• Korean Journal of Materials Research
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• v.19 no.6
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• pp.337-343
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• 2009

In this study, we optimized Pb-free Sn/Ni plating thickness and conditions were optimized to counteract the environmental regulations, such as RoHS and ELV(End-of Life Vehicles). The $B_{10}$ life verification method was also suggested to have been successful when used with the accelerated life test(ALT) for assessing Pb-free solder joint life of piezoelectric (PZT) ceramic resonator. In order to evaluate the solder joint life, a modified Norris-Landzberg equation and a Coffin-Manson equation were utilized. Test vehicles that were composed of 2520 PZT ceramic resonator on FR-4 PCB with Sn-3.0Ag-0.5Cu for ALT were manufactured as well. Thermal shock test was conducted with 1,500 cycles from $(-40{\pm}2)^{\circ}C$ to $(120{\pm}2)^{\circ}C$, and 30 minutes dwell time at each temperature, respectively. It was discovered that the thermal shock test is a very useful method in introducing the CTE mismatch caused by thermo-mechanical stress at the solder joints. The resonance frequency of test components was measured and observed the microsection views were also observed to confirm the crack generation of the solder joints.

• Journal of the Korean Data and Information Science Society
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• v.5 no.2
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• pp.75-85
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• 1994

In this paper, I introduce the goodness-of-fit test statistics for exponential distribution using accelerated life test data. The ALT lifetime data were obtained by assuming step-stress ALT model, specially TRV model introduced by DeGroot and Goel(1979). The critical values are obtained for proposed test statistics, Kolmogorov-Smirnov, Kuiper, Watson, Cramer-von Mises, Anderson-Darling type, under various sample sizes and significance levels. The powers of the five test statistic are compared through Monte-Cairo simulation technique.

• Journal of Applied Reliability
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• v.5 no.4
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• pp.427-438
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• 2005

This paper is concerned with the problem in predicting the reliability of an LCD product, Product reliability calculation methods classify accelerated life test (ALT) and using the reliability standard as MIL-HDBK-217F and Telcordia SR-332. The reliability standard can calculate estimating value more quickly than accelerated life test. The system MTBF was calculated in accordance of Telcordia SR-332 standard which includes directions of part electronic measurement, temperature rise and environmental test data. This research is intended to obtain the useful information for each electric design step to save time and cost.

• Communications for Statistical Applications and Methods
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• v.23 no.4
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• pp.269-285
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• 2016

In this paper, a simple step-stress accelerated life test (ALT) under progressive type-II censoring is considered. Progressive type-II censoring and accelerated life testing are provided to decrease the lifetime of testing and lower test expenses. The cumulative exposure model is assumed when the lifetime of test units follows an extension of the exponential distribution. Maximum likelihood estimates (MLEs) and Bayes estimates (BEs) of the model parameters are also obtained. In addition, a real dataset is analyzed to illustrate the proposed procedures. Approximate, bootstrap and credible confidence intervals (CIs) of the estimators are then derived. Finally, the accuracy of the MLEs and BEs for the model parameters is investigated through simulation studies.

• Journal of Electrical Engineering and Technology
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• v.2 no.2
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• pp.188-193
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• 2007

Magnetic contactors (MCs) are widely used in industrial equipment such as elevators, cranes and factory control rooms in order to close and open the control circuits. The reliability of MCs mainly depend on mechanical durability and international standards such as IEC 60947-4-1, which stipulates the testing method for MCs. Testing time, however, is so long in usual cases that a method of reducing testing time is required. Therefore, a temperature and voltage-accelerated life testing (ALT) method has been developed to reduce the testing time in this work. The accelerated life test data are analyzed and acceleration factors (AFs) are provided.

• Journal of Electrical Engineering and Technology
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• v.3 no.2
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• pp.184-191
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• 2008

Electrical endurance is the critical characteristic of Magnetic contactors(MCs), which are widely used in such power equipment as elevators, cranes, and factory control rooms in order to close and open control circuits. Testing time, however, is not short in typical cases in which some method of reducing the testing period is required. This study shows the method of determining the stress level of electrical ALT(Accelerated Life Test) through optical temperature sensor and the relationship between 0.05 s and 0.1 s for on-time. The tool used for analyzing the test result is MINITAB. I will propose the method of determining the optimized stress level through optical temperature sensor, which will contribute to minimize the testing time and development period and also raise the product reliability.

• International Journal of Reliability and Applications
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• v.18 no.2
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• pp.45-63
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• 2017

In this paper, we have formulated optimum Accelerated Life Test (ALT) plan for a parallel system with two independent components using masked data with ramp-stress loading scheme and Type-I censoring. Consider a system of two independent and non-identical components connected in parallel. Such a system fails whenever all of its components has failed. The exact component that causes the system to fail is often unknown due to cost and time constraint. For each parallel system at test, we observe its system's failure time and a set of component that includes the component actually causing the system to fail. The stress-life relationship is modelled using inverse power law, and cumulative exposure model is assumed to model the effect of changing stress. The optimal plan consists in finding out the optimum stress rate using D-optimality criterion. The method developed has been explained using a numerical example and sensitivity analysis carried out.

• Transactions of the Korean Society of Mechanical Engineers A
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• v.32 no.5
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• pp.430-436
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• 2008

This paper proposes a way to predict electrical lifetime of a relay using Accelerated Life Testings (ALTs). The relay of interest mounting on printed circuit boards is usually under an inrush current stress. The inrush current is generated and accelerated through controlling a lamp switching device in the ALT. We find that the dominant failure mechanism under high levels of inrush current would be contact welding in the contact surface of the relay and the contact welding process is accelerated according to increase in inrush current. The electrical lifetime model based on Inverse Power Law in term of inrush current is proposed, and parameters characterizing relay's lifetime distribution are statistically estimated using ALTA 6 PRO software.

• Journal of Applied Reliability
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• v.7 no.1
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• pp.31-43
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• 2007

The function of O-ring seals is to prevent leakage during the service life of the components in which they are installed. The life prediction of O-ring is very important at various industry fields. Generally, to evaluated the long-term performance of O-ring in severe environments has applied a life prediction technique based on accelerated life test (ALT). In this work, Accelerated thermal aging test(l20, 130, 140, $150^{\circ}C$) of O-ring was applied for life prediction of O-ring. The property changes after thermal aging test was measured using TGA, DSC, FT - IR, Video Microscope and SEM. Shape parameter and life prediction were obtained using MINITAB program.

• Journal of Korean Society for Quality Management
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• v.27 no.3
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• pp.79-93
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• 1999

The common accelerated life test(ALT) consists of test methods applying a constant stress, higher than the use condition stress, to items. There we, however, situations for which a progressive stress ALT, in which the stress on a test item is continuously increased with time, Is more convenient to perform testing and simpler in analyzing data than a constant stress ALT. When a product under constant stress s follows a Weibull distribution with parameters $\theta$(5) and $\beta$, maximum likelihood(ML) estimators of parameters involved in the model are obtained and their asymptotic distributions are derived under stress bounded ramp tests in which the stress is increased linearly from use condition stress to the stress upper bound. The optimum test plans are also found which minimize the asymptotic variance of the ML estimator of the log mean life at design constant stress. For selected values of the design parameters, tables useful for finding optimal test plans are given. The effect of the pre-estimates of design parameters is studied.