• The Transactions of the Korea Information Processing Society
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• v.7 no.10
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• pp.3226-3235
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• 2000

The more complex and larger semiconductor integraed circuits become, the core important delay test becomes which guarantees that semiconductor integrated circuits operate in time. In this paper, we propose a new partial enhanced scan method that can generate test patterns for path delay faults offectively. We implemented a new partial enhanced scan method based on an automatic test pattern generator(ATPG) which uses implication and justification . First. we generate test patterns in the standard scan environment. And if test patterns are not generated regularly in the scan chain, we determine flip-flops which applied enhanced scan flip-flops using the information derived for running an automatic test pattern generator inthe circuti. Determming enhanced scan flip-flops are based on a fault coverage or a hardware overhead. through the expenment for JSCAS 89 benchmark sequential circuits, we compared the fault coverage in the standard scan enviroment and enhance scan environment, partial enhanced scan environment. And we proved the effectiveness of the new partial enhanced scan method by identifying a high fault coverage.

• Transactions of the Society of Information Storage Systems
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• v.7 no.2
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• pp.85-89
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• 2011

In retrieving process in angle multiplexing Holographic Data Storage(HDS), It is important to search the exact recording angles. In this paper, we propose the retrieving angle searching method using pre-scan. Pre-scan method is means that rotating the galvano mirror before the retrieving process. Therefore, retrieving signals are maximized when between the galvano mirror and recoded angle are exactly matched. Through the measured signals, we will find the exact angle and compensate tangential tilt angle. The experimental results shows propose method is enough to apply the HDS.

• Proceedings of the KIEE Conference
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• 1998.11b
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• pp.669-671
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• 1998

Due to the serial nature of scan chains, the use of the boundary scan chain leads the high application costs. And with 3-state net, it is important to avoid enabling the two drivers in a net. In this paper, the new test method for 3-state nets in the multiple boundary scan chains is presented. This method configures the boundary scan cells as multiple scan chains and the test application time can be reduced. Also three efficient algorithms are proposed for testing the interconnects in a board without the collision of the test data in 3-state nets.

• ETRI Journal
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• v.31 no.5
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• pp.607-609
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• 2009

In this letter, an effective scanning method based on a morphological representation of quantized coefficients is proposed for intra coding in H.264. In the proposed scanning method, the scan order for each block is adaptively reconfigured by exploiting a residual correlation beyond the border of the block. An initial scan order for the current block is determined first by using the pattern of nonzero coefficients in the adjacent block. Then, a complete scan order is obtained by performing the dilation operation at each position within the initial scan order. Experimental results show that the proposed method improves the coding efficiency up to 3.7% compared to the conventional zigzag scanning method.

• Journal of Korea Multimedia Society
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• v.18 no.10
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• pp.1157-1163
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• 2015

In this paper, we propose a registration method of 3d facial scan data and CBCT data using voxelization and distance map. First, two data sets are initially aligned by exploiting the voxelization of 3D facial scan data and the information of the center of mass. Second, a skin surface is extracted from 3D CBCT data by segmenting air and skin regions. Third, the positional and rotational differences between two images are accurately aligned by performing the rigid registration for the distance minimization of two skin surfaces. Experimental results showed that proposed registration method correctly aligned 3D facial scan data and CBCT data for ten patients. Our registration method might give useful clinical information for the oral surgery planning and the diagnosis of the treatment effects after an oral surgery.

• Journal of the Korean Society of Radiology
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• v.5 no.4
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• pp.161-169
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• 2011

This research experimented on the change of the multiple colleague scan angle facing one scan object facet to many directions of the form of 3D about the visual angle nervous system forming the cubic distribution with the gradient magnetic field of the mri system and considered the existing basic angle oblique direction test coverage and comparison. MR system can freely select various pulse sequence and image slice. To oblique imaging for optic nerve viewing, we have studied the variation of scan angle between typical oblique scan method (sagittal-coronal plane) and multi directional angles oblique scan method (sagittal-coronal-axial plane) using gradient of MR system. In this study, the subjects of the experiment were normal adults in our country. As a result, we confirmed that multi directional angles oblique scan method can display anatomical information of more wider area than typical oblique scan method. In addition, to clearly display optic nerve, we also confirmed that image slice thickness and pulse sequence have effect on it.

• Journal of Digital Convergence
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• v.11 no.4
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• pp.259-266
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• 2013

Binary connected-components labeling, which is widely used in the field of the pattern recognition, has been researched for a long time as one of the basic image processing techniques. Two-scan algorithm has been mainly used in the researches of the connected-components labeling. Recently, for the first scan in the two-scan algorithm, block-based labeling approaches have been used and reported as the fastest methods. In this paper, a new efficient scan mask for connected-components labeling with a block-based labeling approach is proposed. Labeling with the new pixel-based scan mask is more efficient than any other existing method. The results of the experiments show that the proposed method is faster than the existing fastest method.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2009.06a
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• pp.969-970
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• 2009

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.45 no.10
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• pp.39-44
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• 2008

Scan architecture is very effective design-for-testability technique that is widely used for high testability, however, it requires so much test time due to test vector shifting time. In this paper, an efficient scan test method is presented that is based on the Illinois scan architecture. The proposed method maximizes the common input effect via a scan chain selection scheme. Experimental results show the proposed method requires very short test time and small data volume by increasing the efficiency of common input effect.

• Journal of Electrical Engineering and Technology
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• v.4 no.4
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• pp.559-565
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• 2009

Power dissipation during scan testing is becoming an important concern as design sizes and gate densities increase. The high switching activity of combinational circuits is an unnecessary operation in scan shift mode. In this paper, we present a novel architecture to reduce test power dissipation in combinational logic by blocking signal transitions at the logic inputs during scan shifting. We propose a unique architecture that uses dmuxed scan flip-flop (DSF) and transmission gate as an alternative to muxed scan flip-flop. The proposed method does not have problems with auto test pattern generation (ATPG) techniques such as test application time and computational complexity. Moreover, our elegant method improves performance degradation and large overhead in terms of area with blocking logic techniques. Experimental results on ITC99 benchmarks show that the proposed architecture can achieve an average improvement of 30.31% in switching activity compared to conventional scan methods. Additionally, the results of simulation with DSF indicate that the powerdelay product (PDP) and area overhead are improved by 28.9% and 15.6%, respectively, compared to existing blocking logic method.