• 한국신재생에너지학회:학술대회논문집
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• 2005.06a
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• pp.538-541
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• 2005

In tapping mode atomic force microscopy(TM-AFM). the vibro-contact response of a resonating tip is used to measure the nanoscale topology and other properties of a sample surface. However, the nonlinear tip-surface interact ions can affect the tip response and destabilize the tapping mode control. Especially it is difficult to obtain a good scanned image of high adhesion surfaces such as polymers and biomoleculars using conventional tapping mode control. In this study, theoretical and experimental investigations are made on the nonlinear dynamics and control of TM-AFM. To analyze the complex dynamics and control of the tapping tip, the classical contact models are adopted due to the surface adhesion. Also we report the surface adhesion is an additional important parameter to determine the control stability of TM-AFM. In addition, we prove that it is more adequate to use Johnson-Kendall-Roberts (JKR) contact model to obtain a reasonable tapping response in AFM for the soft and high adhesion samples.

• Proceedings of the Korean Society for Noise and Vibration Engineering Conference
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• 2007.11a
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• pp.606-611
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• 2007

Proper orthogonal decomposition (POD) is a method for extracting bases for modal decomposition from the ensemble of dynamic signals. Using the POD method, we analyzed the proper orthogonal modes (POMs) of AFM microcantilevers in dynamic mode operations such as Tapping Mode. The POMs and POVs (proper orthogonal values) were computed through MATLAB simulation for the 5-mode model of the microcantilever. We found that the POV portion of the higher POMs of the tapping microcanilever slightly increased in comparison with no tapping. This implies that the modal energy in the fundamental mode can be transferred to the higher modes during tapping.

• Transactions of the Korean Society of Mechanical Engineers A
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• v.30 no.2 s.245
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• pp.135-140
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• 2006

In tapping mode atomic force microscopy (TM-AFM), the vibro-contact response of a resonating tip is used to measure the nanoscale topology and other properties of a sample surface. However, the nonlinear tipsurface interactions can affect the tip response and destabilize the tapping mode control. Especially it is difficult to obtain a good scanned image of high adhesion surfaces such as polymers and biomolecules using conventional tapping mode control. In this study, theoretical and experimental investigations are made on the nonlinear dynamics and control of TM-AFM. Also we report the surface adhesion is an additional important parameter to determine the control stability of TM-AFM. In addition, we proved that it was adequate to use Johnson-Kendall-Roberts (JKR) contact model to obtain a reasonable tapping response in AFM for the soft and high adhesion samples.

• Proceedings of the Korean Society for Noise and Vibration Engineering Conference
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• 2004.11a
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• pp.125-128
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• 2004

AFM(Atomic Force Microscope) becomes a versatile tool in the nanoscale measurements and processes. Especially the tapping mode is a very useful mode in AFM operation to measure and process at the nanoscale. Although the tapping mode has a great potential for the novel techniques such as phase imaging, however, it is not clearly known the fundamental mechanics affected by complex tip-sample interactions. This paper shows the various nonlinear dynamic features in tapping mode AFM microcantilevers including hysteretic jumps and period doublings of the microcantilevers. Also it is discussed the complex dynamics of CNT(Carbon Nanotube) probes and the opportunities on the nanoscale nonlinear dynamics.

• Proceedings of the KSME Conference
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• 2003.11a
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• pp.1560-1565
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• 2003

Tapping mode atomic force microscopy (TM-AFM) utilizes the dynamic response of a resonating probe tip as it approaches and retracts from a sample to measure the topography and material properties of a nanostructure. We present recent results based on nonlinear dynamical systems theory, computational continuation techniques and detailed experiments that yield new perspectives and insight into AFM. A dynamic model including van der Waals and Derjaguin-Muller-Toporov (DMT) contact forces demonstrates that periodic solutions can be represented with respect to the approach distance and excitation frequency. Turning points on the surface lead to hysteretic amplitude jumps as the tip nears/retracts from the sample. Experiments are performed using a tapping mode tip on a graphite sample to verify the predictions.

• Proceedings of the Korean Society for Noise and Vibration Engineering Conference
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• 2004.05a
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• pp.83-86
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• 2004

Carbon nanotube (CNT) tips in tapping mode atomic force microscopy (AFM) enable very high-resolution imaging, measurements, and manipulation at the nanoscale. We present recent results based on experimental analysis that yield new insights into the dynamics of CNT probe tips in tapping mode AFM. Experimental measurements are presented of the frequency response and dynamic amplitude-distance data of a high-aspect-ratio multi-walled (MW) CNT tip to demonstrate the non-linear features including tip amplitude saturation preceding the dynamic buckling of the MWCNT. Surface scanning is performed using a MWCNT tip on a SiO$_2$ grating to verify the imaging instabilities associated with MWCNT buckling when used with normal control schemes in the tapping mode. Lastly, the choice of optimal setpoints for tapping mode control using CNT probe tip are discussed using the experimental results.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2003.11a
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• pp.192-195
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• 2003

There has been increasing interest in the applications of synthesized molecules of nanometer scale in recent years due to their potential utilization in various fields such as biology, optoelectronics and molecular electronics. In this study, the terpyridine-platinum (II) complex on the periphery of the dendritic carbosilane has been prepared from the reaction of Pt(COD)Cl2 and the 4'-functionalized-(2,2':6',2"-terpyridine) on dendrimers. The self-assembly process was carried out to obtain indivially dispersed dendrimer on Au (111) substrate. It was found that STM was unsuitable to obtain a obvious image of dendrimers. Tapping-mode atomic force microscopy(AFM) has been used to investigate the shape and size of dendrimers individually dispersed on Au (111)substrate. As a result, the imaged single dendrimer show that dendrimer is dome shaped and its size can be measured by tapping-mode AFM.

• Transactions of the Korean Society for Noise and Vibration Engineering
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• v.20 no.4
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• pp.414-421
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• 2010

The proper orthogonal decomposition(POD) is used to the vibration analysis of microcantilever in tapping mode atomic force microscopy(AFM). The proper orthogonal modes (POM) are extracted from vibrating signals of microcantilever when it resonates and taps the sample. We present recent ideas based on POD and detailed experiments that yield new perspectives into the microscale structures such as the tapping cantilever. The linearized modeling technique based on POD is very useful to show the principal characteristics of the complex dynamic responses of the AFM microcantilever.

• Proceedings of the Korean Society for Noise and Vibration Engineering Conference
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• 2004.05a
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• pp.73-76
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• 2004

Tapping mode atomic force microscopy (TM-AFM) utilizes the dynamic response of a resonating probe tip as it approaches and retracts from a sample to measure the topography and material properties of a nanostructure. We present recent results based on numerical techniques that yield new perspectives and insight into AFM. It is compared that the dynamic models including van der Waals and Derjaguin-Muller-Toporov(DMT) or Johnson-Kendall-Roberts(JKR) contact forces demonstrates that periodic solutions can be represented with respect to the approach distance and excitation frequency.

• Proceedings of the Korean Society for Noise and Vibration Engineering Conference
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• 2007.05a
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• pp.379-382
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• 2007

The proper orthogonal decomposition(POD) is used to the modal analysis of microcantilever of dynamic mode atomic force microscopy(AFM). The proper orthogonal modes(POM) are extracted from vibrating signals of microcantilever when it resonates and taps the sample. The POMs resemble the linear normal modes(LNM) of cantilever vibrating at each resonance frequency. Some of POMs in tapping microcantilever show quite different shapes from the POMs of the resonating microcantilever. Also this POMs can be applied to model for the complex nonlinear behavior of the dynamic mode AFM microcantilevers.