• Title/Summary/Keyword: breakdown structure

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On the Development of Preventive Electrical Safety Plan Using Operation Concept Document (시스템 운용 개념서 활용을 통한 예방적 전기안전 계획서 개발에 관한 연구)

  • Lee, Byoung-Gil;Lee, Jae-Chon;Shin, Heung-Sik
    • Journal of the Korea Safety Management & Science
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    • v.10 no.4
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    • pp.73-81
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    • 2008
  • The current electrical safety plan developed for the national electricity system has been playing an important role in handling a variety of electrical accidents. However, it can be more effective to prevent or reduce those accidents if a preventive electrical safety plan is available. In this paper, an approach to developing the safety plan is described. We first discuss the contents that should be included in the plan. Noting that an effective plan requires the system level consideration of all the factors affecting the safety issues, an operation concept document (OCD) is considered. The OCD can allow us to understand the behavior of the safety system based on the operation environment, the system functions, the performance requirements, all at the system level of the safety system. Thus, the OCD can be useful in developing the safety plan. A detailed description then follows on how the OCD is developed for the electrical safety system under study. Finally, we discuss how the developed OCD can be used in deriving the preventive electrical safety plan.

First report on Gonyaulax polygramma (Gonyaulacales, Dinophyceae) blooms in the Yeosu waters of the South Sea of Korea

  • Cho Eun-Seob
    • Journal of Environmental Science International
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    • v.14 no.7
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    • pp.639-647
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    • 2005
  • The aim of this study is to determine the outbreaks of nontoxic Gonyaulax polygramma Stein in Yeosu waters in place of harmful Cochlodinium polykrikoides Margalef, which has occurred annually in the same region since 1995. The observation of cellular arrangement and structure by electron microscopy showed that G. polygramma isolated from Yeosu waters had a few spines connecting with membranes and prominent longitudinal ridges on the cell surface, with a cingular displacement 1.5 times their cell width. Furthermore, the location of the nucleus was posterior of large oval formation according to electron microscopy. On 6 August, 2004, the first bloom of G. polygramma occurred, the date of its disappearance was with a maximum cell density of 8,000 cells $ml^{-1}$ on 21 August, 2004. During the period of this study, the horizontal distribution of sea water temperature and salinity showed a strong coastal front, whereas the front of DIN (Dissolved Inorganic Nitrogen) was significantly different between the occurrence and disappearance of G. polygramma blooms. These results suggested that the process of the breakdown of stratification by wind and a low level of inorganic nitrogen play important roles in the rapid growth of G. polygramma, which is associated with a greater robustness in growth against DIN than that of C. polykrikoides in nature.

Multidimensional ZnO light-emitting diode structures grown by metal organic chemical vapor deposition on p-Si (p형 Si 기판위에 성장된 ZnO 다층형복합구조의 이종접합구조 LED 제작)

  • Kim, Dong-Chan;Kong, Bo-Hyun;Han, Won-Suk;Choi, Mi-Kyung;Cho, Hyung-Koun;Lee, Jong-Hun;Kim, Hong-Seung
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2008.06a
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    • pp.84-84
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    • 2008
  • A multidimensional ZnO light-emitting diode LEDstructure comprising film/nanorods/substrate was fabricated on a p-type Si substrate using metal organic chemical vapor deposition at relatively low growth temperature. The filmlike top layer used for the metal contact was continuously formed on the ZnO nanorods by varying the growth conditions and the resulting structure allowed us to utilize the nanorods with intense emission as an active layer. We investigated the performance of the resulting multidimensional LED. An extremely high breakdown voltage and low reverse leakage current as well as typical rectification behavior were observed in the I-V characteristics.

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A study on the development on project scope management module using rule and case-based reasoning (규칙과 사례기반추론 기법을 이용한 프로젝트 범위관리 모듈 개발에 관한 연구)

  • Shin, Ho-Kun;Jeon, Sung-Ho;Kim, Chang-Ho
    • The Journal of Information Technology
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    • v.7 no.3
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    • pp.127-137
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    • 2004
  • A Project planning is one of the most important processes that determines success and failure of a project. Scope management for a project planning is also essential job in system integration project. However project planning is very difficult because lots of factors and their relationships should be considered. Therefore project planning of system integration project has been done by project manager's own knowledge and experience. It is necessary to develop an algorithm of WBS(Work Breakdown Structure) identification & document selection along to project's specificity in project management system using AI technique. This study presents a methodology to cope with the limitations of the existing studies that have uniformly been customizing the methodology by only project complexity. We propose PPSM(Project planning support module) based on determination rules regarding route maps and document levels, and CBR(Case-Based Reasoning) for WBS identification.

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Breakdown Voltage and Electrical Characteristics of Organic Thin Film (유기박막의 파괴전압과 전기특성)

  • Song, Jin-Won;Kang, Yong-Chul;Kim, Hyung-Gon;Lee, Woo-Sun;Chung, Hun-Sang;Chang, Hee-Dong;Lee, Kyung-Sup
    • Proceedings of the KIEE Conference
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    • 2000.07c
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    • pp.1497-1499
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    • 2000
  • We give pressure stimulation into organic thin films and then manufacture a device under the accumulation condition that the state surface pressure is 30 [mN/m]. LB layers of Arac. acid deposited by LB method were deposited onto y-type silicon wafer as y-type film. In processing of a device manufacture. we can see the process is good from the change of a surface pressure for organic thin films and transfer ratio of area per molecule. The structure of manufactured device is Au/arachidic acid/Al. the number of accumulated layers are 9$\sim$21. Also. we then examined of the MIM device by means of I-V. The I-V characteristic of the device is measured from -3 to +3[V]. The insulation property of a thin film is better as the distance between electrodes is larger.

