• Journal of the Korea Institute of Information and Communication Engineering
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• v.12 no.7
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• pp.1227-1234
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• 2008

In this paper is designed a 256-bit synchronous OTP(one-time programmable) memory required in application fields such as automobile appliance power ICs, display ICs, and CMOS image sensors. A 256-bit synchronous memory cell consists of NMOS capacitor as antifuse and access transistor without a high-voltage blocking transistor. A gate bias voltage circuit for the additional blocking transistor is removed since logic supply voltage VDD(=1.5V) and external program voltage VPPE(=5.5V) are used instead of conventional three supply voltages. And loading current of cell to be programmed increases according to RON(on resistance) of the antifuse and process variation in case of the voltage driving without current constraint in programming. Therefore, there is a problem that program voltage can be increased relatively due to resistive voltage drop on supply voltage VPP. And so loading current can be made to flow constantly by using the current driving method instead of the voltage driving counterpart in programming. Therefore, program voltage VPP can be lowered from 5.9V to 5.5V when measurement is done on the manufactured wafer. And the sens amplifier circuit is simplified by using the sens amplifier of clocked inverter type instead of the conventional current sent amplifier. The synchronous OTP of 256 bits is designed with Magnachip $0.13{\mu}m$ CMOS process. The layout area if $298.4{\times}314{\mu}m2$.

• The Journal of Korean Institute of Communications and Information Sciences
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• v.16 no.2
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• pp.145-154
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• 1991

In this dissertation, the same reading and writing operation of general SRAM, the algonthm and hardware of 8 bit $\times$16 word CAM(Content Addressable Memory) which carry out the parallel that search is presented. The designed CAM chip consists of five functional blocks (CAM cell array, Address Deceden, Address Encoden. Data Selector, Sense Amplifier). The smulation is performed using logic smmulator on Apollo workstation and PSPICE eitcut simulation on PC/AT. The designed CAM was fabricated by 3um CMOS N Well process (ETRI) design nitles and testing was performed.

• JSTS:Journal of Semiconductor Technology and Science
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• v.7 no.1
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• pp.1-10
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• 2007

In recent few years, low-power electronics has been a leading drive for technology developments nourished by rapidly growing market share. Mobile DRAM, as a fundamental block of hand-held devices, is now becoming a product developed by limitless competition. To support application specific mobile features, various new power-reduction schemes have been proposed and adopted by standardization. Tightened power budget in battery-operated systems makes conventional schemes not acceptable and increases difficulty of the circuit design. The mobile DRAM has successfully moved down to 1.5V era, and now it is about to move to 1.2V. Further voltage scaling, however, presents critical problems which must be overcome. This paper reviews critical issues in mobile DRAM design and various circuit schemes to solve the problems. Focused on analog circuits, bitline sensing, IO line sensing, refresh-related schemes, DC bias generation, and schemes for higher data rate are covered.

• Proceedings of the IEEK Conference
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• 2003.07b
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• pp.815-818
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• 2003

New sensing and writing schemes for a magneto-resistive random access memory (MRAM) with a twin cell structure are proposed. In order to enhance the cell reliability, a scheme of the low voltage precharge is employed to keep the magneto resistance (MR) ratio constant. Moreover, a common gate amplifier is utilized to provide sufficient voltage signal to the bit line sense amplifiers under the small MR ratio structures. To enhance the writing reliability, a current mode technique with tri-state current drivers is adopted. During write operations, the bit and /bit lines are connected. And 'HIGH' or 'LOW' data is determined in terms of the current direction flowing through the MTJ cell. With the viewpoint of the improved reliability of the cell behavior and sensing margin, HSPICE simulations proved the validity of the proposed schemes.

• JSTS:Journal of Semiconductor Technology and Science
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• v.2 no.3
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• pp.173-179
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• 2002

We propose a novel sensing circuit for 2T-2MTJ MRAM that can be used for high speed synchronous operation. Proposed bit-line sense amplifier detects small voltage difference in bit-lines and develops it into rail-to-rail swing while maintaining small voltage difference on TMR cells. It is small enough to fit into each column that the whole data array on selected word line are activated as in DRAMs for high-speed read-out by changing column addresses only. We designed a 256Kb read-only MRAM in a $0.35\mu\textrm{m}$ logic technology to verify the new sensing scheme. Simulation result shows a 25ns RAS access time and a cycle time shorter than 10 ns.

• Transactions of the Korean Society for Noise and Vibration Engineering
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• v.15 no.2 s.95
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• pp.239-247
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• 2005

This paper deals with the development of a contact-type counting device using a piezoelectric polymer film as a sensor. The piezoelectric and vibration characteristics of the film under a bending vibration were investigated theoretically and experimentally. A counting device, which includes filters, an amplifier, an analog-digital converter, and a display, was designed and fabricated. The performance of the piezoelectric polymer sensor was evaluated in the sense of the responses to contact force, contact frequency, and contact speed. The life and the temperature effect were also investigated for the piezoelectric film sensor.

• Proceedings of the IEEK Conference
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• 2006.06a
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• pp.561-562
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• 2006

This paper presents an SRAM which uses the technique to equalize the internal cell node by adding an NMOS transistor. Accordingly, the write driver operates rapidly in a differential current of bit lines, and the operation speed of SRAM improves. An SRAM was implemented with a memory cell, a sense amplifier and a write driver. The SRAM obtained the performance of 18% power reduction and improvement of 56% operation speed. And Power delay product was reduced with 63%. The proposed SRAM was designed based on a 0.35um 1P4M CMOS technology.

• JSTS:Journal of Semiconductor Technology and Science
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• v.11 no.4
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• pp.302-308
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• 2011

In this paper, we have proposed a new approach for optical failure analysis which employs a CMOS photon-emitting circuitry, consisting of a flip-flop based on a sense amplifier and a photon-emitting device. This method can be used even with deep-submicron processes where conventional optical failure analyses are difficult to use due to the low sensitivity in the near infrared (NIR) region of the spectrum. The effectiveness of our approach has been proved by the failure analysis of a prototype designed and fabricated in 0.18 ${\mu}m$ CMOS process.

• 한국정보디스플레이학회:학술대회논문집
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• 2007.08a
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• pp.417-420
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• 2007

A 12k-bit SRAM has been developed for line memory of system-on-glass (SoG) with lowtemperature poly-silicon (LTPS) thin film transistor (TFT). For accurate sensing even with the large variation and mismatches in the characteristics of LTPS TFT, mismatch immune sense amplifier is developed. The SRAM shows 30ns read access time with 7V supply voltage while dissipating 4.05mW and 1.75mW for write and read operation, respectively

• 한국정보통신설비학회:학술대회논문집
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• 2005.08a
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• pp.154-158
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• 2005

In this paper, we design optical receiver composed of CDR(clock and data recovery), SA(sense amp), TIA(transimpe dence amplifier), and decision circuit. The optical receiver can be classified to two main block, one is Deserializer composed of CDR and SA, another is PD receiver composed of preamplifier(샴), peak detector, etc. In this paper, we propose CDR using delayed data topology that could improve defects of existing CDR. The optical receiver that is proposed in this paper has the role of translation a 1.25 Gb/s optical signal to $10{\times}125 Mb/s$ array electric signals. This optical receiver is verified by simulator(hspice) using 0.35 um CMOS technology.