• Title/Summary/Keyword: coefficient of thermal expansion(CTE)

Search Result 158, Processing Time 0.026 seconds

Characterization of crystal phase evolution in cordierite honeycomb for diesel particulate filter by using rietveld refinement and SEM-EDS methods (Rietveld 정밀화법과 SEM-EDS 분석에 의한 DPF용 코디어라이트 하니컴 세라믹스의 결정성장 과정 분석)

  • Chae, Ki-Woong;Kim, Kang San;Kim, Jeong Seog;Kim, Shin-Han
    • Journal of the Korean Crystal Growth and Crystal Technology
    • /
    • v.31 no.3
    • /
    • pp.116-126
    • /
    • 2021
  • Diesel particulate filter (DPF) is a typical application field of cordierite (Mg2Al4Si5O18) honeycomb. Green body for DPF honeycomb was extruded using slurry paste and sintered at the temperature range of 980~1450℃. Quantitative crystal phase analysis was carried out by using Rietveld refinement method for powder XRD data. In conjunction with the quantitative Rietveld analysis, SEM-EDS analysis was carried for the crystal phases (indialite, cordierite, cristobalite, alumina, spinel, mullite, pro-enstatite). After removing amorphous phase on the sintered surfaces by chemical etching method, the shape and composition of the crystal phases can be clearly identified by SEM-EDS method. By combining the Rietveld refinement method and SEM-EDS analysis, crystal phase evolution process in DPF cordierite ceramics could be clarified. In addition, the coefficient of thermal expansion (CTE) of the DPF honeycombs were measured and compared with the calculated CTEs based on the quantitative crystal phase analysis results.

Ultra High Conductivity Diamond Composites

  • Bollina, Ravi;Stoiber, Monika
    • Proceedings of the Korean Powder Metallurgy Institute Conference
    • /
    • 2006.09b
    • /
    • pp.922-923
    • /
    • 2006
  • Thermal management is one of the critical aspects in the design of highly integrated microelectronic devices. The reliability of electronic components is limited not only to operating temperature but also by the thermal stresses caused during the operation. The need for higher power densities calls for use of advanced heat spreader materials. A copper diamond composite has been developed with high thermal conductivity $(\lambda)$ and tailorable coefficient of thermal expansion (CTE). Copper diamond composites are processed via gas pressure assisted infiltration with different copper alloys. Emphasis has been placed on the addition of trace elements in deisgning the copper alloys to facilitate a compromise between thermal conductivity and mechanical adhesion. The interfaces between the alloy and the diamond are related to the thermal properties of these copper composites.

  • PDF

Development of a New Sealing Material for PDP

  • Kim, Yu-Jin;Kim, Hyung-Sun
    • 한국정보디스플레이학회:학술대회논문집
    • /
    • 2005.07b
    • /
    • pp.1245-1247
    • /
    • 2005
  • Glass frit was selected to be a $Bi_2O_3-RO-R_2O_3$ system as a sealing material to replace the current PbO system in PDP. Fillers such as a zircon, cordierite and ${\beta}-eucryptite$ were added for the control of thermal expansion coefficient (CTE), flowability and strength for sealing. At $450-500^{\circ}C$, reaction of frit and filler and interface were evaluated by a flow button test and SEM observation. The composite (frit and filler) showed CTE in the range of 70-83 x $10^{-7}/K$ and flowability of 14-20mm. It can be a candidate for the replacement of PbO system.

