• Journal of the Korea Institute of Military Science and Technology
• /
• v.21 no.5
• /
• pp.684-696
• /
• 2018

The mission in missile systems can be conducted with multiple phases according to the characteristics of the systems and the targets. The safeguarded multi-phase mission includes a safeguarded phase before launch for considering the safety of operators in unexpected squib activation. However, the safeguard function should be disabled after launch to complete the mission. Therefore, the squib system needs to be selectively activated according to the phases. This paper presents a selective squib activation and check circuit design for safeguarded multi-phase missions in missile systems. The presented circuit design was implemented with various electronic components including a field-programmable gate array(FPGA). Its functions and performance were validated by both many ground tests and several flight tests.

• Proceedings of the Korean Institute of Intelligent Systems Conference
• /
• 2003.09a
• /
• pp.58-61
• /
• 2003

This paper proposes e-Learning environments far digital circuit experiment. The e-Learning environments are implemented as a WBT system that includes the circuits monitoring system and the students management system. In the WBT client-server system, the instructor represents the server and students represent clients. The client computers are equipped with a digital circuit training board and connected to the server on the World Wide Web. The training board consists of a Programmable Logic Device (PLD) and measuring instruments. The instructor can reconfigure the PLD with various circuit designs from the server so that students can investigate signals from the training board. The instructor can monitor the progress of the students using Joint Test Action Grouo(JTAG) technology. We implement the WBT system and a courseware fo digital circuits and evaluation the environments.

• Journal of the Korea Computer Industry Society
• /
• v.7 no.3
• /
• pp.205-215
• /
• 2006

In this paper, a method how to make Programmable Logic Array (PLA) design and inspection of circuit relative to recent 64bit microprocessor simple and easy was discussed. A design method using Random Access Memory (RAM), Read Only Memory (ROM) and PLA has been settled down in Very Large Scale Integrated Circuit (VLSI) and logical design, modifying circuit and inspection are easy in PLA so it holds fairly good advantages in the aspect of performance and cost. It is expected PLA will also occupy an important position as a basic factor in designing VLSI in the future.

• The Journal of Korean Institute of Communications and Information Sciences
• /
• v.28 no.11A
• /
• pp.936-944
• /
• 2003

In this paper, we propose an AND/XOR-based technology mapping method for field programmable gate arrays (FPGAs). Due to the fixed size of the programmable blocks in an FPGA, decomposing a circuit into sub-circuits with appropriate number of inputs can achieve excellent implementation efficiency. Specifically, the proposed technology mapping method is based on Davio expansion theorem to decompose a given Boolean circuit. The AND/XOR nature of the proposed method allows it to operate on XOR intensive circuits, such as error detecting/correcting, data encryption/decryption, and arithmetic circuits, efficiently. We conduct experiments using MCNC benchmark circuits. When using the proposed approach, the number of CLBs (configurable logic blocks) is reduced by 67.6% (compared to speed-optimized results) and 57.7% (compared to area-optimized results), total equivalent gate counts are reduced by 65.5 %, maximum combinational path delay is reduced by 56.7 %, and maximum net delay is reduced by 80.5 % compared to conventional methods.

• Journal of the Institute of Electronics Engineers of Korea SD
• /
• v.40 no.6
• /
• pp.408-420
• /
• 2003

This paper describes a Delay Locked Loop (DLL) circuit having two advancements : 1) a dual loop operation for a wide lock-range and 2) programmable replica delays using antifuse circuitry and internal voltage generator for a post-package skew calibration. The dual loop operation uses information from the initial time-difference between reference clock and internal clock to select one of the differential internal loops. This increases the lock-range of the DLL to the lower frequency. In addition, incorporation with the programmable replica delay using antifuse circuitry and internal voltage generator allows for the elimination of skews between external clock and internal clock that occur from on and off-chip variations after the package process. The proposed DLL, fabricated on 0.16m process, operates over the wide range of 42MHz - 400MHz with 2.3v power supply. The measured results show 43psec peak-to-peak jitter and 4.71psec ms jitter consuming 52㎽ at 400MHz.

