• International Journal of Reliability and Applications
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• 제12권2호
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• pp.103-116
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• 2011

A series-parallel system with independent but non-identical components is considered. The expressions have been derived for the joint reliability importance (JRI) of m (${\geq}2$) components, chosen from a series-parallel system. JRIs of components of two different series-parallel systems are studied analytically and graphically.

• International Journal of Reliability and Applications
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• 제9권2호
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• pp.153-165
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• 2008

This paper discusses the reliability equivalences of a series-parallel system. The system components are assumed to be independent and identical. The failure rates of the system components are functions of time and follow Weibull distribution. Three different methods are used to improve the given system reliability. The reliability equivalence factor is obtained using the reliability function. The fractiles of the original and improved systems are also obtained. Numerical example is presented to interpret how to utilize the obtained results.

• Journal of Power Electronics
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• 제16권4호
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• pp.1426-1437
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• 2016

In different industrial and mission oriented applications, redundant or standby semiconductor systems can be implemented to improve the reliability of power electronics equipment. The proper structure for implementation can be one of the redundant or standby structures for series or parallel switches. This selection is determined according to the type and failure rate of the fault. In this paper, the reliability and the mean time to failure (MTTF) for each of the series and parallel configurations in two redundant and standby structures of semiconductor switches have been studied based on different failure rates. The Markov model is used for reliability and MTTF equation acquisitions. According to the different values for the reliability of the series and parallel structures during SC and OC faults, a comprehensive comparison between each of the series and parallel structures for different failure rates will be made. According to the type of fault and the structure of the switches, the reliability of the switches in the redundant structure is higher than that in the other structures. Furthermore, the performance of the proposed series and parallel structures of switches during SC and OC faults, results in an improvement in the reliability of the boost dc/dc converter. These studies aid in choosing a configuration to improve the reliability of power electronics equipment depending on the specifications of the implemented devices.

• 품질경영학회지
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• 제40권3호
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• pp.278-285
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• 2012

Purpose: Weapon systems have the long life cycle unlike the consumer product. Thus, the reliability of weapon system is improved during the life cycle through the steady technical change. In this paper, we deal with the method of evaluating the reliability of weapon system with the field failure data. Methods: Especially, we present how to gather the field failure data and evaluate the reliability through the case of K-series weapon system. To evaluate reliability, the reliability growth model is used and the result is discussed. Results: It is steadily improved the reliability of K-series weapon system deployed from 2000 to 2004. The frequency of the failures that affect the mission is largely reduced and MTBMF(mean time between mission failure) is also improved. Conclusion: We can guess the trend of the reliability of weapon system with the field data through this study. Furthermore, it can be used to improve the reliability and make maintenance policy.

• International Journal of Reliability and Applications
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• 제9권1호
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• pp.79-93
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• 2008

The aim of this work is to generalize reliability equivalence techniques to apply them to a system consists of two independent and non-identical components connected in series(parallel) system, that have constant failure rates. We shall improve the system by using one component only. We start by establishing two different types of reliability equivalence factors, the survival reliability equivalence (SRE) and mean reliability equivalence (MRE) factors. Our second studies, introducing some applications for our studies in airports and our life. Also, we introduced some numerical results.

• International Journal of Reliability and Applications
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• 제8권2호
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• pp.137-151
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• 2007

Posbist reliability of typical systems is preliminarily discussed in Cai (1991). In this paper, we focus on the posbist reliability analysis of some typical systems in depth. First, the lifetime of the system is dealt as a fuzzy variable defined on the possibility space (U, ${\phi}$, $P_{oss}$) and the universe of discourse is expanded from (0, $+{\infty}$) to ($-{\infty},\;+{\infty}$). Then, a concrete possibility distribution function of the fuzzy variable is given, i.e., a Gaussian fuzzy variable. Finally, posbist reliability of typical systems (series, parallel, series-parallel, parallel-series, cold redundant system) is deduced. The expansion makes the proofs of some theorems straightforward and allows us to easily obtain the posbist reliability of typical systems. To illustrate the method a numerical example is given.

• Journal of the Korean Data and Information Science Society
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• 제14권3호
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• pp.571-578
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• 2003

In this paper, we consider two components system which have bivariate weibull model with bivariate type I censored data. We proposed maximum likelihood estimator and relative frequency estimator for the reliability of series system. Also, we construct approximate confidence intervals for the reliability based on the two proposed estimators. And we present a numerical study.

• International Journal of Reliability and Applications
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• 제10권1호
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• pp.43-57
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• 2009

In this article, we study the reliability equivalence factor of a series system. The failure rates of the system components are functions of time t. we study two cases of non-constat failure rates (i) weibull distribution (ii) linear increasing failure rate distribution. There are two methods are used to improve the given system. Two types of reliability equivalence factors are discussed. Numerical examples are presented to interpret how one can utilize the obtained results.

• International Journal of Reliability and Applications
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• 제7권2호
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• pp.111-125
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• 2006

This paper introduces different vectors of the reliability equivalence factors of a series system consists of n independent and nonidentical components. The failure rates of the system components are assumed to be constant. The reliability function and mean time to failure are used as performances to derive the reliability equivalences of the system. The results presented here generalize those available in the literatures. Numerical study is given to explain how one can utilize the theoretical results obtained.

• Journal of applied mathematics & informatics
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• 제19권1_2호
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• pp.439-445
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• 2005

This paper is to investigate the approximate confidence limits of the reliability performances (such as failure rate, reliability function and average life) for a cold standby series system. The Bayesian approximate upper confidence limit of failure rate is obtained firstly, and next Bayesian approximate lower confidence limits for reliability function and average life are presented. The expressions for calculating Bayesian lower confidence limits of the reliability function and average life are also obtained, and an illustrative example is examined numerically by means of the Monte-Carlo simulation. Finally, the accuracy of confidence limits is discussed.