZZ ($ZnO-Zn_2BiVO_6$) from the aspect of I-V curves. While both systems are thermally stable up to $125^{\circ}C$, ZZCo represents a higher grain boundary activation energy with 1.05 eV and 0.94 eV of J-E-T and from IS & MS, respectively, than that of ZZ with 0.73 eV and 0.82 eV of J-E-T and from IS & MS, respectively, in the region above $180^{\circ}C$. It could be attributed to the formation of $V^*_o$(0.41~0.47 eV) as dominant defect in two systems, as well as the defect-induced capacitance increase from 781 pF to 1 nF in accordance with increasing temperature. On the other hand, both the grain boundary capacitances of ZZ and ZZCo are shown to decrease to 357 pF and 349 pF, respectively, while the resistances systems decreased exponentially, in accordance with increasing temperature. So, this paper suggests that the application of newly formed liquid phases as sintering additives in both $Zn_2BiVO_6$ and the ZZCo-based varistors would be helpful in developing commercialized devices such as chips, disk-type ZnO varistors in the future.

Electrical Properties for Enhanced Band Offset and Tunneling with a-SiOx:H/a-si Structure (a-SiOx:H/c-Si 구조를 통한 향상된 밴드 오프셋과 터널링에 대한 전기적 특성 고찰)

  • Kim, Hongrae;Pham, Duy phong;Oh, Donghyun;Park, Somin;Rabelo, Matheus;Kim, Youngkuk;Yi, Junsin
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • 제34권4호
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    • pp.251-255
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    • 2021
  • a-Si is commonly considered as a primary candidate for the formation of passivation layer in heterojunction (HIT) solar cells. However, there are some problems when using this material such as significant losses due to recombination and parasitic absorption. To reduce these problems, a wide bandgap material is needed. A wide bandgap has a positive influence on effective transmittance, reduction of the parasitic absorption, and prevention of unnecessary epitaxial growth. In this paper, the adoption of a-SiOx:H as the intrinsic layer was discussed. To increase lifetime and conductivity, oxygen concentration control is crucial because it is correlated with the thickness, bonding defect, interface density (Dit), and band offset. A thick oxygen-rich layer causes the lifetime and the implied open-circuit voltage to drop. Furthermore the thicker the layer gets, the more free hydrogen atoms are etched in thin films, which worsens the passivation quality and the efficiency of solar cells. Previous studies revealed that the lifetime and the implied voltage decreased when the a-SiOx thickness went beyond around 9 nm. In addition to this, oxygen acted as a defect in the intrinsic layer. The Dit increased up to an oxygen rate on the order of 8%. Beyond 8%, the Dit was constant. By controlling the oxygen concentration properly and achieving a thin layer, high-efficiency HIT solar cells can be fabricated.

Synthesis and enhancements of exciton-phonon interactions for ZnO nanopencils by thermal evaporation (ZnO nanopencils의 합성과 향상된 exciton-phonon interactions)

  • Ahn, C.H.;Woo, C.H.;Bae, Y.S.;Choi, M.K.;Kim, Y.Y.;Kim, D.C.;Kong, B.H.;Cho, H.K.
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 한국전기전자재료학회 2009년도 하계학술대회 논문집
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    • pp.45-45
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    • 2009
  • 우리는 ZnO Template를 사용한 열기상법을 이용하여 수직 배양한 ZnO nanorods와 ZnO Nanopencils를 성장하였고, Dependency temperature Photoluminescence(PL)의 분석을 통하여 광학적 특성에 대해 분석을 하였다. ZnO 나노구조는 100K 이하의 온도에서 donor-bound exciton가 dominant하고, 100K 이상의 온도에서는 free exciton과 그들의 phonon-replica emission이 dominant한 것을 알 수 있었다. 하지만, ZnO nanorods와 nanopencils은 다른 exciton-phonon coupling의 strength에 의한 surface defects에 의해 excitonic emissions의 다른 거동을 보이는 것을 알았다. 이것으로 인해 상온 PL에서 ZnO nanopencil은 nanorods에 비해 52meV의 red shift를 보였다.

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