• Title/Summary/Keyword: SE Measurement

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Properties of photoluminescience for ZnSe/GaAs epilayer grown by hot wall epitaxy

  • Hong, Kwangjoon;Baek, Seungnam
    • Journal of the Korean Crystal Growth and Crystal Technology
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    • v.13 no.3
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    • pp.105-110
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    • 2003
  • The ZnSe epilayers were grown on the GaAs substrate by hot wall epitaxy. After the ZnSe epilayers treated in the vacuum-, Zn-, and Se-atmosphere, respectively, the defects of the epilayer were investigated by means of the low-temperature photoluminescence measurement. The dominant peaks at 2.7988 eV and 2.7937 eV obtained from the PL spectrum of the as-grown ZnSe epilayer were found to be consistent with the upper and the lower polariton peak of the exciton, $I_{2}$ ($D^{\circ}$, X), bounded to the neutral donor associated with the Se-vacancy. This donor-impurity binding energy was calculated to be 25.3 meV, The exciton peak, $I_{1}^{d}$ at 2.7812 eV was confirmed to be bound to the neutral acceptor corresponded with the Zn-vacancy. The $I_{1}^{d}$ peak was dominantly observed in the ZnSe/GaAs : Se epilayer treated in the Se-atmosphere. This Se-atmosphere treatment may convert the ZnSe/GaAs : Se epilayer into the p-type. The SA peak was found to be related to a complex donor like a $(V_{se}-V_{zn})-V_{zn}$.

A Study point defect for thermal annealed ZnSe/GaAs epilayer

  • Hong, Kwang-Joon;Lee, Sang-Youl
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2003.11a
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    • pp.120-123
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    • 2003
  • The ZnSe epilayers were grown on the GaAs substrate by hot wall epitaxy. After the ZnSe epilayers treated in the vacuum-, Zn-, and Se-atmosphere, respectively, the defects of the epilayer were investigated by means of the low-temperature photoluminescence measurement. The dominant peaks at 2.7988 eV and 2.7937 eV obtained from the PL spectrum of the as-grown ZnSe epilayer were found to be consistent with the upper and the lower polariton peak of the exciton, $I_2$ ($D^{\circ}$, X), bounded to the neutral donor associated with the Se-vacancy. This donor-impurity binding energy was calculated to be 25.3 meV. The exciton peak, $I_1^d$, at 2.7812 eV was confirmed to be bound to the neutral acceptor corresponded with the Zn-vacancy. The $I_1^d$ peak was dominantly observed in the ZnSe/GaAs:Se epilayer treated in the Se-atmosphere. This Se-atmosphere treatment may convert the ZnSe/GaAs:Se epilayer into the p-type. The SA peak was found to be related to a complex donor like a $(V_{Se}-V_{Zn})-V_{Zn}$.

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A Substation-Oriented Approach to Optimal Phasor Measurement Units Placement

  • Bao, Wei;Guo, Rui-Peng;Han, Zhen-Xiang;Chen, Li-Yue;Lu, Min
    • Journal of Electrical Engineering and Technology
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    • v.10 no.1
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    • pp.18-29
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    • 2015
  • State Estimation (SE) is the basis of a variety of advanced applications used in most modern power systems. An SE problem formed with enough phasor measurement units (PMUs) data is simply a linear weighted least squares problem requiring no iterations. Thus, designing a minimum-cost placement of PMUs that guarantees observability of a power system becomes a worthy challenge. This paper proposes an equivalent integer linear programming method for substation-oriented optimal PMU placement (SOOPP). The proposed method uses an exhaustive search to determine a globally optimal solution representing the best PMU placement for that particular power system. To obtain a more comprehensive model, contingencies and the limitation of the number of PMU measurement channels are considered and embodied in the model as changes to the original constraints and as additional constraints. The proposed method is examined for applicability using the IEEE 14-bus, 118-bus and 300-bus test systems. The comparison between SOOPP results and results obtained by other methods reveals the excellence of SOOPP. Furthermore, practical large-scale power systems are also successfully analyzed using SOOPP.

