• 한국정밀공학회지
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• 제21권10호
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• pp.102-108
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• 2004

In this paper, we studied a vibration problem that is critical and common to most precision measurement systems. For micro mechanical part measurements, results obtained from the vision-based precision measurement system may contain errors due to the vibration. In order to defeat this generic problem, for the current study, a PC based image processing technique was used first, to assess the effect of the vibration to the precision measurement and second, to develop an in-situ calibration algorithm that automatically compensate the measurement results in real time. We used a set of stereoscopic CCD cameras to acquire the images for the dimensional measurement and the reference measurement. The mapping function was obtained through the in-situ calibration to compensate the measurement results and the statistical analysis for the actual results is provided in the paper. Based on the current statistical study, it is expected to obtain high precision results for the micro measurement systems.

• Progress in Superconductivity
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• 제11권2호
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• pp.128-134
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• 2010

The magnetic flux profiles in SmBCO and YBCO coated conductors(CC) in the presence of the external field were comparatively investigated by magneto-optic image and scanning hall probe measurements. The current distributions calculated by using the inversion method from measured field profiles show that the decrease of current densities near the edges of SmBCO CC is more significant than those of YBCO CC. Through the comparison of the numerical analysis based on Kim's critical state model and the Brandt and Indenbom's solution, we found that this feature is related to their different field dependant properties of the critical current densities.

• Current Optics and Photonics
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• 제2권2호
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• pp.153-164
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• 2018

In semiconductor manufacturing, critical dimensions indicate the features of patterns formed by the semiconductor process. The purpose of measuring critical dimensions is to confirm whether patterns are made as intended. The deposition process for an organic light emitting diode (OLED) forms a luminous organic layer on the thin-film transistor electrode. The position of this organic layer greatly affects the luminescent performance of an OLED. Thus, a system for measuring the position of the organic layer from outside of the vacuum chamber in real-time is desired for monitoring the deposition process. Typically, imaging from large stand-off distances results in low spatial resolution because of diffraction blur, and it is difficult to attain an adequate industrial-level measurement. The proposed method offers a new superresolution single-image using a conversion formula between two different optical systems obtained by a deep learning technique. This formula converts an image measured at long distance and with low-resolution optics into one image as if it were measured with high-resolution optics. The performance of this method is evaluated with various samples in terms of spatial resolution and measurement performance.

• 한국전기전자재료학회논문지
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• 제11권4호
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• pp.327-333
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• 1998

The influence of slow cooling and annealing time in $O_2$in MPEG process on $J_c$ was investigated. From the measurement of $J_c$,SEM and XRD, it was observed that the critical current density was related with the slow cooling time and annealing time in $O_2$. The value of $J_c$ was the highest at slow cooling time of 40 hour. And also, the value of $J_c$ along the annealing time in $O_2$in the case of the slow cooling time of 40 hours was inclined to increase with annealing time. Consequently, it can be suggested that proper slow cooling time and annealing time after slow cooling in MPMG process be important to improve the critical characteristics.

• 한국초전도ㆍ저온공학회논문지
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• 제5권1호
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• pp.123-127
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• 2003

For disseminating a ney IEC international standard of critical trmperature of NbTi,Nb$_3$Sn and Bi-2223 Composite Suterconductors, we develpted a measuring system and studied standardization of test method. The measuring system consisted of cryogenic reservoir, base plate, thermometer, voltmeter and current source. Various specimens of the Nbti, Nb$_3$Sn and Bi-2223 composite superconductors were tested using this system for measuring their critical temperatures. After measuring the resistance-temperature relation, the data were compensated with thermoelectric voltages for NbTi Nb$_3$Sn specimens. NbTi specimens showed 9.2 K ~ 9.5 K of transition temperature and Nb$_3$Sn specimen showed about 18 K. Bi-2223 specimens showed 104 K ~ 107 K of transition temperature.

• 한국초전도저온공학회:학술대회논문집
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• 한국초전도저온공학회 2003년도 학술대회 논문집
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• pp.85-87
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• 2003

Intermediate annealing was carried out during wire drawing for uniform deformation of 500 m class Bi-2223/Ag HTS tapes. Wire drawing force was measured to evaluate the uniformity of wire deformation along the length. To prevent sausage and filament breakage of wire, drawing stress was controlled below 200 MPa by using intermediate annealing process. Thickness and width of the rolled tapes was measured 0.23 mm and 4.1 mm with low deviation $\pm$ 0.08 mm and $\pm$ 0.09 mm, respectively. The critical current of the 500 m tapes was measured 33.7 A $\pm$ 3.7 A by continuous critical current measurement system.

• 한국초전도ㆍ저온공학회논문지
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• 제12권1호
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• pp.12-16
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• 2010

Critical current - magnetic field ($I_c$-B) relation is one of the basic properties of an HTS wire, which is needed for the design of performances of superconducting devices. Experimental results of the $I_c$-B relation of Bi-2223 and YBCO superconducting wire are presented in this paper. n-value is also an important parameter which is needed to calculate the electric field by using the power-law. Measurement results of the n-value of the same HTS superconducting wires are also presented.

• 한국전기전자재료학회논문지
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• 제20권7호
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• pp.626-630
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• 2007

The AC loss is an important issue in the design of the high temperature superconductor (HTS) power cables and fault current limiters. In these applications, a cylindrical HTS conductor is often used. In commercialization of these apparatuses, AC loss is a critical factor but not elucidated completely because of complexities in its measurement, e.g. non-uniform current distribution and phase difference between currents flowing in an individual HTS tape. We have prepared two cylindrical conductors composed of a Bi-2223 tape with different critical current density. In this paper, the AC loss characteristics of the conductors have been experimentally investigated and numerically analyzed. The result show that the measured losses for two conductors are not dependent on both arrangements and contact positions of a voltage lead. This implies that most of loss flux is only in the conductors. The loss for the Bi-2223 conductor with low critical current density is in good agreement with the calculated loss from Monoblock model, whereas the loss measured for the Bi-2223 conductor with high critical current density doesn't coincide with the loss calculated from the Monoblock model. The measured loss is also different from numerically calculated one based on the polygon model especially in low transport current.

• 한국초전도ㆍ저온공학회논문지
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• 제7권3호
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• pp.29-33
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• 2005

Critical current$(I_c)$ degradation of High $T_c$ Superconducting(HTS) tapes and AC loss under mechanical load is one of the hottest issues in HTS development and application. Mechanical load reduces the critical current of superconducting wire, and the $I_c$ degradation affects the AC loss of the wire. We measured the $I_c$ degradation and AC loss under tension and bending of Bi-2223 tapes made by 'Powder-in-Tube' technique at 77K with self-field. Also, we have studied the frequency characteristics on self-field AC loss in multi-filamentary Bi-2223/Ag tape at 77K. The measurement results and discussions on the relationship between $I_c$ degradation and AC loss are presented.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2005년도 하계학술대회 논문집 Vol.6
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• pp.286-287
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• 2005

Critical current(Ic) degradation of HTS tapes and AC loss under mechanical load is one of the hottest issues in HTS development and application. Mechanical load reduces the critical current of superconducting wire, and the Ie degradation affects the AC loss of the wire. We measured the Ie degradation and AC loss under tension and bending of Bi-2223 tapes processed by "Powder-in-Tube" technique at 17K with self-field. And we have studied the frequency dependence of self-field AC loss in multi-filamentary Bi-2223/Ag tape at 77K. The measurement results and discussions on the relationship between Ic degradation and AC loss are presented.