The Transactions of the Korea Information Processing Society (한국정보처리학회논문지)

Korea Information Processing Society (한국정보처리학회)
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Partial Enhanced Scan Method for Path Delay Fault Testing

경로 지연 고장 테스팅을 위한 부분 확장 주사방법

  • 김원기 (삼성전기) ;
  • 김명균 (연세대학교 대학원 전기전자공학과) ;
  • 강성호 (연세대학교 전기전자공학과) ;
  • 한건희 (연세대학교 전기전자공학과)
  • Published : 2000.10.01
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Abstract

The more complex and larger semiconductor integraed circuits become, the core important delay test becomes which guarantees that semiconductor integrated circuits operate in time. In this paper, we propose a new partial enhanced scan method that can generate test patterns for path delay faults offectively. We implemented a new partial enhanced scan method based on an automatic test pattern generator(ATPG) which uses implication and justification . First. we generate test patterns in the standard scan environment. And if test patterns are not generated regularly in the scan chain, we determine flip-flops which applied enhanced scan flip-flops using the information derived for running an automatic test pattern generator inthe circuti. Determming enhanced scan flip-flops are based on a fault coverage or a hardware overhead. through the expenment for JSCAS 89 benchmark sequential circuits, we compared the fault coverage in the standard scan enviroment and enhance scan environment, partial enhanced scan environment. And we proved the effectiveness of the new partial enhanced scan method by identifying a high fault coverage.

반도체 집적 회로가 점점 복잡해지고 고속화되면서 반도체 집적 회로의 동작에 대한 검사 뿐 아니라, 회로가 원하는 시간 내에 동작함을 보장하는 지연 고장 검사의 중요성이 점점 커지고 있다. 본 논문에서는 경로 지연 고장에 대한 효율적인 테스트 입력 생성을 위하여 새로운 부분 확장 주사 방법을 제안한다. 본 논문에서는 유추와 할당을 적용한 테스트 입력 자동 생성기를 기반으로 하여 새로운 부분 주사 방법을 구현하였다. 우선적으로 표준 주사환경에서 테스트 입력을 생성한 후에 테스트 입력이 제대로 생성되지 않은 주사 사슬에 대하여 테스트 입력 생성기를 수행하는 동안의 정보를 이용하여 확장 주사 플립플롭이 적용될 플립플롭을 결정하였다. 확장 주사 플립플롭을 결정하는 기준으로서는 고장 검출율과 하드웨어 오버헤드를 사용하였다. 순차 회로인 ISCAS 89 벤치 마크 회로를 이용하여 실험을 수행하였으며, 실험을 통하여 표준 주사와 확장 주사 환경, 부분 확장 주사 환경에서 고장 검출율을 비교, 확인하였다. 그리고 새로운 알고리즘이 적용된 부분 확장 주사 방법에서 높은 고장 검출율을 확인함으로써 효율성을 입증하였다.

Keywords

References

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