• 제목/요약/키워드: Short Circuit Test

검색결과 259건 처리시간 0.023초

7.2kV급 로타리아크식 $SF_6$가스 전자접촉기 소호부 개발연구 (Development of Model Interrupter of 7.2kV $SF_6$ Gas Electromagnetic Contactor Using Rotary Arc Principle)

  • 장기찬;신영준;박경엽;정진교;김진기;김귀식;이승학
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 1995년도 하계학술대회 논문집 A
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    • pp.30-32
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    • 1995
  • The model interrupters of $SF_6$ gas electromagnetic contactor whose ratings are the voltage of 7.2kV and the short circuit current of 4.0kA have been designed and manufactured on the basis of theoretical and computational analysis for its development. The eddy current analysis, the magnetic field analysis and the calculation of the rotational force on arcs have been conducted using FLUX2D package. The short circuit current interrupting tests have been conducted to the model interrupters using the simplified capacitive synthetic test circuit in KERI. The results show that the model interrupters have a sufficient interrupting capability and the new design concept is proper for a good interrupting performance.

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Sn-3.0Ag-0.5Cu 솔더링에서 플럭스 잔사가 전기화학적 마이그레이션에 미치는 영향 (Flux residue effect on the electrochemical migration of Sn-3.0Ag-0.5Cu)

  • 방정환;이창우
    • Journal of Welding and Joining
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    • 제29권5호
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    • pp.95-98
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    • 2011
  • Recently, there is a growing tendency that fine-pitch electronic devices are increased due to higher density and very large scale integration. Finer pitch printed circuit board(PCB) is to be decrease insulation resistance between circuit patterns and electrical components, which will induce to electrical short in electronic circuit by electrochemical migration when it exposes to long term in high temperature and high humidity. In this research, the effect of soldering flux acting as an electrical carrier between conductors on electrochemical migration was investigated. The PCB pad was coated with OSP finish. Sn3.0Ag0.5Cu solder paste was printed on the PCB circuit and then the coupon was treated by reflow process. Thereby, specimen for ion migration test was fabricated. Electrochemical migration test was conducted under the condition of DC 48 V, $85^{\circ}C$, and 85 % relative humidity. Their life time could be increased about 22% by means of removal of flux. The fundamentals and mechanism of electrochemical migration was discussed depending on the existence of flux residues after reflow process.

The Korean Elementary Students' Conceptions of the Simple Electric Circuit

  • Seo, Sang-Oh;Kwon, Jae-Sool
    • 한국과학교육학회지
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    • 제22권5호
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    • pp.944-956
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    • 2002
  • The purpose of this study was to investigate students' conceptions of the simple electric circuit using a battery and a bulb. 19 fourth grade students from a rural elementary school in Korea participated in this study. Data on the children's understandings of electric circuit were collected through three sources; prediction tests, drawing tests and individual interviews. The prediction tests were paper and pencil tests composed of 10 problems, predicting whether bulbs in 10 simple circuit diagrams would light. For each prediction, the children were asked to provide a written explanation of their thinking. The drawing tests consisted of 6 problems. One was to draw the inside of the bulb base, and the others were to make the wire connections between a battery and a bulb in the diagrams, to light the bulb. The interviews were conducted with seven children who showed differing degrees of understanding. No student was aware of the wire connections inside the bulb base. Many students stated whether the bulb would light or not, according to the tip of the bulb contacting the positive battery terminal and an end of wire contacting the negative battery terminal. Most of them thought that the tip of the bulb should contact the positive battery terminal, so that the bulb would light. In short, students did not use a scientific conception of electric current to predict and explain the electric circuit.

25.8kV 25kA 열팽창분사식 가스차단기 개발에 관한 연구 (I) (A Study on the Development of 25.8kV 25kA Gas Circuit Breaker Using Thermal-Expansion Principle (I))

  • 송기동;박경엽;신영준;장기찬;김귀식;김진기
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 1995년도 하계학술대회 논문집 A
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    • pp.160-164
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    • 1995
  • In order to develop a medium voltage class gas circuit breaker by our own technology, we designed and manufactured the model interrupters using the hybrid arc extinguishing principle which adopts the thermal expansion principle in the large current region and the arc rotation principle by permanent magnet in the small current region. As the results of the first year research out of three years' research period, the main design parameters such as the volume of thermal expansion chamber, the distance between fixed contact and nozzle, the length of nozzle throat, the nozzle expansion angle and the magnitude of permanent magnet etc. have been determined. 4 types of model interrupters have been designed and manufactured considering the main design parameters. The 25kA short-circuit test and capacitive current breaking test have been performed for the model interrupters and the test results analyzed to improve the model interupters.

