• 제목/요약/키워드: accelerated life testing(ALT)

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전기기기 신뢰성 보증을 위한 가속수명시험 설계 (Design of Accelerated Life Testing for Reliability Assurance of Electrical Apparatus)

  • 김민규;이정기;김익수;정주영
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 2007년도 제38회 하계학술대회
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    • pp.1498-1499
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    • 2007
  • In general, ALT can be used to expect the lifetime of electric machines and accelerated stress testing(AST) is used to evaluate the residual life of insulation system. In this paper, a method to design the accelerated life testing(ALT) for reliability qualification of electrical apparatus is represented.

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Necessity of step-stress accelerated life testing experiment at higher steps

  • Chandra, N.;Khan, Mashroor Ahmad;Pandey, M.
    • International Journal of Reliability and Applications
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    • 제15권2호
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    • pp.85-98
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    • 2014
  • Accelerated life testing (ALT) is a well famous technique in life testing and reliability studies, this is particularly used to induce so high stress leading to failure of the highly reliable units quickly under stipulated duration of time. The step-stress ALT is one of the systematic experimental strategy of ALT applied to fail the units in steps. In this article we focus on two important issues (i) necessity of life tests at higher steps with relevant causes (ii) to develop a new optimum test plan for 3-step SSALT under the modified cumulative exposure model proposed by Khamis and Higgins (1998). It is assumed that the lifetime of test units follows Rayleigh distribution and its scale parameter at constant stress level is assumed to be a log-linear function of the stress. The maximum likelihood estimates of the parameters involved in the step-stress ALT model are obtained. A simulation study is performed for numerical investigation of the proposed new optimum plan 3-step, step-stress ALT. The necessity of the life test units at 3-step step-stress is also numerically examined in comparison to simple step-stress setup.

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Asymptotics for Accelerated Life Test Models under Type II Censoring

  • Park, Byung-Gu;Yoon, Sang-Chul
    • Journal of the Korean Data and Information Science Society
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    • 제7권2호
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    • pp.179-188
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    • 1996
  • Accelerated life testing(ALT) of products quickly yields information on life. In this paper, we investigate asymptotic normalities of maximum likelihood(ML) estimators of parameters for ALT model under Type II censored data using results of Bhattacharyya(1985). Further illustrations include the treatment of asymptotic of the exponential and Weibull regression models.

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Varistor의 ALT(Accelerated Life Testing) 설계 및 주 고장모드 분석 (A Study for Accelerated Life Testing and Failure Analysis of Chip Varistor)

  • 장우성;이준혁;이관훈;오영환
    • 한국신뢰성학회지:신뢰성응용연구
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    • 제5권2호
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    • pp.221-239
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    • 2005
  • General chip SMD parts(chip resistance, chip capacitor, chip varistor etc.) are very wide used electronics parts for IT units. But, failure modes are indistinct for these chip parts. In factory and field the failure modes are recognized to accidental failure mode caused by potential defect. In this paper used chip varistor ALT(Accelerate Life Test) test for verify general failure modes in chip SMD parts. Also the results are useful for general chip SMD ALT tests.

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Varistor 의 ALT(Accelerated Life Testing) 설계 및 주 고장모드 분석 (A Study for Accelerated Life Testing and Failure Analysis of Chip Varistor)

  • 장우성;이준혁;이관훈;오영환
    • 한국신뢰성학회:학술대회논문집
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    • 한국신뢰성학회 2005년도 학술발표대회 논문집
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    • pp.51-67
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    • 2005
  • General chip SMD parts(chip resistance, chip capacitor, chip varistor etc.) are very wide sed electronics parts for IT units. But, failure modes are indistinct for these chip parts. In factory and field the failure modes are recognized to accidental failure mope caused by potential defect. In this paper used chip varistor ALT(Accelerate Life Test) test for verify general failure modes in chip SMD parts. Also the results are useful for general chip SMD ALT tests.

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가속시험에 의한 릴레이의 기계적 수명평가에 관한 연구 (Mechanical Life Prediction of a Relay by Accelerated Life Tests)

  • 권영일;한인수
    • 한국신뢰성학회:학술대회논문집
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    • 한국신뢰성학회 2005년도 학술발표대회 논문집
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    • pp.75-82
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    • 2005
  • In this paper, accelerated life testing(ALT) method and procedures for a are developed and applied to assess the reliability of the product. Relay is a device that can open and close the electric circuit electrically and is used for protecting and controlling the load. In this study, an accelerated life test method for predicting the mechanical life of a relay is developed using the relationship between stresses, failure mechanism and life characteristics of products. Using the ALT method, we performed life tests and analyzed the tests results. The proposed method and procedures may de extended and applied to testing similar kinds of products to reduce test times and costs of the tests remarkably.