  • PDF

FLIP CHIP ON ORGANIC BOARD TECHNOLOGY USING MODIFIED ANISOTROPIC CONDUCTIVE FILMS AND ELECTROLESS NICKEL/GOLD BUMP

  • Yim, Myung-Jin;Jeon, Young-Doo;Paik, Kyung-Wook
    • Journal of the Microelectronics and Packaging Society
    • /
    • v.6 no.2
    • /
    • pp.13-21
    • /
    • 1999
  • Flip chip assembly directly on organic boards offers miniaturization of package size as well as reduction in interconnection distances resulting in a high performance and cost-competitive Packaging method. This paper describes the investigation of alternative low cost flip-chip mounting processes using electroless Ni/Au bump and anisotropic conductive adhesives/films as an interconnection material on organic boards such as FR-4. As bumps for flip chip, electroless Ni/Au plating was performed and characterized in mechanical and metallurgical point of view. Effect of annealing on Ni bump characteristics informed that the formation of crystalline nickel with $Ni_3$P precipitation above $300^{\circ}C$ causes an increase of hardness and an increase of the intrinsic stress resulting in a reliability limitation. As an interconnection material, modified ACFs composed of nickel conductive fillers for electrical conductor and non-conductive inorganic fillers for modification of film properties such as coefficient of thermal expansion(CTE) and tensile strength were formulated for improved electrical and mechanical properties of ACF interconnection. The thermal fatigue life of ACA/F flip chip on organic board limited by the thermal expansion mismatch between the chip and the board could be increased by a modified ACA/F. Three ACF materials with different CTE values were prepared and bonded between Si chip and FR-4 board for the thermal strain measurement using moire interferometry. The thermal strain of ACF interconnection layer induced by temperature excursion of $80^{\circ}C$ was decreased with decreasing CTEs of ACF materials.

  • PDF

A Semi-analytical Approach for Numerical Analysis of Residual Stress in Oxide Scale Grown on Hot-rolled Steels (열간압연강에서 형성된 산화물 스케일의 잔류 응력 수치 분석을 위한 준해석적 방법 개발)

  • Y.-J. Jun;J.-G. Yoon;J.-M. Lee;S.-H. Kim;Y.-C. Kim;S. Nam;W. Noh
    • Transactions of Materials Processing
    • /
    • v.33 no.3
    • /
    • pp.200-207
    • /
    • 2024
  • In this study, we developed a semi-analytical approach for the numerical analysis of residual stress in oxide scales formed on hot-rolled steels. The oxide scale, formed during the hot rolling process, experiences complex interactions due to thermal and mechanical influences, significantly affecting the material's integrity and performance. Our research focuses on integrating various stress components such as thermal stress, growth stress, and creep behavior to predict the residual stress within the oxide layer. The semi-analytical method combines analytical expressions for each stress component with numerical integration to account for their cumulative effects. Validation through instrumented indentation tests confirms the reliability of our model, which considers thermal expansion coefficient (CTE) differences, scale growth, and creep-induced stress relaxation. Our findings indicate that thermal stress resulting from CTE differences significantly impacts the overall residual stress, with growth stress contributing a compressive component during cooling, and creep behavior playing a minor role in stress relaxation. This comprehensive approach enhances the accuracy of residual stress prediction, facilitating the optimization of material design and processing conditions for hot-rolled steel products.

Synthesis and Characterization of 4-Component Polyimide Films with Various Diamine and Dianhydride Compositions (다양한 조성 변화에 따른 4성분계 폴리이미드 필름 제조와 물성분석)

  • Park, Yun Jun;Yu, Duk Man;Choi, Jong Ho;Ahn, Jeong-Ho;Hong, Young Taik
    • Applied Chemistry for Engineering
    • /
    • v.22 no.6
    • /
    • pp.623-626
    • /
    • 2011
  • Various poly(amic acid)s were synthesized from PMDA/BPDA/p-PDA/ODA with different mole ratios and effectively converted into 4-component polyimide films by thermal imidization. The chemical structures and thermo-mechanical properties of polyimide films were examined using Fourier transform infrared spectroscopy (FT-IR), thermo-gravimetric analyzer (TGA), thermo-mechanical analyzer (TMA), dynamic mechanical analyzer (DMA) and universal tensile machine (UTM). The tensile strength, modulus, and thermal properties of polyimides films increased with the amount of rigid PMDA and p-PDA, while the elongation and moisture absorption of polyimide films increased with the amount of flexible BPDA and ODA. One of 4-component polyimide films exhibited a similar coefficient of thermal expansion (CTE) value to that of copper when it was composed of PMDA : BPDA : p-PDA : ODA with the ratio of 5 : 5 : 4 : 6. Thus, this polyimide film could be useful for a base film for flexible copper clad laminates (FCCL) of flexible printed circuit boards.