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100마력 고온초전도 동기전동기 개발 (Development of a 100 hp HTS Synchronous Motor)

  • 손명환;백승규;이언용;권영길;조영식;김종무;문태선;김영춘;권운식;박희주
    • 대한전기학회논문지:전기기기및에너지변환시스템부문B
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    • 제54권2호
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    • pp.94-100
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    • 2005
  • Korea Electrotechnology Research Institute(KERI) has successfully developed a 100hp-1800rpm-class high temperature superconducting(HTS) motor with high efficiency under partnership with Doosan Heavy Industries & Construction Co. Ltd. This motor has a HTS field winding and an air-cooled stator. The advantages of HTS motor can be represented by a reduction of 50% in both losses and size compared to conventional motors of the same rating. The cooling system is based on the heat transfer mechanism of the thermosyphon by using GM cryocooler as cooling source. The cold head is in contact with the condenser of a Ne-filled thermosyphon. Independently, the rotor assembly was tested at the stationary state and combined with stator. The HTS field winding could be cooled into below 30K. Test of open-circuit characteristics(OCC) and short-circuit characteristics(SCC) and load test with resistive load bank were conducted in generator mode. Also, load tests in motor mode driven by inverter were finished at KERI. Maximum operating current of field winding at 30K was 120A. From OCC and SCC test results synchronous inductance and synchronous reactance were 2.4mH, 0.49pu, respectively. Efficiency of this HTS machine was 93.3% in full load(100hp) test. This paper will present design, construction. and experimental test results of the 100hp HTS machine.

PSA 기법에 근거한 생산라인상의 디지털 회로 보오드 검사전략에 대한 연구 (A Study on the Test Strategy of Digital Circuit Board in the Production Line Based on Parallel Signature Analysis Technique)

  • 고윤석
    • 대한전기학회논문지:시스템및제어부문D
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    • 제53권11호
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    • pp.768-775
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    • 2004
  • The SSA technique in the digital circuit test is required to be repeated the input pattern stream to n bits output nodes n times in case of using a multiplexor. Because the method adopting a parallel/serial bit convertor to remove this inefficiency has disadvantage of requiring the test time n times for a pattern, the test strategy is required, which can enhance the test productivity by reducing the test time based on simplified fault detection mechanism. Accordingly, this paper proposes a test strategy which enhances the test productivity and efficiency by appling PAS (Parallel Signature Analysis) technique to those after analyzing the structure and characteristics of the digital devices including TTL and CMOS family ICs as well as ROM and RAM. The PSA technique identifies the faults by comparing the reminder from good device with reminder from the tested device. At this time, the reminder is obtained by enforcing the data stream obtained from output pins of the tested device on the LFSR(Linear Feedback Shift Resister) representing the characteristic equation. Also, the method to obtain the optimal signature analyzer is explained by furnishing the short bit input streams to the long bit input streams to the LFSR having 8, 12, 16, 20bit input/output pins and by analyzing the occurring probability of error which is impossible to detect. Finally, the effectiveness of the proposed test strategy is verified by simulating the stuck at 1 errors or stuck at 0 errors for several devices on typical 8051 digital board.

Sn 표면처리된 FR-4 재질 PCB에서의 이온마이그레이션 가속시험 (Acceleration Test of Ion Migration in FR-4 PCB Plated with Sn)

  • 황순미;정용백;김철희;이관훈
    • 한국신뢰성학회지:신뢰성응용연구
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    • 제12권3호
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    • pp.153-163
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    • 2012
  • Recently, as a electronic components are becoming more high-density, so that electronic circuits have smaller pitches between the leads and are more vulnerable to insulation failure. And the reliability of electric insulation has become an ever important issue as device contact pitches and print patterns shrink. Ion migration occurs in highly humid environment as voltage is applied to an installed print circuit. Under highly humid and voltage applied circumstances, electronic components respond to applied voltages by electrochemical ionization of metals, and a conducting filament forms between the anode and cathode across a nonmetallic medium. This leads to short-circuit failure of the electronic component. In thesis, we study acceleration test of ion migration in FR-4 PCB plated with Sn. Voltage applied test of FR-4 PCB circuits plated with Sn was tested in the temperature and humidity environments. As a result of this test, equation of acceleration model was derived.