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Reliability of N/O($SiO_2$/$Si_3$$N_4$) Films According to Top Oxidation Condition (상부산화 조건에 따른 N/O($SiO_2$/$Si_3$$N_4$) 구조막의 신뢰성 평가)

  • 구경완;홍봉식
    • Journal of the Korean Institute of Telematics and Electronics A
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    • v.29A no.9
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    • pp.20-28
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    • 1992
  • Dielectric thin film of N/O ($Si_{3]N_{4}/SiO_{2}$) for high density stacked dynamic-RAM cell was formed by LPCVD and oxidation(dry & pyrogenic oxidation methods) of the top 7nm $Si_{3]N_{4}$ film. The thickness, structure and composition of this film were measured by ellipsometer, high resolution TEM, AES and SIMS. The insulating characteristics(I-V characteristics) were investigated by HP 4145, and the characteristics of TDDB (Time Dependent Dielectric Breakdown) were evaluated by using CCST(Current Constant Stress Time) method. In this experiment, The optimum oxidation condition for preparation of good insulating and TDDB characteristics of N/O film was pyrogenic oxidation at 85$0^{\circ}C$ for 30 minutes. The leakage current was reduced from 400pA to 7.5pA when SiO$_{2}$ film with thickness of 2nm was formed on the top of $Si_{3]N_{4}$ film by the pyrogenic oxidation method.

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Mixed-Mode Transient Analysis of HBM ESD Phenomena (HBM ESD 현상의 혼합모드 과도해석)

  • Choe, Jin-Yeong;Song, Gwang-Seop
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.38 no.1
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    • pp.1-12
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    • 2001
  • Based on mixed-mode transient analyses utilizing a 2-dimensional device simulator, we have suggested the methodology to analyze the HBM ESD phenomena in CMOS chips utilizing NMOS transistors for ESD protection, and have analyzes the HBM discharge mechanisms in detail. Also the second breakdown characteristics in the protection device have been successfully simulated based on mixed-mode simulations, to explain the discharge mechanisms leading to device failure. To analyze the effects of the device structure changes on the discharge characteristics, we have compared the results of DC analyses and mixed-mode transient analyses, and have discussed about more robust designs of NMOS transistor structures against HBM ESD based on the analyses.

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A Study on developing WBS based QDBS(Quantity Database System) for the schedule and the cost data integration for road construction project (도로공사의 공정 및 공사비 연계활용을 위한 디지털 수량산출정보시스템(QDBS) 개발 연구)

  • Yun, Seok-Heon;Kim, Seong-Sig
    • Korean Journal of Construction Engineering and Management
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    • v.8 no.4
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    • pp.119-127
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    • 2007
  • Cost and Schedule is the most important information, and how efficiently manage this information is the key issue for Construction Project Management. Domestically, systematic scheduling method such as CPM network is not only used widely but integration of time and cost information also is. In order to effectively integrate and use the time and cost information, it is suggested that WBS(Work Breakdown Structure) based QDB(Quantity Database) should be generated from the design phase and, WBS and QDB related system tool should be supported. It could be helpful to relate and integrate other construction project information.

Fabrication and Properties of GaAs-MIS Capacitor using $SF_6$ Plasma Discharge ($SF_6$ 플라즈마 방전을 이용한 G3AS-MIS 커패시터의 제작 밑 특성)

  • 이남열;정순원;김광호;유병곤;이원재;유인규;양일석
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 1999.11a
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    • pp.29-32
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    • 1999
  • $GaF_3$ films were directly grown on p' and p-type GaAs(100) substrates using a $SF_6$ plasma discharge system. GaAs MIS(Meta1-Insulator-Semiconductor) capacitor was successfully fabricated for about 1 hour at temperature $290^{\circ}C$ using the as-grown $GaF_3$ films. The as-grown films on p'-GaAs exhibited a current density of less than 6.68 $\times$ $1O^{-9}$ A/$cm^2$ at a breakdown field of 500kV/cm and a refractive index of 2.0 ~ 2.3 at a wavelength of 632.8 nm. The dielectric constant was about 5 derived from 1 MHz capacitance-voltage (C-V) measurements. Dielectric dispersion of the fluoridated films on p'-GaAs measured ranged from 100 Hz to 10 MHz was not observed.

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The Reaction of Internal Electrodes with Bi$_2$O$_3$ in Multilayer ZnO Varistor (적층형 ZnO바리스터의 내부전극과 Bi$_2$O$_3$ 와의 반응)

  • Kim, Young-Jung;Kim, Hwan;Hong, Kook-Sun;Lee, Jong-Kook
    • Journal of the Korean Ceramic Society
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    • v.35 no.11
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    • pp.1121-1129
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    • 1998
  • Reactions between Ag-Pd internal electrode materials and{{{{ { {Bi }_{2 }O }_{3 } }} in multilayer chip varistor were in-vestigated. For more than 1 mol%{{{{ { {Bi }_{2 }O }_{3 } }} in varistor composition internal electrode structure was destroyed due to the reaction between internal electrode and{{{{ { {Bi }_{2 }O }_{3 } }} But for typical varistor compositions (below 1 mol% of{{{{ { {Bi }_{2 }O }_{3 } }} content) microstructural changes around the internal electrode were not observed. However SEM-EDS and TEM-EDS analysis showed the uneven distribution of{{{{ { {Bi }_{2 }O }_{3 } }} in the internal electrode which was due to the migration of{{{{ { {Bi }_{2 }O }_{3 } }} to the electorde during sintering. As a results the nonlinear coefficient of multilayer varistor showed very large distribution as well as the breakdown voltage.

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