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회귀분석을 이용한 전자접촉기의 접점소모 분석에 대한 고찰 (A study on Analysis of Contact erosion at a Magnetic Contactor with the Use of Regression Analysis)

  • 김명석;유행수;한규환
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 2003년도 추계학술대회 논문집 전기기기 및 에너지변환시스템부문
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    • pp.116-118
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    • 2003
  • This paper describes a Accelerated Life Test (ALT) with the electrical contact erosion suitable to the evaluations of high-reliability and durability devices such as magnetic contactor. Recently, an electrical devices company was interested in accelerated life test (ALT), the product liability (PL) and the short-term testing model of electrical life test (ELT). In order to estimate a model for testing fee and period, need to the statistical analysis method with the acceleration factor(AF). Usually customer/manufacturer regard their device failure to the over-current or heavy duty condition, while devices view shape of contact erosion owing to operational duty problem. In this paper, additional method of evaluation estimated the operated cycles by weight of contact erosion with a used of regression analysis by MINITAB.

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알루미늄전해콘덴서의 가속수명시험에 관한 실험연구 (An Experimental Study on Accelerated Life Testing for Aluminum Electrolytic Capacitors)

  • 김흥진;전호성;김성득;박영택;진홍기;박찬웅
    • 품질경영학회지
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    • 제23권4호
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    • pp.128-147
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    • 1995
  • An accelerated life testing(ALT) for aluminum electrolytic capacitors is conducted and analyzed. A testing equipment, which consists of part fixtures, relay board, controller, video bridge and microcomputer, is made for the ALT. Load factors are temperature with four levels and voltage with three levels. Base on 'optimized 4:2:1 plan', 2,000 electrolytic capacitors are allocated at 12 experimental conditions(; 4 levels of temperature ${\times}3$ levels of voltage), and the ALT is conducted. From the experimental results, an acceleration model is derived and acceleration factors are estimated. A discussion on the experimental results is included.

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Accelerated life testing of concrete based on stochastic approach and assessment

  • Zhu, Binrong;Qiao, Hongxia;Feng, Qiong;Lu, Chenggong
    • Computers and Concrete
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    • 제19권1호
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    • pp.111-120
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    • 2017
  • This study aimed to design the accelerated life testing (ALT) of concrete, which stimulating the special natural environment maximumly. Its evaluation indexes, such as dynamic elastic modulus, mass and ultrasonic velocity were measured, and the variation of relative mass and relative dynamic elastic modulus of concrete were studied. Meanwhile, the microanalysis method was used. Moreover, an exploratory application of the stochastic approach, the Weibull distribution and the lognormal distribution, were made to assess the durability of concrete structures. The results show that the ALT for simulating natural environment is more close to the service process of concrete structure under actual conditions; The relative dynamic elastic modulus can be used as the dominant durability evaluation parameters, because it is more sensitive to the environmental factors compared with the relative quality evaluation parameters; In the course of the concrete deterioration, the destruction of the salt freezing cycle is the dominant factor, supplemented by other factors; Both of those two stochastic approaches can be used to evaluate the reliability of concrete specimens under the condition of ALT; By comparison, The lognormal distribution method is better to describe the reliability process.

가속수명시험을 이용한 블루투스 모듈의 수명 예측 (Lifetime Estimation of a Bluetooth Module using Accelerated Life Testing)

  • 손영갑;장석원;김재중
    • 마이크로전자및패키징학회지
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    • 제15권2호
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    • pp.55-61
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    • 2008
  • 본 논문은 블루투스 모듈의 구조 및 솔더접합부에 대한 신뢰성 평가에 국한된 기존의 방법을 확장하여 정량적인 신뢰성 평가를 수행한 결과를 나타낸다. Field 환경조건에서의 정량적인 신뢰성 평가를 위해, 온도 싸이클링(temperature/thermal cycling)에서의 온도차를 가속스트레스로 선정하여 가속수명시험을 실시하였다. 가속수명시험을 통해 구한 고장시간 데이터들을 이용하여 수명분포 매개변수들을 추정하고 코핀-만슨(Coffin-Manson) 모델을 이용하였다. 가속수명시험을 수행한 결과, 블루투스 모듈의 고장모드는 Open, 고장메커니즘은 크랙(Crack)과 박리(Delamination)였다. Field에서 수거한 고장품들의 고장모드와 고장메커니즘이 가속수명시험을 통해 재현되었다. 또한 본 논문에서 블루투스 모듈이 Field에서 받을 수 있는 온도 싸이클링에서의 다양한 온도차에 대한 정량적인 수명을 예측할 수 있는 방법이 제시되었다. 제안된 방법을 이용하여 온도차 $70^{\circ}C$를 받고 있는 블루투스 모듈의 $B_{10}$ 수명은 약 4년으로 추정되었다.

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