• Journal of the Korea Society of Computer and Information
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• v.6 no.1
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• pp.7-13
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• 2001

As the density of VLSI increases, the conventional logic testing is not sufficient to completely detect the new faults generated in design and fabrication processing. Recently. IDDQ testing becomes very attractive since it can overcome the limitations of logic testing. This paper presents a new BIC for the internal current test in CMOS logic circuit. Our circuit is composed of Magnetoresistive current sensor, level shifter, comparator, reference voltage circuit and a circuit be IDDQ tested as a kind of self-testing fashion by using the proposed BIC.

• International Journal of Aeronautical and Space Sciences
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• v.11 no.2
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• pp.80-86
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• 2010

We propose a spacecraft attitude estimation algorithm using a federated unscented Kalman filter. For nonlinear spacecraft systems, the unscented Kalman filter provides better performance than the extended Kalman filter. Also, the decentralized scheme in the federated configuration makes a robust system because a sensor fault can be easily detected and isolated by the fault detection and isolation algorithm through a sensitivity factor. Using the proposed algorithm, the spacecraft can continuously perform a given mission despite navigation sensor faults. Numerical simulation is performed to verify the performance of the proposed attitude estimation algorithm.

• Journal of Institute of Control, Robotics and Systems
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• v.5 no.8
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• pp.941-947
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• 1999

As pressure transducers are employed in many fields such as production facilities, test facilities vehicles and industrial machinery, there is an increasing need for high precision measurement of pressure without any calibration or maintenance. In this paper, we discuss the development of a smart thin film pressure transducer which is highly suitable for a precise measurement of pressure. The smart functions include automatic zero tracking, automatic span adjustment, temperature compenstion, continuous self-diagnostics for faults (open strain gages, abnormal data, incorrect A/D conversion, and overpressure), data memory and multi-drop communication with PC

• Proceedings of the Korean Society for Noise and Vibration Engineering Conference
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• 2008.04a
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• pp.809-816
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• 2008

With increasing demands for reducing cost of maintenance which can detect machine fault automatically; low cost and intelligent functionality sensors are required. Rapid developments, in semiconductor, computing, and communication have led to a new generation of sensor called "smart" sensors with functionality and intelligence. The purpose of this research is comparison of machine fault classification between general analyzer signals and smart sensor signals. Three types of sensors are used in induction motors faults diagnosis, which are vibration, current and flux. Classification results are satisfied.

• Proceedings of the KIPE Conference
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• 2002.07a
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• pp.183-187
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• 2002

In this paper, the effects of encoder fault and current sensor fault in direct torque controlled induction motor drives are analyzed. On the basis of the analyzed results, a observer based fault detection and isolation scheme is presented. To verify the performance of proposed algorithms, the speed control system is designed for induction motor and evaluated by experimental study. Experimental results various type of sensor faults show the detection and isolation performance of the SFDIS and the applicability of this scheme to fault tolerant control system design.

• International Journal of Aeronautical and Space Sciences
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• v.7 no.1
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• pp.73-83
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• 2006

In this paper, a redundancy management system for aircraft is studied, and fault detection and isolation algorithms of inertial sensor system are proposed. Contrary to the conventional aircraft systems, UAV system cannot allow triple or quadruple hardware redundancy due to the limitations on space and weight. In the UAV system with dual sensors, it is very difficult to identify the faulty sensor. Also, conventional fault detection and isolation (FDI) method cannot isolate multiple faults in a triple redundancy system. In this paper, two FDI techniques are proposed. First, hardware based FDI technique is proposed, which combines a parity equation approach with a wavelet based technique. Second, analytic FDI technique based on the Kalman filter is proposed, which is a model-based FDI method utilizing the threshold value and the confirmation time. To provide the reference value for detecting the fault, residuals are calculated using the extended Kalman filter. To verify the effectiveness of the proposed FDI methods, numerical simulations are performed.

• Journal of the Korean Institute of Telematics and Electronics B
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• v.32B no.11
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• pp.1434-1444
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• 1995

Current test has recently been known to be a promising testing method in CMOS VLSI because conventional voltage test can not make sure of the complete detection of bridging, gate-oxide shorts, stuck-open faults and etc. This paper presents a new BIC(built-in current sensor) for the internal current test in CMOS logic circuit. A single phase clock is used in the BIC to reduce the control circuitry of it and to perform a self- testing for a faulty current. The BIC is designed to detect the faulty current at the end of the clock period, so that it can test the CUT(circuit under test) with much longer critical propagation delay time and larger area than conventional BICs. The circuit is composed of 18 devices and verified by using the SPICE simulator.

• Journal of Korea Multimedia Society
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• v.10 no.10
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• pp.1260-1270
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• 2007

Testing and diagnosis of analog circuits(or mixed-signal circuits) continue to be a hard task for test engineers and efficient test methodologies to solve these problems are needed. This paper proposes a novel analog circuits test technique using time slot specification (TSS) based built-in current sensors (BICS). A technique for location of a fault site and separation of fault type based on TSS is also presented. The proposed built-in current sensors and TSS technique has high testability, fault coverage and a capability to diagnose catastrophic faults and parametric faults in analog circuits. In order to reduce time complexity of test point insertion procedure, external output and power nodes are used for test points and the current sensors are implemented in the automatic test equipment(ATE). The digital output of BICS can be easily combined with built-in digital test modules for analog IC test.

• Journal of the Korean Institute of Telematics and Electronics C
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• v.35C no.12
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• pp.13-22
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• 1998

In this paper, we propose a high-performance BICS(built-in current sensor) which is fabricated in 0.8${\mu}{\textrm}{m}$ single-poly two-metal process for IDDQ testing of CMOS VLSI circuit. The CUT(circuit under test) is 4-bit full adder with a bridging fault. Using two nMOSs that have different size, two bridging faults that have different resistance values are injected in the CUT. And controlling a gate node, we experimented various fault effects. The proposed BICS detects the faulty current at the end of the clock period, therefore it can test a CUT that has a much longer critical propagation delay time and larger area than conventional BICSs. As expected in the HSPICE simulation, experimental results of fabricated chip demonstrated that the proposed BICS can exactly detect bridging faults in the circuit.

• Journal of the Institute of Electronics and Information Engineers
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• v.54 no.7
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• pp.93-102
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• 2017

Recently increasing usage of smartphones makes the Internet of Things (IoT) a leading technology that can collect and share data through sensor networks and wireless communication such as low-power Bluetooth (BLE). BLE-based application can provide operators more precise information on Automatic Door system by remotely diagnosing the system faults through wireless sensor networks and sensors around the Automatic Door. In this paper, a smart device with extended BLE module is implemented which can monitor and Control the system states and faults remotely without on-site diagnostic. while maintaining system integrity so that increase efficiency of time and costs for system management. We can use the results of this research as a basis in evaluating reliability of data between devices, extending communication module in Controller of obsolete Door systems, and establishing centralized monitoring systems in near future with multi-channel Door Controls.