• Title/Summary/Keyword: barrier films

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Fabrication of edible gelatin-based films by heat pressing (열 압착을 이용한 가식성 젤라틴 필름 제조)

  • Kim, Eui Hyun;Song, Ah Young;Min, Sea Cheol
    • Korean Journal of Food Science and Technology
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    • v.54 no.2
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    • pp.179-184
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    • 2022
  • In this study, edible films made of fish and mammalian gelatins were produced using heat pressing, and their physical properties were investigated. Transparent and smooth films were formed continuously and uniformly using a mixture of fish skin gelatin (FG) or mammalian gelatin (MG), glycerol, and water under the process of heat pressing at 90℃ and 20 MPa for 5 min. Heat-pressed FG films possessed lower light transmittance and tensile strength than heat-pressed MG films; however, their appearance, surface morphology, water vapor permeability, lightness, and redness were not different from those of heat-pressed MG films. Although heat-pressed FG films had lower tensile strength, they had a flatter and more uniform surfaces and demonstrated higher transparency and moisture barrier properties compared to the casted FG films. These results demonstrate the potential utility of heat pressing for the large-scale production of edible films using both FG and MG.

Effect of zinc oxide nanoparticle types on the structural, mechanical and antibacterial properties of carrageenan-based composite films (산화아연 나노입자 유형이 카라기난 기반 복합 필름의 구조, 기계적 및 항균 특성에 미치는 영향)

  • Ga Young Shin;Hyo-Lyn Kim;So-Yoon Park;Mi So Park;Chanhyeong Kim;Jae-Young Her
    • Food Science and Preservation
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    • v.31 no.1
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    • pp.126-137
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    • 2024
  • In this study, zinc oxide nanoparticles (ZnONPs) were synthesized using three distinct zinc salts: zinc acetate, zinc chloride, and zinc nitrate. These ZnONPs were subsequently utilized in the fabrication of carrageenan-ZnONPs (Car-ZnONPs) composite films. The study assessed influence of the various ZnONPs on the morphological, water vapor barrier, color, optical, and antimicrobial properties of the Car-ZnONPs composite films. The surface morphology and UV-blocking attributes of the composite films were affected by the type of ZnONPs used, but their surface color, transparency, and chemical structure remained unaltered. The composite film's thickness and elongation at break (EB) significantly increased, while the tensile strength significantly decreased. In contrast, film's elastic modulus (EM) and water vapor permeability coefficient (WVP) showed no significant difference. All the composite films with added ZnONPs demonstrated potent antibacterial activity against Escherichia coli O157:H7 and Listeria monocytogenes . Among the carrageenan-based composite films, Car-ZnONPsZC showed the highest antibacterial and UV-blocking properties, and its elongation at break was significantly higher than that of the pure carrageenan films. This suggests that ZnONPs composite films have the potential to be used as an active packaging film, preserve the safety of the packaged food and extend shelf life.

The Dynamic Behavior of Saturated - fatty Acids and 8A5H on the Water Surface (수면상 포화지방산과 8A5H의 분자거동)

  • Bae, Myong-Han;Kim, Hyeoung-Woo;Cho, Wan-Je;Song, Kyong-Ho;Park, Keun-Ho;Kwun, Young-Su;Park, Tae-Gone
    • Proceedings of the KIEE Conference
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    • 1999.07d
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    • pp.1974-1976
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    • 1999
  • The dynamic behavior so fsaturaed-fatty acids $C_{16},\;C_{18},\;C_{20}$ and 8A5H were measured by displacement current method when a barrier was compressed and expanded. I-A, $\pi-A$ isotherms of $C_{16},\;C_{18},\;C_{20}$ were similar, but $C_{20}$ was bad relatively. 8A5H showed the form of double liquid films and had an reversible reaction when a barrier was compressed and then expanded.

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Improvement of the luminous efficiency of organic light emitting diode using LiF anode buffer layer

  • Park, Won-Hyeok;Kim, Gang-Hun
    • Proceedings of the Korean Vacuum Society Conference
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    • 2015.08a
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    • pp.147-147
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    • 2015
  • The multilayer structure of the organic light emitting diode has merits of improving interfacial characteristics and helping carriers inject into emission layer and transport easier. There are many reports to control hole injection from anode electrode by using transition metal oxide as an anode buffer layer, such as V2O5, MoO3, NiO, and Fe3O4. In this study, we apply thin films of LiF which is usually inserted as a thin buffer layer between electron transport layer(ETL) and cathode, as an anode buffer layer to reduce the hole injection barrier height from ITO. The thickness of LiF as an anode buffer layer is tested from 0 nm to 1.0 nm. As shown in the figure 1 and 2, the luminous efficiency versus current density is improved by LiF anode buffer layer, and the threshold voltage is reduced when LiF buffer layer is increased up to 0.6 nm then the device does not work when LiF thickness is close to 1.0 nm As a result, we can confirm that the thin layer of LiF, about 0.6 nm, as an anode buffer reduces the hole injection barrier height from ITO, and this results the improved luminous efficiency. This study shows that LiF can be used as an anode buffer layer for improved hole injection as well as cathode buffer layer.

