• 제목/요약/키워드: Vacuum-forming

검색결과 206건 처리시간 0.027초

Effects on microbial diversity of fermentation temperature (10℃ and 20℃), long-term storage at 5℃, and subsequent warming of corn silage

  • Zhou, Yiqin;Drouin, Pascal;Lafreniere, Carole
    • Asian-Australasian Journal of Animal Sciences
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    • 제32권10호
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    • pp.1528-1539
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    • 2019
  • Objective: To evaluate the effects on microbial diversity and biochemical parameters of gradually increasing temperatures, from $5^{\circ}C$ to $25^{\circ}C$ on corn silage which was previously fermented at ambient or low temperature. Methods: Whole-plant corn silage was fermented in vacuum bag mini-silos at either $10^{\circ}C$ or $20^{\circ}C$ for two months and stored at $5^{\circ}C$ for two months. The mini-silos were then subjected to additional incubation from $5^{\circ}C$ to $25^{\circ}C$ in $5^{\circ}C$ increments. Bacterial and fungal diversity was assessed by polymerase chain reaction-denaturing gradient gel electrophoresis (PCR-DGGE) profiling and biochemical analysis from mini-silos collected at each temperature. Results: A temperature of $10^{\circ}C$ during fermentation restricted silage fermentation compared to fermentation temperature of $20^{\circ}C$. As storage temperature increased from $5^{\circ}C$ to $25^{\circ}C$, little changes occurred in silages fermented at $20^{\circ}C$, in terms of most biochemical parameters as well as bacterial and fungal populations. However, a high number of enterobacteria and yeasts (4 to $5\;log_{10}$ colony forming unit/g fresh materials) were detected at $15^{\circ}C$ and above. PCR-DGGE profile showed that Candida humilis predominated the fungi flora. For silage fermented at $10^{\circ}C$, no significant changes were observed in most silage characteristics when temperature was increased from $5^{\circ}C$ to $20^{\circ}C$. However, above $20^{\circ}C$, silage fermentation resumed as observed from the significantly increased number of lactic acid bacteria colonies, acetic acid content, and the rapid decline in pH and water-soluble carbohydrates concentration. DGGE results showed that Lactobacillus buchneri started to dominate the bacterial flora as temperature increased from $20^{\circ}C$ to $25^{\circ}C$. Conclusion: Temperature during fermentation as well as temperature during storage modulates microorganism population development and fermentation patterns. Silage fermented at $20^{\circ}C$ indicated that these silages should have lower aerobic stability at opening because of better survival of yeasts and enterobacteria.

니켈계 초내열합금의 응고 및 용질원소의 편석 거동에 미치는 레늄 및 루테늄 첨가의 영향 (Effect of Re and Ru Addition on the Solidification and Solute Redistribution Behaviors of Ni-Base Superalloys)

  • 서성문;정희원;이재현;유영수;조창용
    • 대한금속재료학회지
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    • 제49권11호
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    • pp.882-892
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    • 2011
  • The influence of rhenium (Re) and ruthenium (Ru) addition on the solidification and solute redistribution behaviors in advanced experimental Ni-base superalloys has been investigated. A series of model alloys with different levels of Re and Ru were designed based on the composition of Ni-6Al-8Ta and were prepared by vacuum arc melting of pure metallic elements. In order to identify the influence of Re and Ru addition on the thermo-physical properties, differential scanning calorimetry analyses were carried out. The results showed that Re addition marginally increases the liquidus temperature of the alloy. However, the ${\gamma}^{\prime}$ solvus was significantly increased at a rate of $8.2^{\circ}C/wt.%$ by the addition of Re. Ru addition, on the other hand, displayed a much weaker effect on the thermo-physical properties or even no effect at all. The microsegregation behavior of solute elements was also quantitatively estimated by an electron probe microanalysis on a sample quenched during directional solidification of primary ${\gamma}$ with the planar solid/liquid interface. It was found that increasing the Re content gradually increases the microsegregation tendency of Re into the dendritic core and ${\gamma}^{\prime}$ forming elements, such as Al and Ta, into the interdendritic area. The strongest effect of Ru addition was found to be Re segregation. Increasing the Ru content up to 6 wt.% significantly alleviated the microsegregation of Re, which resulted in a decrease of Re accumulation in the dendritic core. The influence of Ru on the microstructural stability toward the topologically close-packed phase formation was discussed based on Scheil type calculations with experimentally determined microsegregation results.