상용변압기와 결합된 초전도체 및 상전도체 한류기의 고장전류 및 보호기기 동작특성 (Characteristics of the Fault Current and the Protection for Superconducting and Normal Conducting Limiter combined with a Transformer)

  • 임인규;최효상;정병익
    • 전기학회논문지
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    • 제62권9호
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    • pp.1313-1317
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    • 2013
  • With increasing demand of power, the equipment of power system is enlarging and the absolute capacity is going up. As a result, when a fault occurs, the fault current is consistently increasing. Therefore, I suggested some solution for limiting the fault current more efficiently. This study shows the characteristics of superconducting limiting elements and normal conducting elements combined with a transformer. We performed a short-circuit test about the fault current by using SCR switching control system operated from a CT. When short circuit accidents happened in the secondary side of a transformer, fault currents flowed and a SCR switching control system was operated. It resulted in a decrease of the fault current in the limited elements of third winding connected in parallel. For this test, we used YBCO thin films and normal conducting elements as the limited elements. Within a cycle, a superconducting fault current limiter with YBCO thin films reduced more than 90% of fault current because the resistance of superconducting elements sustainedly grew. On the other hand, the limiter with normal conductors limited as much as a set value because its resistance characteristic was linear. Consequently, in case of the limiter with superconductor, limiting range of the circuit was wide but the range of protective detection was undefined. In contrast, as for the limiter with normal conductors, limiting range and protection duty were appropriate.

스마트 그리드 배전계통을 위한 직렬 공진형 한류기 적용 방법 및 EMTP-RV 시뮬레이션 연구 (Application Method and EMTP-RV Simulation of Series Resonance Type Fault Current Limiter for Smart Grid based Electrical Power Distribution System)

  • 고윤석;이우철
    • 한국전자통신학회논문지
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    • 제19권2호
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    • pp.361-370
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    • 2024
  • 본 논문에서는 저비용 제작이 가능한 직렬 공진형 한류기를 스마트 그리드 배전 계통에 적용하기 위한 방법을 연구하였다. 먼저, 한류기의 직렬 공진 회로에 주입되는 단락 전류의 고조파 성분들이 과도 응답의 피크 값에 미치는 영향에 대해서 분석하였으며, 퍼센트 임피던스 기반 고장 전류 계산법을 적용하여 정상 상태 응답을 결정하는 방법을 연구하였다. 다음, 시험 배전 선로에 적용하여 채택된 방법의 유효성을 검증하였다. 설계된 한류기를 적용한 시험 배전계통을 EMTP_RV를 이용하여 모델링하였으며 3상 단락 고장 시나리오를 모의하였다. 고장 모의 결과에서 한류기 적용 후 고장 전류의 정상 상태 응답이 설계 목표 값을 정확하게 추종하는 것을 확인하였다. 또한 한류기 적용 전과 후의 고장전류 파형 비교에서 고장 전류가 크게 억제되는 것을 확인함으로써 배전 계통에 대한 직렬 공진형 한류기 적용 효과를 확인할 수 있었다.

BiCMOS회로의 고장 분석과 테스트 용이화 설계 (Fault analysis and testable desing for BiCMOS circuits)

  • 서경호;이재민
    • 전자공학회논문지A
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    • 제31A권10호
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    • pp.173-184
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    • 1994
  • BiCMOS circuits mixed with CMOS and bipolar technologies show peculiar fault characteristics that are different from those of other technoloties. It has been reported that because most of short faults in BiCMOS circuits cause logically intermediate level at outputs, current monitoring method is required to detect these faluts. However current monitoring requires additional hardware capabilities in the testing equipment and evaluation of test responses can be more difficult. In this paper, we analyze the characteristics of faults in BiCMOS circuit together with their test methods and propose a new design technique for testability to detect the faults by logic monitoring. An effective method to detect the transition delay faults induced by performance degradation by the open or short fault of bipolar transistors in BiCMOS circuits is presented. The proposed design-for-testability methods for BiCMOS circuits are confirmed by the SPICE simulation.

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