Effect of Inorganic Fillers on the Dimensional Stability of Poly(ethylene naphthalate) Film as a Flexible Substrate (무기 필러가 유연기판용 폴리에틸렌나프탈레이트 필름 치수안정성에 미치는 영향)

  • Kim, Jongwha;Kim, Hongsuk;Kang, Ho-Jong
    • Polymer(Korea)
    • /
    • v.36 no.6
    • /
    • pp.733-738
    • /
    • 2012
  • The effect of glass bead and glass fiber on the enhancement of dimensional stability in poly(ethylene naphthalate) (PEN) flexible substrate for photovoltaic devices has been studied. It was found that the coefficient of thermal expansion (CTE) and the optical transmittance decreased with increasing inorganic filler content. In addition to filler contents, the size and size distribution of fillers are the other important factors to improve CTE and optical transmittance of PEN film. Our results showed that the optimum filler content was found to be about 5 wt% to enhance the dimensional stability of PEN by more than 50% with maintaining the optical transmittance over 85% for the flexible substrate.

Synthesis of P2O5-V2O5-ZnO Glass Frit for Laser Sealing of OLED by the Addition of Filler (필러 첨가에 의한 OLED의 레이저 실링용 P2O5-V2O5-ZnO 유리프릿의 제조)

  • Bang, Jae-Chul
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
    • /
    • v.28 no.9
    • /
    • pp.571-576
    • /
    • 2015
  • In this study, we developed a lead-free $P_2O_5-V_2O_5-ZnO$ glass frit for sealing OLED using laser irradiation. The frit satisfied the characteristics required for laser sealing such as low glass transition temperature, low coefficient of thermal expansion (CTE), high water-resistance, and high absorption at the wavelength of the laser beam. Ceramic fillers were added to the glass frit in order to further reduce and match its CTE with that of the commercial glass substrate. The addition of Zirconium Tungsten Phosphate (ZWP) to the frit yielded the most desirable results, reducing the CTE to $45.4{\times}10^{-7}/^{\circ}C$, which is very close to that of the glass substrate ($44.0{\times}10^{-7}/^{\circ}C$). Successful formation of a solid sealing layer was observed by optical and scanning electron microscopy.

The Effect of Finite Element Models in Thermal Analysis of Electronic Packages (반도체 패키지의 열변형 해석 시 유한요소 모델의 영향)

  • Choi, Nam-Jin;Joo, Jin-Won
    • Transactions of the Korean Society of Mechanical Engineers A
    • /
    • v.33 no.4
    • /
    • pp.380-387
    • /
    • 2009
  • The reliability concerns of solder interconnections in flip chip PBGA packages are produced mainly by the mismatch of coefficient of thermal expansion(CTE) between the module and PCB. Finite element analysis has been employed extensively to simulate thermal loading for solder joint reliability and deformation of packages in electronic packages. The objective of this paper is to study the thermo-mechanical behavior of FC-PBGA package assemblies subjected to temperature change, with an emphasis on the effect of the finite element model, material models and temperature conditions. Numerical results are compared with the experimental results by using $moir{\acute{e}}$ interferometry. Result shows that the bending displacements of the chip calculated by the finite element analysis with viscoplastic material model is in good agreement with those by $moir{\acute{e}}$ inteferometry.

The Effect of Encapsulation Layer Incorporated into Polymer Substrates for Bending Stress (고분자 기판의 휨 스트레스에 대한 Encapsulation층의 효과)

  • 박준백;서대식;이상극;이준웅;김영훈;문대규;한정인
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
    • /
    • v.17 no.4
    • /
    • pp.443-447
    • /
    • 2004
  • In this study, we investigated the necessity of encapsulation layer to maximize flexibility of brittle indium-tin-oxide (ITO) on polymer substrates. And, Young's modulus (E) of encapsulation layer han a significant effect on external bending stress and the coefficient of thermal expansion (CTE) of that han a significant effect on internal thermal stress. To compare the magnitude of total mechanical stress including both bending stress and thermal stress, the mechanical stress of triple-layer structure (substrate / ITO / encapsulation layer or substrate / buffer layer / ITO) can be quantified and numerically analyzed through the farthest cracked island position. As a result, it should be noted that multi-layer structures with more elastic encapsulation material have small mechanical stress compared to that of buffer and encapsulation structure of large Young's modulus material when they were externally bent.