• Journal of the Korean Operations Research and Management Science Society
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• v.25 no.2
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• pp.23-31
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• 2000

Many studies in marketing and economics have attempted to model price and sales path under the dynamic diffusion process. Most of these models have been based on a fixed product lifetime. The current business climate requiring intensive development of new products however affects the diffusion of new products and their lifetime. Many products have not enjoyed the expected life cycle at the launching stage due to intense technical development competitive reactions, and financial problems. Most diffusion models however have not taken account of the lifetime uncertainty of new product. If the products do not last over the planning horizon set by those models. the optimal price derived from them could be futile. Therefore we had better take such lifetime uncertainty into consideration when developing diffusion models, In this paper we study the impact of uncertain product lifetime on its optimal pricing path in non-competitive market. We develop an optimal pricing model under uncertain product lifetimes and conduct a simulation study to investigate their effects on the optimal pricing and corresponding sales paths. The simulation study provides some interesting findings on optimal pricing policy under uncertain product lifetime. This study could be a stepping stone for the further extended study of optimal pricing strategy with uncertain product lifetime.

• The Journal of Fisheries Business Administration
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• v.25 no.2
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• pp.103-114
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• 1994

We consider the continous, deterministic, infinite horiton, perishable item inventory, within the setting of a retail sector, in which the price for an item is dependent on the lifetime of inventory. Replenishment cost is kept constant but the carrying cost per units is allowed to vary according to product lifetime. Tro possibilities of variation are considered : (1) Product lifetime is longer than cycletime and (2) Product lifetime is shorter than cycletime. We find the optimal policies and decision rules for perishable product.

• Asian Journal of Innovation and Policy
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• v.1 no.2
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• pp.200-218
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• 2012

Estimating the economic life of a technology is the first important prerequisite step in the feasibility analysis of technology-based business. Many empirical studies have concentrated on patents data to estimate the time period for a technology. However, it is recommended to estimate it along with qualitative considerations of future technological and market conditions. In this regard, little is known about how approaches are applied. This paper aims to establish a structural framework of estimating the lifetime of a technology by integrating the outputs of an analysis of the determinants in each transition of a product life cycle. We describe an illustrative case about a light emitting diode (LED) backlight unit (BLU) technology for the liquid crystal display (LCD) TV. The framework allows valuators and experts to estimate a technology lifetime by using multidimensional factors.

• 한국정보디스플레이학회:학술대회논문집
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• 2004.08a
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• pp.272-276
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• 2004

Great strides in organic light emitting device (OLED) technology have resulted in a number of commercial products. To continue this growth into large area displays, for example televisions, an understanding of the mechanisms that drive the OLED device efficiency and lifetime performance is critical. In this work, we consider maximizing the efficiency lifetime product based on phosphorescent OLED ($PHOLED^{TM}$) technology. We report green PHOLEDs with luminous efficiency of 82 cd/A, 5.7 V and 10,000 hours lifetime at 1,000 cd/$m^2$,red PHOLEDs with CIE of (0.67,0.33), 11 cd/A and 35,000 hours lifetime at 500 cd/$m^2$ and recent progress in blue demonstrating efficiencies of 18 cd/A at 200 cd/$m^2$.

• Journal of Korean Institute of Industrial Engineers
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• v.25 no.2
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• pp.204-216
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• 1999

Failure physics and statistical lifetime analysis constitute the two extreme ends of the reliability engineering spectrum, and studies that relate failure mechanisms to failure distributions have been near non-existent. This paper is an attempt to stimulate interest to fill the gap between the two extremes and proposes an approach of combining them through i) developing a failure mechanism model, ii) generating failure times by Monte Carlo simulation with the model, iii) deriving the failure time distribution and evaluating the product reliability, and iv) improving the product reliability by the sensitivity analysis. An application of the proposed approach to the BGA(Ball Grid Array) surface mount package is also provided.