• Journal of Advanced Navigation Technology
• /
• v.24 no.4
• /
• pp.314-321
• /
• 2020

Logic automated stimulus and response (LASAR) software is an automatic test program development tool for logic function test and fault detection of avionics components digital circuit cards. LASAR software needs to the information for the logic circuit function and input and output of the device. If there is no component information, normal component modeling is impossible. In this paper, component modeling is carried out through reverse design of programmable logic device (PLD) device without element information. The developed LASAR program identified failure detection rates through fault simulation results and single-seated fault insertion methods. Fault detection rates have risen by 3% to 91% for existing limited modeling and 94% for modeling through the reverse design. Also, the 22 case of stuck fault with the I/O pin of EP310 PLD were detected 100% to confirm the good performance.

• Journal of the Institute of Electronics Engineers of Korea SD
• /
• v.48 no.1
• /
• pp.56-61
• /
• 2011

This paper describes design of a programmable frequency synthesizer for RF PLL with $0.18{\mu}m$ silicon CMOS technology being used as an application of the UWB system like MBOA. To get good performance of speed and noise super dynamic circuits was used, and to get programmable division ratio switching circuits was used. Especially to solve narrow bandwidth problem of the dynamic circuits load resistance value of unit divider block was varied. Simulation results of the designed circuit shows very fast and wide operation characteristics as 1~14GHz frequency range.

• JSTS:Journal of Semiconductor Technology and Science
• /
• v.13 no.4
• /
• pp.318-330
• /
• 2013

This paper presents a high-linearity low-noise small-size programmable gain amplifier (PGA) based on a new low-noise low-distortion differential amplifier and a proposed reconfiguration technique. The proposed differential amplifier combines an inverter-based differential pair with an adaptive biasing circuit to reduce noise and distortion. The reconfiguration technique saves the chip size by half by utilizing the same differential pair for the input transconductance and load-stage, interchangeably. Fabricated in $0.18-{\mu}m$ CMOS, the proposed PGA shows a dB-linear control range of 21dB in 16 steps from -11 dB to 10 dB with a gain error of less than ${\pm}0.33$ dB, an IIP3 of 7.4~14.5 dBm, a P1dB of -7~1.2 dBm, a noise figure of 13dB, and a 3-dB bandwidth of 270MHz at the maximum gain, respectively. The PGA occupies a chip area of $0.04mm^2$ and consumes only 1.3 mA from the 1.8 V supply.

• Journal of KIISE:Computer Systems and Theory
• /
• v.35 no.6
• /
• pp.284-292
• /
• 2008

The density of Memory has been increased by great challenge for memory technology; therefore, elements of memory become more smaller than before and the sensitivity to faults increases. As a result of these changes, memory testing becomes more complex. In addition, as the number of storage elements per chip increases, the test cost becomes more remarkable as the cost per transistor drops. Recent development in system-on-chip(SoC) technology makes it possible to incorporate large embedded memories into a chip. However, it also complicates the test process, since usually the embedded memories cannot be controlled from the external environment. We present a ARM processor-programmable built-in self-test(BIST) scheme suitable for embedded memory testing in the SoC environment. The proposed BIST circuit can be programmed vis an on-chip microprocessor.

• Nuclear Engineering and Technology
• /
• v.48 no.4
• /
• pp.1047-1057
• /
• 2016

Design engineering process for field programmable gate array (FPGA)-based reactor trip functions are developed in this work. The process discussed in this work is based on the systems engineering approach. The overall design process is effectively implemented by combining with design and implementation processes. It transforms its overall development process from traditional V-model to Y-model. This approach gives the benefit of concurrent engineering of design work with software implementation. As a result, it reduces development time and effort. The design engineering process consisted of five activities, which are performed and discussed: needs/systems analysis; requirement analysis; functional analysis; design synthesis; and design verification and validation. Those activities are used to develop FPGA-based reactor bistable trip functions that trigger reactor trip when the process input value exceeds the setpoint. To implement design synthesis effectively, a model-based design technique is implied. The finite-state machine with data path structural modeling technique together with very high speed integrated circuit hardware description language and the Aldec Active-HDL tool are used to design, model, and verify the reactor bistable trip functions for nuclear power plants.