Point-defect study from low-temperature photoluminescence of ZnSe layers through the post-annealing in various ambient

  • Lee, Sang-Youl;Hong, Kwang-Joon;Kim, Hae-Jeong
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2010.06a
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    • pp.378-378
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    • 2010
  • The ZnSe epilayers were grown on the GaAs substrate by hot wall epitaxy. After the ZnSe epilayers treated in the vacuum-, Zn-, and Se-atmosphere, respectively, the defects of the epilayer were investigated by means of the low, temperature photoluminescence measurement. The dominant peaks at 2.7988 eV and 2.7937 eV obtained from the PL spectrum of the as-grown ZnSe epilayer were found to be consistent with the upper and the lower polariton peak of the exciton, $I_2$ ($D^{\circ}$, X), bounded to the neutral donor associated with the Se-vacancy. This donor-impurity binding energy was calculated to be 25.3 meV. The exciton peak, $I_l^d$, at 2.7812 eV was confirmed to be bound to the neutral acceptor corresponded with the Zn-vacancy.

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Carrier Densities of CdSe Thin Films (CdSe 박막반도체의 반송자 밀도)

  • 김기원
    • Journal of the Korean Institute of Telematics and Electronics
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    • v.21 no.5
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    • pp.7-10
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    • 1984
  • Generally, free carrier densities of single crystal semiconductors are indifferent to methods of measurement. Free carrier densities of CdSe thin films, however, were measured invarious values with different methods In this paper, C-V method, Seebeck effect and a.c. Hall effect were used to measure carries densities of CdSe thin films. Carrier densities of CdSe thin films were in the range of 10 - 10 carriers/㎤. And causes of different results were discussed.

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The Parameters Extraction in Poly TFT Using Optimization Technique (최적화 기법에 의한 다결정 TFT(Thin Film Transistor)의 매개 변수 추출)

  • 김홍배;손상희;박용헌
    • The Transactions of the Korean Institute of Electrical Engineers
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    • v.40 no.6
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    • pp.582-589
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    • 1991
  • We used Cd Se as the semiconductor to analyze the Poly-TFT. Cd Se TFT is fabricated by the vacuum evaporation method and the characteristics curves of the current-voltage are obtained using the results of measurement of Cd Se TFT devices. Employing least square method and Rosenbrock algorithm, we can extract the device parameters(grain boundary mobility, trap density). The current-voltage relations calculated by extracted parameters are in good agreement with experimental results.

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Synthesis and Optically Characterization of CdSe Nanocrystal (CdSe 나노입자의 합성과 광학 특징)

  • Kim, Chanyoung;Kim, Sunghyun;Jung, Daehyuk
    • Journal of Integrative Natural Science
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    • v.1 no.3
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    • pp.250-253
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    • 2008
  • New issues arise as to surface characterization, quantification and interface formation. Surface and interface control of CdSe nanocrystal systems, one of the most studied and useful nanostructures. Semiconductor quantum dots (QDs) have been the subject of much interest for both fundamental reseach and technical applications in recent years, due mainly to their strong size dependent properties and excellent chemical processibility. In this dissertation, the synthesis of CdSe quantum dots were synthesized by pyrolysis of high-temperature organometallic reagents. In order to modify the size and quality of quantum dots, we controlled the growth temperature and the relative amount of precursors to be injected into the coordinating solvent. Moreover, an effective surface passivation of monodisperse nanocrystals was achieved by overcoating them with a higher-band-gap material. Synthesized CdSe quantum dots were studied to evaluate the optical, electronic and structural properties using UV-absorption, and photoluminescence measurement.

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Hall-effect Properties of Single Crystal Semiconductor p-GaSe Dopes with $Er^{3+}$ (Erbium 도핑된 p-GaSe 단결성의 홀 효과 특성)

  • 이우선;김남오;손경춘
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.13 no.1
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    • pp.1-5
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    • 2000
  • Optical and electrical properties of GaSe:Er\ulcorner single crystals grown by the Bridgenman technique have been investigated by using optical absorption and h\Hall-effect measurement system. The Hall coefficients were mea-sured by using a high impedance electrometer in the temperature range from 360K to 150K. The temperature dependence of hole concentration show the characteristic of a partially compensated p-type semiconductor. Carrier density(N\ulcorner) of GaSe doped with Erbium was measured about 3.25$\times$10\ulcorner [cm\ulcorner] at temperature 300K, which was higher than undoped specimen. Photon energy gap (E\ulcorner) of GaSe:Er\ulcorner specimen was measured about 1.79eV.

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