• 품질경영학회지
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• 제28권3호
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• pp.44-52
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• 2000

In this paper we apply VSS X chart to the case when two assignable causes effect the process mean shift. We compare the case when two compound assignable causes effect the process mean with another one which effects individually. For the practical use of VSS $\bar{X}$ chart we propose the sample size which minimizes the average number of samples until the signal is given in out-of-control state.

• 의료ㆍ복지 건축 : 한국의료복지건축학회 논문집
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• 제3권4호
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• pp.27-34
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• 1997

This study aims at proposing the basic architectural data of the medical recording department for the general hospital planning and design. This research investigated the size of working space and the chart custody space through actual survey and the present conditions of space were analyzed. In result, this study proposes the formula for the calulation of the chart custody space according to computerization level and the chart custody planning year.

• 한국경영과학회:학술대회논문집
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• 대한산업공학회/한국경영과학회 1996년도 춘계공동학술대회논문집; 공군사관학교, 청주; 26-27 Apr. 1996
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• pp.15-18
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• 1996

Shewhart control chart is a basic technique to monitor the state of a process. We observe observations of a group of size four or five in a rational way and plot some statistics (e.g., means and ranges) on the chart. When setting up the control chart, the control limits are calculated based on preliminary 20-40 samples, which were supposedly obtained from stable operating conditions. But it may be hard to believe, especially at the beginning of constructing the chart for the first time, whether the process is stable and hence all samples were generated under the homogeneous operating conditions. In this report we suggest a mechanism to obtain robust control limits under self-criticism. When outliers are present in the sample, we obtain tighter control limits and hence increase the sensitivity of the chart. Examples will be given via simulation study.

• International Journal of Quality Innovation
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• 제2권1호
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• pp.69-86
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• 2001

The economic design of control charts has been researched for over four decades since Duncan proposed the concept in 1956. Few studies, however, have focused attention on the economic design of a moving average (MA) control chart. An MA control chart is more effective than the Shewhart chart in detecting small process shifts [9]. This paper provides an economic model for determining the optimal parameters of an MA control chart with multiple assignable causes and two failures in the production process. These parameters consist of the sample size, the spread of the control limit and the sampling interval. A numerical example is shown and the sensitivity analysis shows that the magnitude of shift, rate of occurrence of assignable causes and increasing cost when the process is out of control have a more significant effect on the loss cost, meaning that one should more carefully estimate these values when conducting an economic analysis.

• 품질경영학회지
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• 제34권4호
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• pp.125-132
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• 2006

An adjusted control limit of the $\overline{X}$ chart is proposed for monitoring the continually improving processes. The continual improvement of the process implies the decrease of the process variance, which is represented by a logistic curve. The process standard deviation is estimated by the exponentially weighted moving average of the sample standard deviations from the past to the current times. The control limits are adjusted by the estimated standard deviation at every sampling time. The performance of the adjusted control limit is compared with that of the standard control limits for various cases of the decreasing speed and size of the variance. The results show that the $\overline{X}$ chart with the adjusted control limits provides better performances for monitoring the small and moderate shifts in continually improving processes.

• 산업경영시스템학회지
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• 제21권47호
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• pp.211-218
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• 1998

In start-up process control applications it may be necessary to limit the sample size to one measurement. A control chart for individual measurements is used whenever it is desirable to examine each individual value from the process immediately. A possible option would be to use an exponential weighted moving(EWM), using modifying statistics with individual measurement, chart for monitoring the process center, and using a moving range (MR) chart for monitoring process variability. In this paper it is shown that there is scheme in using the EWM procedure based on average run length. An expression for the ARL is given in terms of an integral equation, approximated using numerical quadrature. In this case, where it is reasonable to assume normality and negligible autocorrelation in the observations, provide graphs that simplify the design of EWM-MR chart and taking method of exponential smoothing constant(λ) and constant(K) are suggested. The charts suggested above evaluate using the conditional probability.