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Effects of Hydrogen Plasma Treatment of the Underlying TaSiN Film Surface on the Copper Nucleation in Copper MOCVD

  • Park, Hyun-Ah;Lim, Jong-Min;Lee, Chong-Mu
    • Journal of the Korean Ceramic Society
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    • v.41 no.6
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    • pp.435-438
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    • 2004
  • MOCVD is one of the major deposition techniques for Cu thin films and Ta-Si-N is one of promising barrier metal candidates for Cu with high thermal stability. Effects of hydrogen plasma pretreatment of the underlying Ta-Si-N film surface on the Cu nucleation in Cu MOCVD were investigated using scanning electron microscopy, X-ray photoelectron spectroscopy and Auger electron emission spectrometry analyses. Cu nucleation in MOCVD is enhanced as the rf-power and the plasma exposure time are increased in the hydrogen plasma pretreatment. The optimal plasma treatment process condition is the rf-power of 40 Wand the plasma exposure time of 2 min. The hydrogen gas flow rate in the hydrogen plasma pretreatment process does not affect Cu nucleation much. The mechanism through which Cu nucleation is enhanced by the hydrogen plasma pretreatment of the Ta-Si-N film surface is that the nitrogen and oxygen atoms at the Ta-Si-N film surface are effectively removed by the plasma treatment. Consequently the chemical composition was changed from Ta-Si-N(O) into Ta-Si at the Ta-Si-N film surface, which is favorable for Cu nucleation.

Correlation Between Arrhenius Equation and Binding Energy by X-ray Photoelectron Spectroscopy

  • Oh, Teresa
    • Transactions on Electrical and Electronic Materials
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    • v.14 no.6
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    • pp.329-333
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    • 2013
  • SiOC films were prepared by capacitively coupled plasma chemical vapor deposition, and the correlation between the binding energy by X-ray photoelectron spectroscopy and Arrhenius equation for ionization energy was studied. The ionization energy decreased with increase of the potential barrier, and then the dielectric constant also decreased. The binding energy decreased with increase of the potential barrier. The dielectric constant and electrical characteristic of SiOC film was obtained by Arrhenius equation. The dielectric constant of SiOC film was decreased by lowering the polarization, which was made from the recombination between opposite polar sites, and the dissociation energy during the deposition. The SiOC film with the lowest dielectric constant had a flat surface, which depended on how carbocations recombined with other broken bonds of precursor molecules, and it became a fine cross-linked structure with low ionization energy, which contributed to decreasing the binding energy by Si 2p, C 1s electron orbital spectra and O 1s electron orbital spectra. The dielectric constant after annealing decreased, owing to the extraction of the $H_2O$ group, and lowering of the polarity.

Characteristics of Defects in SiOx Thin films on Ethylene Terephthalate by High-temperature E-beam Deposition (고온 전자빔 증착에 의한 Ethylene Terephthalate상의 SiOx 박막의 특성 평가)

  • Han Jin-Woo;Kim Young-Hwan;Kim Jong-Hwan;Seo Dae-Shlk;Moon Dae-Gyu
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.19 no.1
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    • pp.71-74
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    • 2006
  • In this paper, we investigated the characterization of silicon oxide(SiOx) thin film on Ethylene Terephthalate(PET) substrates by e-beam deposition for transparent barrier application. The temperature of chamber increases from $30^{\circ}C$ to $110^{\circ}C$, the roughness increase while the Water vapor transmission rate (WVTR) decreases. Under these conditions, the WVTR for PET can be reduced from a level of $0.57 g/m^2/day$ (bare subtrate) to $0.05 g/m^2/day$ after application of a 200-nm-thick $SiO_2$ coating at 110 C. A more efficient way to improve permeation of PET was carried out by using a double side coating of a 5-${\mu}m$-thick parylene film. It was found that the WVTR can be reduced to a level of $-0.2 g/m^2/day$. The double side parylene coating on PET could contribute to the lower stress of oxide film, which greatly improves the WVTR data. These results indicates that the $SiO_2$ /Parylene/PET barrier coatings have high potential for flexible organic light-emitting diode(OLED) applications.

