Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference (한국전기전자재료학회:학술대회논문집)
- 2005.07a
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- Pages.286-287
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- 2005
Ac Loss Characteristics under Critical Current Degradation of HTS Tapes
고온 초전도체의 임계전류 저하에 따른 교류 손실 특성
- Kim, Hae-Joon (Korea Electrotechnology Research Institute) ;
- Kim, Jae-Ho (Korea Electrotechnology Research Institute) ;
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Sim, Ki-Deok
(Korea Electrotechnology Research Institute) ;
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Cho, Jeon-Wook
(Korea Electrotechnology Research Institute) ;
- Kwag, Dong-Soon (Korea Electrotechnology Research Institute) ;
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Kim, Hae-Jong
(Korea Electrotechnology Research Institute) ;
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Seong, Ki-Chul
(Korea Electrotechnology Research Institute)
- 김해준 (한국전기연구원) ;
- 김재호 (한국전기연구원) ;
-
심기덕
(한국전기연구원) ;
-
조전욱
(한국전기연구원) ;
- 곽동순 (한국전기연구원) ;
-
김해종
(한국전기연구원) ;
-
성기철
(한국전기연구원)
- Published : 2005.07.07
Abstract
Critical current(Ic) degradation of HTS tapes and AC loss under mechanical load is one of the hottest issues in HTS development and application. Mechanical load reduces the critical current of superconducting wire, and the Ie degradation affects the AC loss of the wire. We measured the Ie degradation and AC loss under tension and bending of Bi-2223 tapes processed by "Powder-in-Tube" technique at 17K with self-field. And we have studied the frequency dependence of self-field AC loss in multi-filamentary Bi-2223/Ag tape at 77K. The measurement results and discussions on the relationship between Ic degradation and AC loss are presented.