• 산업경영시스템학회지
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• 제32권1호
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• pp.94-101
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• 2009

Complex Products may present more than one type of defects and these defects are not always of equal severity. These defects are classified according to their seriousness and effect on product quality and performance. Demerit systems are very effective systems to monitoring the different types of defects. So, classical demerit control chart used to monitor counts of several different types of defects simultaneously in complex products. S.M. Na et al.(2003) proposed the Demerit-CUSUM for the improvement of the demerit control chart performance and Nembhard, D. A. et al.(2001) and G.Y Cho et al.(2004) developed a Demerit control chart using the EWMA technique and evaluated the performance of the control chart. In this paper, we present an effective method for process control using the Demerit-CUSUM with fast initial response. Moreover, we evaluate exact performance of the Demerit-CUSUM control chart with fast initial response, Demerit-CUSUM and Demerit-EWMA according to changing sample size or parameters.

• 산업경영시스템학회지
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• 제33권2호
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• pp.9-17
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• 2010

Complex products may present more than one type of defects and these defects are not always of equal severity. These defects are classified according to their seriousness and effect on product quality and performance. So, demerit systems are very effective systems to monitor the different types of defects. Recently, Kang et al.(2009) proposed the revised Demerit-CUSUM for the evaluation of the Demerit-CUSUM control chart performance exactly. In this paper, we present an advanced Demerit control chart using the double EWMA technique. The double EWMA technique is very efficient and strong method for process control where defects and nonconformities occur with various defect types. Moreover, we compare exact performance of Demerit-CUSUM, Demerit-EWMA and Demerit-DEWMA control chart according to changing sample size or mean shifts magnitude. By the result, we confirm that the performance of Demerit-DEWMA control chart is more than the performance of the Demerit-CUSUM and Demerit-EWMA control chart.

• 한국컴퓨터정보학회논문지
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• 제25권12호
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• pp.187-194
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• 2020

오늘날 반도체나 석유 화학 공정과 같이 프로세스 중심의 산업에서는 관측된 자료들 사이에 자기 상관이 존재한다. 자기상관이 존재하는 공정에 대한 관리 방법으로는 관측치를 이용하여 뱃치 평균이 독립에 가까워지도록 뱃치를 구성하여 관리하거나, 관측치의 EWMA (지수 가중치 이동 평균) 통계량을 EWMA 관리도에 적용하는 방법등이 주로 사용되고 있다. 본 논문에서는 관찰치에 대한 관리 방법으로 일반적으로 사용되는 UBM 의 뱃치 크기를 결정하는 방법을 소개하고, ARL(평균 실행 길이)을 기반으로 최적 뱃치 크기를 정하는 방법과 그러한 뱃치 구성에서 공정의 표준 편차를 추정하는 방법을 제안 한다. 자기상관이 존재하는 공정에 대한 개선된 관리도를 제안하고자 한다.

• 대한산업공학회지
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• 제33권4호
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• pp.457-468
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• 2007

This paper proposes an adaptive moving average (A-MA) control chart with variable sampling intervals (VSI) for detecting shifts in the process mean. The basic idea of the VSI A-MA chart is to adjust sampling intervals as well as to accumulate previous samples selectively in order to increase the sensitivity. The VSI A-MA chart employs a threshold limit to determine whether or not to increase sampling rate as well as to accumulate previous samples. If a standardized control statistic falls outside the threshold limit, the next sample is taken with higher sampling rate and is accumulated to calculate the next control statistic. If the control statistic falls within the threshold limit, the next sample is taken with lower sampling rate and only the sample is used to get the control statistic. The VSI A-MA chart produces an 'out-of-control' signal either when any control statistic falls outside the control limit or when L-consecutive control statistics fall outside the threshold limit. The control length L is introduced to prevent small mean shifts from being undetected for a long period. A Markov chain model is employed to investigate the VSI A-MA sampling process. Formulae related to the steady state average time-to signal (ATS) for an in-control state and out-of-control state are derived in closed forms. A statistical design procedure for the VSI A-MA chart is proposed. Comparative studies show that the proposed VSI A-MA chart is uniformly superior to the adaptive Cumulative sum (CUSUM) chart and to the Exponentially Weighted Moving Average (EWMA) chart, and is comparable to the variable sampling size (VSS) VSI EWMA chart with respect to the ATS performance.