• Journal of the Korean Institute of Telematics and Electronics
• /
• v.25 no.8
• /
• pp.998-1009
• /
• 1988

A Hierarchical Circuit Extract Algotithm, which efficiently extract circuits from VLSI mask pattern information, is programmed. Quad-tree is used as a data structure which includes various CIF circuit elements and instances. This system is composed of CIF input routine, Quad-tree making routine, Transistor finding routine and Connection list making routine. This circuit extractor can extract circuit with hierarchical structure of circuit. This system is designed using YACC and LEX. By programming this algorithm with C language and adopting to various circuits, the effectiveness of this algorithm is showed.

• Journal of the Korea Computer Industry Society
• /
• v.7 no.3
• /
• pp.205-215
• /
• 2006

In this paper, a method how to make Programmable Logic Array (PLA) design and inspection of circuit relative to recent 64bit microprocessor simple and easy was discussed. A design method using Random Access Memory (RAM), Read Only Memory (ROM) and PLA has been settled down in Very Large Scale Integrated Circuit (VLSI) and logical design, modifying circuit and inspection are easy in PLA so it holds fairly good advantages in the aspect of performance and cost. It is expected PLA will also occupy an important position as a basic factor in designing VLSI in the future.

• Proceedings of the IEEK Conference
• /
• 1999.11a
• /
• pp.975-978
• /
• 1999

The transmission line effects of IC interconnects have a substantial effect on a hish-speed VLSI circuit performance. The effective transmission lime parameters are changed with the increase of the operation frequency because of the skin of the skin effect, proximity effect, and silicon substrate. A new signal delay estimation methodology based on the RLC-distributed circuit model is presented ［2］. The methodology is demonstrated by using SPICE simulation and a high-frequency experiment technique.

• JSTS:Journal of Semiconductor Technology and Science
• /
• v.15 no.2
• /
• pp.177-183
• /
• 2015

A high speed VLSI digital Winner-Take-All (WTA) circuit called simultaneous digital WTA (SDWTA) circuit is presented in this paper. A minimized comparison-cell (w-cell) is developed to reduce the size and to achieve high-speed. The w-cell which is suitable for VLSI implementation consists of only four transistors. With a minimized comparison-cell structure SDWTA can compare thousands of data simultaneously. SDWTA is scalable with O(mlog n) time-complexity for n of m-bit data. According to simulations, it takes 16.5 ns with $1.2V-0.13{\mu}m$ process technology in finding a winner among 1024 of 16-bit data.

• Journal of the Institute of Convergence Signal Processing
• /
• v.8 no.1
• /
• pp.73-77
• /
• 2007

In this paper, we propose a VLSI architecture of an LMS filter based on a Cyclo-static scheduler for fast computation of LMS filteing algorithm which is widely used in adptive filtering area. This process is composed of two steps: scheduling and circuit synthesis. The scheduling step accepts a fully specified flow graph(FSFG) as an input, and generates an optimal Cyclo-static schedule in the sense of the sampling rate, the number of processors, and the input-output delay. Then the generated schedule is transformed so that the number of communication edges between the processors. The circuit synthesis part translates the modified schedule into a complete circuit diagram by performing resource allocations. The VLSI layout generation can be performed easily by an existing silicon compiler.

• Journal of the Korea Society of Computer and Information
• /
• v.6 no.1
• /
• pp.7-13
• /
• 2001

As the density of VLSI increases, the conventional logic testing is not sufficient to completely detect the new faults generated in design and fabrication processing. Recently. IDDQ testing becomes very attractive since it can overcome the limitations of logic testing. This paper presents a new BIC for the internal current test in CMOS logic circuit. Our circuit is composed of Magnetoresistive current sensor, level shifter, comparator, reference voltage circuit and a circuit be IDDQ tested as a kind of self-testing fashion by using the proposed BIC.

• The Magazine of the IEIE
• /
• v.25 no.5
• /
• pp.31-41
• /
• 1998

With the advent of portable electronic systems, power consumption has recently become a major issue in circuit and system design. Furthermore, the sophisticated fabrication technology makes it possible to embed more functions and features in a VLSI chip, consequently calling for both higher performance and lower power to deal with the ever growing complexity of system algorithms than in the past. VLSI designers should cope with two conflicting constraints, high performance and low power, offering an optimum trade off of these constraints to meet requirements of system. Historically, VLSI designers have focused on performance improvement, and power dissipation was not a design criteria but an afterthought. This design paradigm should be changed, as power is emerging as the most critical design constraint. In VLSI design, low power design can be accomplished through many ways, for instance, process, circuit/logic design, architectural design, and etc.. In this paper, a few low power design examples, which have been used in 8 bit micro-controller core, and can be used also in 4/16/32 bit micro-controller cores, are presented in the areas of circuit, logic and architectural design. We first propose a low power guidelines for micro-controller design in SAMSUNG, and more detailed design examples are followed applying 4 specific design guidelines. The 1st example shows the power reduction through reduction of number of state clocks per instruction. The 2nd example realized the power reduction by applying RISC(Reduced Instruction Set Computer) concept. The 3rd example is to optimize the algorithm for ALU(Arithmetic Logic Unit) to lower the power consumption, Lastly, circuit cells designed for low power are described.

• Journal of the Korean Institute of Telematics and Electronics
• /
• v.24 no.4
• /
• pp.708-712
• /
• 1987

This paper deals with minimizing layout area of VLSI design. A long wire in a VLSI layout causes delay which can be reduced by using a driver. There can be significant area increase when many drivers are introduced in a layout. This paper describes a method to obtain tight bound on the worst-case increase in area when drivers are introduced along many long wires in a layout. The area occupied by minimum-area embedding for a circuit can depend on the aspect ratio of the bounding rectangle of the layout. This paper presents a separator-based area optimal embeddings for VLSI graphs in rectangles of several aspect ratios.

• Journal of the Korean Institute of Telematics and Electronics A
• /
• v.29A no.1
• /
• pp.48-59
• /
• 1992

This paper presents the design of a layout processing system that performs circuit and symbolic extraction from hierarchical designs containing arbitrarily shaped layout. The system is flexible enough to deal with various technologies, MOS or bipolar, by providing extraction rules in the form of technology files. In this paper, new efficient algorithms for trapezoidal decomposition of polygon and symbolic path extraction using trapezoidal template are proposed for symbolic extraction. Circuit and symbolic extractor is developed as an integrated design environment of SOLID system.

• Journal of the Korean Institute of Telematics and Electronics A
• /
• v.30A no.11
• /
• pp.140-148
• /
• 1993

High Integration ratio of CMOS circuits incredily increases the test cost during the design and fabrication processes because of the FET fault(Stuck-on faults and Stuck-off faults) which are due to the operational characteristics of CMOS circuits. This paper proposes a test generation algorithm for an arbitrarily large CMOS circuit, which can unify the test steps during the design and fabrication procedure and be applied to both static and dynaic circuits. This algorithm uses the logic equations set for the subroutines resulted from arbitrarily dividing the full circuit hierarchically or horizontally. Also it involves a driving procedure from output stage to input stage, in which to drive a test set corresponding to a subcircuit, only the subcircuits connected to that to be driven are used as the driving resource. With this algorithm the test cost for the large circuit such as VLSI can be reduced very much.