스트레처블 기판상에 산화물 기반의 광센서 제작 (Fabrication of an Oxide-based Optical Sensor on a Stretchable Substrate)

  • 김무진
    • 산업융합연구
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    • 제20권12호
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    • pp.79-85
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    • 2022
  • 최근 전자소자는 플렉서블 기판상에 제작된 스마트폰이 출시되었으며, 스트레처블 한 전자소자의 연구가 진행되고 있다. 본 논문에서는 실리콘 기반의 스트레처블한 소재를 만들어 이것을 기판으로 사용하여 산화물을 이용한 광센서 소자를 구현하여 평가하고자 한다. 이를 위해, 실리콘 기반의 용액성 고무를 이용하여 상온에서 잘 늘어나는 기판을 만들어 소재의 350% 연신율을 확인하였으며, 반사도, 투과도, 흡수도와 같은 광특성을 측정하였다. 다음으로 이러한 소재는 표면이 소수성을 나타내기 때문에 표면 세정 및 친수성으로 변화시키기 위하여 산소 기반의 플라즈마 표면 처리를 진행하였으며, 진공장비로 AZO(Aluminium Zinc Oxide) 기반의 산화막을 증착한 후 면봉을 이용하거나 메탈 마스트로 Ag 전극을 형성시켜 광센서를 완성하였다. 제작된 광전자소자는 빛을 조사했을 때와 하지 않았을 때의 전압에 따른 전류 변화를 분석하여 광에 의하여 생성된 캐리어들에 의한 광전류를 관찰하였으며, 벤딩 장비를 이용하여 폴딩에 따른 광센서소자 영향성을 추가 테스트하였다. 벤딩 테스트 전과 빛에 의해 생성되는 전류값 변화를 추가로 분석하였다. 향후 스트레처블 기판위에 늘어나는 반도체 물질 및 전극을 형성하여 폴딩(벤딩) 및 늘어나는 광소자를 집중적으로 연구할 계획이다.

실리콘 기판 슬러지로부터 고순도 탄화규소 분말 합성 (Synthesis of High-purity Silicon Carbide Powder using the Silicon Wafer Sludge)

  • 권한중;김민희;윤지환
    • 자원리싸이클링
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    • 제31권6호
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    • pp.60-65
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    • 2022
  • 본 논문에서는 반도체용 실리콘 기판 가공 과정에서 발생한 슬러지 재활용을 위해 탄화 반응에 의한 탄화규소(SiC) 분말 합성 공정을 적용한 결과를 제시하고자 한다. 입수한 슬러지는 실리콘 기판을 탄화규소 연마재를 사용하여 가공하는 과정에서 발생하므로 실리콘과 탄화규소가 혼합된 형태였으며 가공 설비로부터 발생한 철 불순물이 포함되어 있었다. 슬러지는 절삭유가 포함되어 있어 점성이 있는 유체 형태였으며 대기 건조를 통해 분말 형태로 변화된 후 산 세정을 통한 철 성분 제거 및 탄화에 의한 탄화규소 분말 합성 과정을 거치게 된다. 슬러지에 포함된 실리콘과 탄화규소의 비율에 따라 탄화 반응에 필요한 탄소량이 달랐으며 탄화규소의 함량이 커질수록 탄소 부족 현상으로 인해 비화학량론적 탄화물(SiCx, x<1) 형성이 촉진되어 순수한 탄화규소 합성이 이루어지지 않는 것을 확인하였다. 이러한 비화학량론적 탄화물은 잉여 탄소 추가와 고에너지 밀링에 의한 탄화 반응성 증가를 통해 제거할 수 있었으며 결과적으로 산 세정과 밀링 과정에 의해 슬러지로부터 순수한 탄화규소 분말 합성이 가능함을 확인할 수 있었다.

New Approaches for Overcoming Current Issues of Plasma Sputtering Process During Organic-electronics Device Fabrication: Plasma Damage Free and Room Temperature Process for High Quality Metal Oxide Thin Film