Properties of $(SiO_2)_x(ZnO)_y$ gas barrier films using facing target sputtering system with low temperature deposition process for flexible displays (플렉서블 디스플레이용 저온공정을 갖는 대향 타겟식 스퍼터링 장치를 이용한 $ZrO_2$ 보호막의 특성)

  • Cho, Do-Hyun;Kim, Ji-Hwan;Lee, Jae-Hwan;Ryu, Sung-Won;Sohn, Sun-Young;Park, Sung-Hwan;Kim, Jong-Jae
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2008.11a
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    • pp.48-49
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    • 2008
  • 본 실험에서는 대향 타겟식 스퍼터링 (face target sputtering, FTS) 장비를 사용하여 플렉서블 디스플레이용 poly ethylene naphthalate (PEN) 플라스틱 기판 위에 보호층으로 사용된 $ZrO_2$ 박막의 특성들에 대해 연구하였다. FTS에 의해 3 시간동안 증착된 $ZrO_2$ 박막의 기판 온도는 $69^{\circ}C$ 로 낮은 증착 온도를 나타내었으며, 이는 유리전이온도가 낮은 PEN 과 같은 플라스틱 기판위에 박막 증착시 적용하기에 적합하다. 제작된 $ZrO_2$ 박막에서 기판 중심으로부터 거리의 함수로 측정된 박막의 두께 차이는 약 4.5%로 매우 균일한 두께를 갖는 것으로 측정되었다.

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Atomic Layer Depositied Tungsten Nitride Thin Films as Diffusion Barrier for Copper Metallization

  • Hwang, Yeong-Hyeon;Lee, In-Hwan;Jo, Byeong-Cheol;Kim, Yeong-Hwan;Jo, Won-Ju;Kim, Yong-Tae
    • Proceedings of the Korean Vacuum Society Conference
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    • 2012.02a
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    • pp.145-145
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    • 2012
  • 반도체 집적회로의 집적도가 증가함에 따라 RC delay가 증가하며, 금속 배선의 spiking, electromigration 등의 문제로 인해 기존의 알루미늄 금속을 대체하기 위하여 구리를 배선재료로 사용하게 되었다. 하지만 구리는 실리콘 및 산화물 내에서 매우 빠른 확산도를 가지고 있으므로, 구리의 확산을 막아 줄 확산방지막이 필요로 하다. 이러한 확산방지막의 증착은, 소자의 크기가 작아짐에 따라 via/contact과 같은 고단차 구조에도 적용이 가능하도록 기존의 sputtering 증착 방법에서 이를 개선한 collimated sputter, long-throw sputter, ion-metal plasma 등의 방법으로 물리적인 증착법이 지속되어 왔지만, 근본적인 증착방법을 바꾸지 않는 한 한계에 도달하게 될 것이다. 원자층 증착법(ALD)은 CVD 증착법의 하나로, 소스와 반응물질을 주입하는 시간을 분리함으로써 증착하고자 하는 표면에서의 반응을 유도하여 원자층 단위로 원하는 박막을 얻을 수 있는 증착방법이다. 이를 이용하여 물리적 증기 증착법(PVD)보다 우수한 단차피복성과 함께 정교하게 증착두께를 컨트롤을 할 수 있다. 본 연구에서는 이러한 원자층 증착법을 이용하여 구리 배선을 위한 확산방지막으로 텅스텐질화막을 형성하였다. 텅스텐 질화막을 형성하기 위하여 금속-유기물 전구체와 함께 할라이드 계열인 WF6를 텅스텐 소스로 이용하였으며, 이에 대한 원자층 증착방법으로 이루어진 박막의 물성을 비교 평가하여 분석하였다.

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Effects of Plasma Pretreatment of the Cu Seed Layer on Cu Electroplating (Cu seed layer 표면의 플라즈마 전처리가 Cu 전기도금 공정에 미치는 효과에 관한 연구)

  • O, Jun-Hwan;Lee, Seong-Uk;Lee, Jong-Mu
    • Korean Journal of Materials Research
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    • v.11 no.9
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    • pp.802-809
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    • 2001
  • Electroplating is an attractive alternative deposition method for copper with the need for a conformal and conductive seed layer In addition, the Cu seed layer should be highly pure so as not to compromise the effective resistivity of the filled copper interconnect structure. This seed layer requires low electrical resistivity, low levels of impurities, smooth interface, good adhesion to the barrier metal and low thickness concurrent with coherence for ensuring void-free fill. The electrical conductivity of the surface plays an important role in formation of initial Cu nuclei, Cu nucleation is much easier on the substrate with higher electrical conductivities. It is also known that the nucleation processes of Cu are very sensitive to surface condition. In this study, copper seed layers deposited by magnetron sputtering onto a tantalum nitride barrier layer were used for electroplating copper in the forward pulsed mode. Prior to electroplating a copper film, the Cu seed layer was cleaned by plasma H$_2$ and $N_2$. In the plasma treatment exposure tome was varied from 1 to 20 min and plasma power from 20 to 140W. Effects of plasma pretreatment to Cu seed/Tantalum nitride (TaN)/borophosphosilicate glass (BPSG) samples on electroplating of copper (Cu) films were investigated.

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