• Nuclear Engineering and Technology
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• v.51 no.3
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• pp.731-737
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• 2019

In this study, a new measurement method based on voltage transients in CdZnTe detectors response to low energy photon irradiations is applied to measure the electron mobility (${\mu}_e$) and electron mobility-lifetime product $({\mu}{\tau})_e$ in a CdZnTe detector. In the proposed method, the pulse rise times are derived from low energy photon response to 59.5 keV($^{241}Am$), 88 keV($^{109}Cd$) and 122 keV($^{57}Co$) ${\gamma}-rays$ for the irradiation of the cathode surface at each detector for different bias voltages. The electron $({\mu}{\tau})_e$ product was then determined by measuring the variation in the photopeak amplitude as a function of bias voltage at a given photon energy using a pulse-height analyzer. The $({\mu}{\tau})_e$ values were found to be $(9.6{\pm}1.4){\times}10^{-3}cm^2V^{-1}$ for $1000mm^3$, $(8.4{\pm}1.6){\times}10^{-3}cm^2V^{-1}$ for $1687.5mm^3$ and $(7.6{\pm}1.1){\times}10^{-3}cm^2V^{-1}$ for $2250mm^3$ CdZnTe detectors. Those results were then compared with the literature $({\mu}{\tau})_e$ values for CdZnTe detectors. The present results indicate that, the electron mobility ${\mu}_e$ and electron $({\mu}{\tau})_e$ values in CdZnTe detectors can be measured easily by applying voltage transients response to low energy photons, utilizing a fast signal acquisition and data reduction and evaluation.

• Nuclear Engineering and Technology
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• v.55 no.3
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• pp.919-926
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• 2023

To analyze the cause of the destruction of thin, carbon-backed lithium fluoride targets during a measurement of the fusion of ⁷Li and ¹⁷O, we estimate theoretically the lifetimes of carbon and LiF films due to sputtering, thermal evaporation, and lattice damage and compare them with the lifetime observed in the experiment. Sputtering yields and thermal evaporation rates in carbon and LiF films are too low to play significant roles in the destruction of the targets. We estimate the lifetime of the target due to lattice damage of the carbon backing and the LiF film using a previously reported model. In the experiment, elastically scattered target and beam ions were detected by surface silicon barrier (SSB) detectors so that the product of the beam flux and the target density could be monitored during the experiment. The areas of the targets exposed to different beam intensities and fluences were degraded and then perforated, forming holes with a diameter around the beam spot size. Overall, the target thickness tends to decrease linearly as a function of the beam fluence. However, the thickness also exhibits an increasing interval after SSB counts per beam ion decreases linearly, extending the target lifetime. The lifetime of thin LiF film as determined by lattice damage is calculated for the first time using a lattice damage model, and the calculated lifetime agrees well with the observed target lifetime during the experiment. In experiments using a thin LiF target to induce nuclear reactions, this study suggests methods to predict the lifetime of the LiF film and arrange the experimental plan for maximum efficiency.

• Journal of Applied Reliability
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• v.12 no.1
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• pp.47-56
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• 2012

Reliability demonstration tests with zero-failure acceptance criterion are most commonly used in the field of reliability application since they require fewer test samples and less test time compared to other test methods that guarantee the same reliability with a given confidence level. For products with lognormal lifetime distribution, an economic zero-failure test plan is developed that minimizes the total cost related to perform a life test to guarantee a specified reliability of a product with a given confidence level. A numerical example is provided to illustrate the use of the proposed test plan.

• Journal of the Korean Data and Information Science Society
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• v.14 no.4
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• pp.1091-1102
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• 2003

The Weibull variate is commonly used as a lifetime distribution in reliability applications. Estimation of parameters is revisited in the two-parameter Weibull distribution. The method of product spacings, the method of quantile estimates and the method of least squares are applied to this distribution. A comparative study between a simple minded estimate, the maximum likelihood estimate, the product spacings estimate, the quantile estimate, the least squares estimate, and the adjusted least squares estimate is presented.

• Proceedings of the Korean Operations and Management Science Society Conference
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• 1999.04a
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• pp.302-302
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• 1999