• 대한전기학회:학술대회논문집
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• 대한전기학회 2009년도 제40회 하계학술대회
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• pp.91_92
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• 2009

As the increasing integrity of VLSI, the BIST(Built-In Self Test) is used as an effective method to test chips. Generally the pseudo-random test pattern generation is used for BIST. But it requires too many test patterns when there exist random resistant faults. Therefore we propose a mixed test scheme which applies to the circuit under test, a deterministic test sequence followed by a pseudo-random one. This scheme allows the maximum fault coverage detection to be achieved, furthermore the silicon area overhead of the mixed hardware generator can be reduced.

• 제어로봇시스템학회논문지
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• 제16권8호
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• pp.786-793
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• 2010

This paper proposes a new method called the path-history coverage to generate a test suite to test the state transition behavior of the robot SW component. The proposed method generate a test suite which includes abnormal state transitions based on FSM of target component. Especially the proposed method covers the disadvantage of the mutation test method that the size of the test suite is explosively increasing. Examples including OPRoS Component[1] show the validity of the proposed method.

• 전자공학회논문지A
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• 제29A권8호
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• pp.18-25
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• 1992

Given a protocol specification, the task of testing whether an implementation conforms to the specification is called conformance testing. In this paper, the design and implementation of the protocol conformance test system using LAN on heterogeneous systems is descreibed. The test sequence used in this test system is generated using an algorithm on the basis of multiple UIO. The usability of this test system as an application was confirmed by performing the conformance test on the CCITT No.7 TCAP(transaction capabilities application part), implemented by ISDN Laboratory, Korea University in 1990.

• 항공우주시스템공학회지
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• 제3권1호
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• pp.12-16
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• 2009

The laminated sequence and thickness of a composite structure is an important design parameter which affect the strength and impact damage. In this study, it was investigated the residual strength of carbon fiber laminate after impact damage by the experimental investigation. The tensile strength test and compressive strength test were used to find the mechanical properties, previously. Impact test was performed using low-velocity drop-weight test equipment. The impact damages were finally assessed by the compressive strength test. The investigation results revealed the residual strength of the damaged specimens due to the impact damage.

• 전기학회논문지
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• 제60권4호
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• pp.796-800
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• 2011

As the increasing integrity of VLSI, the BIST(Built-In Self Test) is used as an effective method to test chips. Generally the pseudo-random test pattern generation is used for BIST. But it requires too many test patterns when there exist random resistant faults. Therefore we propose a mixed test scheme which applies to the circuit under test, a deterministic test sequence followed by a pseudo-random one. This scheme allows the maximum fault coverage detection to be achieved, furthermore the silicon area overhead of the mixed hardware generator can be reduced.

• 대한전기학회:학술대회논문집
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• 대한전기학회 2007년도 제38회 하계학술대회
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• pp.915-916
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• 2007

There are many equipments for the Short Circuit Test, for example Short Circuit Generator, Induction Motor, Sequence Timer, Exciter, CLR, Back Up Breaker, Making Switch and TRV etc. Especially Back up Breaker and Making Switch are very important equipments to test the short circuit test. A role of a Back up Breaker is to break high-voltage and high-current for short circuit test and a Making Switch should be operated always same speed/time and kept electrical-mechanical characteristics to make the voltage and current of short circuit test. This study introduces to the short circuit test also to kinds, principal movements and compare them of Back up Breaker and Making Switch.

• Journal of the Korean Data and Information Science Society
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• 제14권2호
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• pp.187-199
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• 2003

We deal with the problem of testing a sequence of independent normal random variables with constant, known or unknown, variance for no change in mean versus alternatives with a single change-point. Various tests based on the likelihood ratio and recursive residuals, score statistics and cusums are studied. Proposed tests are modified version of Buckley's cusum statistics. A comparison study of various change-point test statistics is done by Monte Carlo simulation with S-plus software.

• Communications for Statistical Applications and Methods
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• 제3권3호
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• pp.25-30
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• 1996

In discriminant analysis the procedures commonly used to estimate the dimensionality involve testing a sequence of dimensionality hypotheses. There is a problem with the size of the test since dimensionality hypotheses are tested sequentially and thus they are actually conditional tests. The focus of this paper is to investigate in asymptotic sense what happens to the sequential testing procedure if the assumption of normality does not hold.

• 품질경영학회지
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• 제26권4호
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• pp.79-87
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• 1998

This paper considers the problem of testing a one-sided hypothesis under the generalized sampling plan which is defined by a sequence of independent Bernoulli trials. A certain lexicographic order is defined for the boundary points of the sampling plan. It is shown that the family of probability mass function defined on the boundary points has monotone likelihood ratio, and that the test function is uniformly most powerful.

• Journal of the Korean Statistical Society
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• 제18권1호
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• pp.38-45
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• 1989

A procedure is considered to the problem of testing whether there exist changes in location at possibly two points in a sequence of independent random variables which are successively drawn from normal population. A test statistics based on modified likelihood ratio is proposed and its asymptotic null distribution is derived through the stochastic process representation. A small sample power comparison is made by Monte Carlo method.