  • Hong, Mun-Pyo
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2012년도 제42회 동계 정기 학술대회 초록집
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    • pp.100-101
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    • 2012
  • The plasma damage free and room temperature processedthin film deposition technology is essential for realization of various next generation organic microelectronic devices such as flexible AMOLED display, flexible OLED lighting, and organic photovoltaic cells because characteristics of fragile organic materials in the plasma process and low glass transition temperatures (Tg) of polymer substrate. In case of directly deposition of metal oxide thin films (including transparent conductive oxide (TCO) and amorphous oxide semiconductor (AOS)) on the organic layers, plasma damages against to the organic materials is fatal. This damage is believed to be originated mainly from high energy energetic particles during the sputtering process such as negative oxygen ions, reflected neutrals by reflection of plasma background gas at the target surface, sputtered atoms, bulk plasma ions, and secondary electrons. To solve this problem, we developed the NBAS (Neutral Beam Assisted Sputtering) process as a plasma damage free and room temperature processed sputtering technology. As a result, electro-optical properties of NBAS processed ITO thin film showed resistivity of $4.0{\times}10^{-4}{\Omega}{\cdot}m$ and high transmittance (>90% at 550 nm) with nano- crystalline structure at room temperature process. Furthermore, in the experiment result of directly deposition of TCO top anode on the inverted structure OLED cell, it is verified that NBAS TCO deposition process does not damages to the underlying organic layers. In case of deposition of transparent conductive oxide (TCO) thin film on the plastic polymer substrate, the room temperature processed sputtering coating of high quality TCO thin film is required. During the sputtering process with higher density plasma, the energetic particles contribute self supplying of activation & crystallization energy without any additional heating and post-annealing and forminga high quality TCO thin film. However, negative oxygen ions which generated from sputteringtarget surface by electron attachment are accelerated to high energy by induced cathode self-bias. Thus the high energy negative oxygen ions can lead to critical physical bombardment damages to forming oxide thin film and this effect does not recover in room temperature process without post thermal annealing. To salve the inherent limitation of plasma sputtering, we have been developed the Magnetic Field Shielded Sputtering (MFSS) process as the high quality oxide thin film deposition process at room temperature. The MFSS process is effectively eliminate or suppress the negative oxygen ions bombardment damage by the plasma limiter which composed permanent magnet array. As a result, electro-optical properties of MFSS processed ITO thin film (resistivity $3.9{\times}10^{-4}{\Omega}{\cdot}cm$, transmittance 95% at 550 nm) have approachedthose of a high temperature DC magnetron sputtering (DMS) ITO thin film were. Also, AOS (a-IGZO) TFTs fabricated by MFSS process without higher temperature post annealing showed very comparable electrical performance with those by DMS process with $400^{\circ}C$ post annealing. They are important to note that the bombardment of a negative oxygen ion which is accelerated by dc self-bias during rf sputtering could degrade the electrical performance of ITO electrodes and a-IGZO TFTs. Finally, we found that reduction of damage from the high energy negative oxygen ions bombardment drives improvement of crystalline structure in the ITO thin film and suppression of the sub-gab states in a-IGZO semiconductor thin film. For realization of organic flexible electronic devices based on plastic substrates, gas barrier coatings are required to prevent the permeation of water and oxygen because organic materials are highly susceptible to water and oxygen. In particular, high efficiency flexible AMOLEDs needs an extremely low water vapor transition rate (WVTR) of $1{\times}10^{-6}gm^{-2}day^{-1}$. The key factor in high quality inorganic gas barrier formation for achieving the very low WVTR required (under ${\sim}10^{-6}gm^{-2}day^{-1}$) is the suppression of nano-sized defect sites and gas diffusion pathways among the grain boundaries. For formation of high quality single inorganic gas barrier layer, we developed high density nano-structured Al2O3 single gas barrier layer usinga NBAS process. The NBAS process can continuously change crystalline structures from an amorphous phase to a nano- crystalline phase with various grain sizes in a single inorganic thin film. As a result, the water vapor transmission rates (WVTR) of the NBAS processed $Al_2O_3$ gas barrier film have improved order of magnitude compared with that of conventional $Al_2O_3$ layers made by the RF magnetron sputteringprocess under the same sputtering conditions; the WVTR of the NBAS processed $Al_2O_3$ gas barrier film was about $5{\times}10^{-6}g/m^2/day$ by just single layer.

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열 화학기상증착법을 이용한 탄화규소 나노선의 합성 및 특성연구 (Characterization of SiC nanowire Synthesized by Thermal CVD)

  • 정민욱;김민국;송우석;정대성;최원철;박종윤
    • 한국진공학회지
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    • 제19권4호
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    • pp.307-313
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    • 2010
  • 본 연구에서는 열 화학기상증착법(thermal chemical vapor deposition)을 이용하여 분말 형태의 규소(Si)와 염화니켈 수화물 $(NiCl_2{\cdot}6H_2O)$을 혼합한 후 탄소공급원인 $CH_4$ 가스를 주입하여 탄화규소 나노선(SiC nanowire)을 합성하였다. 합성 온도와 $CH_4$ 가스 유량 변화에 따른 탄화규소 나노선의 구조적 특성을 분석한 결과, 합성온도가 $1,400^{\circ}C$, $CH_4$ 가스의 유량이 300 sccm인 경우가 탄화규소 나노선의 합성에 최적화된 조건임을 라만 분광법(Raman spectroscopy)과 X-선 회절(X-ray diffraction), 주사전자현미경(scanning electron microscopy), 그리고 투과전자현미경(transmission electron microscopy) 분석을 통해 확인하였다. 합성된 탄화규소 나노선의 직경은 약 50~150 nm이며, 곧은 방향성과 높은 결정성을 가지는 입방구조(cubic structure)를 지니고 있었다.